Object inspection and/or modification system and method

ABSTRACT

A SPM (scanning probe microscopy) inspection and/or modification system which uses SPM technology and techniques in new and novel ways to inspect and/or modify an object. The system includes various types of microstructured SPM (scanning probe microscopy) probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.

This application is a National Phase filing of PCT Patent ApplicationPCT/US98/01528, filed Jan. 21, 1998.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/906,602, filed Dec. 10, 1996, which is afile wrapper continuation of U.S. patent application Ser. No.08/281,883, filed Jul. 28, 1994, now abandoned.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/885,014, filed Jul. 1, 1997, now U.S.Pat. No. 6,144,028, issued Nov. 7, 2000, which is a continuation of U.S.patent application Ser. No. 08/412,380, filed Mar. 29, 1995, nowabandoned, which is a continuation-in-part of U.S. patent applicationSer. No. 08/281,883, filed Apr. 28, 1994, now abandoned.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/776,361, filed May 16, 1997, which is aNational Phase filing of PCT Application No. PCT/US95/09553, filed Jul.28, 1995, which is a continuation-in-part of U.S. patent applicationSer. No. 08/281,883 and U.S. patent application Ser. No. 08/412,380 eachnow abandoned.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/506,516, filed Jul. 24, 1995, now U.S.Pat. No. 5,751,683, issued May 12, 1998, which is a continuation-in-partof U.S. patent application Ser. No. 08/281,883 now abandoned.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/613,982, filed Mar. 4, 1996, now U.S.Pat. No. 5,756,997, issued May 26, 1998, which is a continuation in partof U.S. patent application Ser. No. 08/281,883 now abandoned.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of PCTApplication No. PCT/US96/12255, filed Jul. 24, 1996, which is acontinuation-in-part of U.S. patent application Ser. No. 08/506,516 nowU.S. Pat. No. 5,751,683.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/786,623, filed Jan. 21, 1997, nowabandoned.

PCT Patent Application PCT/US98/01528 is a continuation-in-part of U.S.patent application Ser. No. 08/827,953, filed Apr. 6, 1997, nowabandoned.

FIELD OF THE INVENTION

The present invention relates generally to systems and methods formodifying and/or inspecting an object. In particular, it pertains to asystem and method for using nanostructured and nanopositioned probes toremove material from or add material to an object, chemically change thematerial of an object, and/or analyze the material of an object.

BACKGROUND OF THE INVENTION

Common microfabrication techniques such as e-beam, laser beam, andstandard photolithography are used to directly make or modifysemiconductor wafers or fabrication masks. However, these techniquessuffer from limitations in the size and energy which may to be used tocreate, modify, and inspect structures on the wafers or masks.Specifically, it is desirable that techniques be available to create,modify, and inspect structures in the range of a single molecule(approximately 1 Angstrom or less). However, the current techniques areunable to create, modify, and inspect structures at and below 100nanometers.

For example, in conventional semiconductor fabrication mask repairsystems, a finely focused laser beam is used to remove or chemicallyactivate for removal material deposited in a pattern on a maskSimilarly, the laser beam is used to deposit material on the mask bylocally heating sites on the mask while the mask is in a gaseousenvironment. However, these techniques can only be used to createdesired changes of no smaller then 500 nanometers. Moreover, thesesemiconductor fabrication mask repair systems cannot insure that thechanges made to a modified mask will produce the desired pattern on atarget wafer.

SUMMARY OF THE INVENTION

In summary the present invention is a SPM (scanning probe microscopy)inspection and/or modification system which uses SPM technology andtechniques in new and novel ways to inspect and/or modify an object. Thesystem includes various types of microstructured SPM (scanning probemicroscopy) probes for inspection and/or modification of the object.

The components of the SPM system also include microstructuredcalibration structures. A probe may be defective because of wear orbecause of fabrication errors. Various types of reference measurementsof the calibration structure are made with the probe or vice versa tocalibrate it.

In addition, the components of the SPM system may include one or moretip machining structures. At these structures, material of the tips ofthe SPM probes may be machined by abrasively lapping and chemicallylapping the material of the tips. This is done by rubbing the materialof the tips against the tip machining structures.

The SPM probes include probes with which the object may be inspected ina number of ways using SPM technology and techniques. This inspection isperformed with various components of the SPM system for making SPMmeasurements with the probes. All of the SPM measurements are processedand inspection data (or results) for the object is generated. Thisinspection data may include an image and/or analysis of the object. Theanalysis may be of the electrical, optical, chemical, (includingcatalytic), and/or biological (including morphological) properties,operation, and/or characteristics of the object.

The SPM probes also include probes with which the object may be modifiedin a number of ways using SPM technology and techniques. Some of theseprobes may also be used to inspect the object, as just discussed. A usermay request that a modification be made to the object based on theinspection data just described or on inspection data generated by someof the other components of the system without using any probes.

The generated inspection data is then compared with target data (orparameters). This target data may include a target image and/or analysisof the object which is/are compared with the generated image and/oranalysis. If they do not match within a predefined tolerance level, thenmodification data is generated that identifies the types ofmodifications that need to be made to the object to fall within thetolerance level. These modifications may be simply to remove particlecontaminants on the object or more importantly to structurally and/orchemically modify the material of the object by removing, deforming,and/or chemically changing a portion of it or adding other material toit. Then, one or more of the modification probes are used to make thesedesired modifications.

The process just described can be iteratively repeated until thegenerated inspection data converges to the target data so as to bewithin the predefined tolerance level. This process is particularlyuseful in fabrication and/or repair of semiconductor wafers andfabrication masks, lithographic structures, and thin film magneticread/write heads.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 shows an SPM inspection and/or modification system for inspectingand/or modifying an object.

FIGS. 2 to 4 show different views of a first SPM probe of the SPM systemof FIG. 1.

FIGS. 5 to 8 show different views of a scanning head of the SPM systemof FIG. 1.

FIGS. 9, 10, and 87 show different views of a calibration structure ofthe SPM system of FIG. 1.

FIGS. 11 and 52 show different views of another calibration structure ofthe SPM system of FIG. 1.

FIGS. 12 to 15 show different views of a nanostructured force balance ofthe SPM system of FIG. 1.

FIGS. 16 and 17 show curves for a differential pressure chamber formedwith the SPM system of FIG. 1 in the gap between the first SPM probe andthe object.

FIGS. 18 and 19 show different embodiments for the gap sensors of thefirst SPM probe to sense the width of the gap in which the differentialpressure chamber is formed.

FIGS. 20 to 23 show different views and embodiments of a second SPMprobe of the SPM system of FIG. 1.

FIGS. 24 and 25 show different views of a third SPM probe of the SPMsystem of FIG. 1.

FIG. 26 shows a fourth SPM probe of the SPM system of FIG. 1.

FIGS. 27 to 35, 82, 83, and 86 show different views of a fifth SPM probeof the SPM system of FIG. 1.

FIGS. 36 and 37 show different views of a sixth SPM probe of the SPMsystem of FIG. 1.

FIGS. 38 and 39 show different views of a seventh SPM probe of the SPMsystem of FIG. 1.

FIGS. 40 to 43 show different views and embodiments of an eight SPMprobe of the SPM system of FIG. 1.

FIGS. 44 to 46 show different views of a ninth SPM probe of the SPMsystem of FIG. 1.

FIGS. 47 and 48 show different embodiments of a tenth SPM probe of theSPM system of FIG. 1.

FIGS. 49 to 51 show different views of an eleventh SPM probe of the SPMsystem of FIG. 1.

FIGS. 53 to 55 show different views of a twelfth SPM probe of the SPMsystem of FIG. 1.

FIGS. 56 and 57 show different views of an aperture plate of the SPMsystem of FIG. 1.

FIGS. 58 to 60 show different views of a fourteenth or fifteenth SPMprobe of the SPM system of FIG. 1.

FIGS. 61 to 63 show different views and embodiments of a sixteenth SPMprobe of the SPM system of FIG. 1.

FIGS. 64 to 67 show different views and embodiments of a seventeenth SPMprobe of the SPM system of FIG. 1.

FIGS. 68 to 70 show different views of an eighteenth SPM probe of theSPM system of FIG. 1.

FIGS. 71 to 73 show different views of another embodiment of the SPMsystem of FIG. 1.

FIG. 74 shows a controller of the SPM system of FIG. 1.

FIGS. 75 to 77 show different views of overlaid surfaces generated by anoverlay image generator of the controller of FIG. 74.

FIG. 78 shows a modulated surface image generated by a modulated imagegenerator of the controller of FIG. 74.

FIGS. 79 to 81 show different composite images of measuring toolsembedded in objects generated by the composite image generator of thecontroller of FIG. 74.

FIGS. 84 and 85 show different views of a tip machining structure of theSPM system of FIG. 1.

DETAILED DESCRIPTION OF THE INVENTION

Referring to FIG. 1, there is shown an exemplary embodiment of an SPM(scanning probe microscopy) object inspection and/or modificationinspection system 100 which uses SPM technology and techniques in newand novel ways to inspect and/or modify an object 102. For example, aswill be discussed throughout this document, the system can be used toperform tests, fabrication (i.e., manufacturing) steps, and/or repairson semiconductor wafers and fabrication masks, lithographic structures(i.e., masters), and thin film magnetic read/write heads. Additionally,as will also be discussed throughout this document, the SPM system canalso be used to analyze and/or alter biological or chemical samples.

The components of the SPM system 100 include a positioning system 103that comprises a rough positioning apparatus 104, fine positioningapparatuses 106, a support table 108, and scanning head supportstructures 110. The rough positioning apparatus comprises a rough 3-D(i.e., three dimensions) translator, such as a mechanical ball screwmechanism. The rough positioning apparatus is fixed to the supporttable. Each fine positioning apparatus comprises a fine 3-D translator,such as a piezoelectric translator with or without linear positionfeedback. Each fine positioning apparatus is fixed to a correspondingscanning head support structure. Each scanning support structure isfixed to the support table.

The components of the SPM system 100 also include one or more scanningheads 120. Each scanning head is fixed to a corresponding finepositioning apparatus 106 and is roughly and finely positioned in 3-D(i.e., X, Y, and Z dimensions) with the rough positioning apparatus 104and the corresponding fine positioning apparatus. This positioning maybe done in order to load and unload various types of microstructured SPM(scanning probe microscopy) probes 122 of the SPM system to and from thescanning heads and position the loaded probes for calibration andinspection and/or modification of the object. This positioning is donewith respect to the object 102, calibration structures 128, probesuppliers 124 and 125, a probe disposal 126, a probe storage site 127,and other components 123 of the SPM system.

The components of the SPM system 100 also include a programmedcontroller 114 that includes a user interface 116. It also includes anobject loader 115 that comprises a load arm 117, a positioning system118 connected to the load arm, and an object storage unit 119. When itis desired to inspect and/or modify the object 102, a user of the systemuses the user interface to request that the controller have the objectloaded by the object loader for inspection and/or modification. Thecontroller controls the object loader's load arm and positioning systemso as to load the object 102 from the object loader's storage unit ontothe object loading site 129. The object loading site is also one of theSPM system's components and is located on the upper surface of the roughpositioning apparatus 104. In loading the object onto the object loadingsite, the object is removed from the storage unit with the load arm. Theload arm is then lowered into the recess of the object loading site sothat the object rests on the object loading site and no longer on theload arm. The load arm is then slid out of the recess. Similarly, whenthe inspection and/or modification of the object is over, the userrequests with the user interface that the controller have the objectunloaded. In response, the controller controls the load arm to unloadthe object from the object loading site and place it back in the storageunit. This is done by sliding the load arm into the recess and raisingit so that the object rests on the load arm and no longer on the objectloading site. The load arm is then used to place the object back in thestorage unit. The object loader may be a conventional semiconductorwafer or fabrication mask loader used in fabrication of wafers or masks.

As alluded to earlier, the components of the SPM system 100 furtherinclude SPM probes 122, vertical and horizontal probe suppliers 124 and125, and a probe storage site 127. The probes can be loaded onto eachscanning head 120 from the vertical and horizontal probe suppliers orfrom the probe storage site 127. The probe storage site and the probesuppliers are located on the rough positioning apparatus 104. Each probesupplier may supply a different type of probe than any other probesupplier and comprises a stacking mechanism for stacking the same typeof probe. This may be a spring, air, gravity, electromechanical, orvacuum driven stacking mechanism.

Moreover, when the user wishes to use a particular SPM probe 122 forinspecting and/or modifying the object 102, the user instructs thecontroller 114 with the user interface 116 to load this probe onto oneof the scanning heads 120. If a probe of this type has already been usedbefore and has been stored at the probe storage site 127, the controllercontrols the positioning system 103 to position the scanning head overthis site and lower it onto the probe. The controller then controls thescanning head so that the probe is loaded onto it. But, if a new probeof this type is required because one has not been used or the previouslyused one has become defective, the controller controls the positioningsystem to position the scanning head over the probe supplier 124 or 125that supplies the desired type of probe and lower it onto the probe thatis currently at the top of the stack of the probe supplier. Thecontroller then causes the probe to be popped off of the stack andloaded onto the scanning head. In addition, in the instances describedlater where active mechanical, electrical, electromagnetic, vacuum,hydraulic, pneumatic, fluids, magnetic, or other mechanisms areintegrated into the probe, provision is made on the probe and in thescanning head for control connections (i.e., electrical, optical,mechanical, vacuum, etc.). As a result, the scanning head may senseoptical, mechanical or electrical variations which tell the controllerwhich type of probe has been loaded. Thus, different types of probes maybe loaded through the same probe supplier. The different types of probesand probe suppliers and the specific ways in which the probes may beloaded onto the scanning heads will be discussed later.

However, when the user wishes to use another one of the SPM probes 122for inspecting and/or modifying the object 102 with the same scanninghead 120, the user instructs the controller 114 with the user interface116 to unload the currently loaded probe. In response, the controllercontrols the positioning system 103 to position the scanning head sothat the probe that is currently loaded is lowered to the probe storagesite 127 on the rough positioning apparatus. Then, the controller causesthe probe to be unloaded from the scanning head onto this site.

In order to calibrate an SPM probe 122 that is loaded onto one of thescanning heads 120 and determine whether it is defective, the componentsof the SPM system 100 include microstructured calibration structures 128located on the rough positioning apparatus 104. A probe may be defectivebecause of wear or because of fabrication errors. For each type ofprobe, the controller 114 stores one or more reference parameters eachassociated with a corresponding calibration structure 128. Thus, thecontroller controls the positioning system 103, the probe, and some ofthe other components 123 of the SPM system 100 so that various types ofreference measurements of the calibration structure 128 are made withthe probe or vice versa. These reference measurements are then comparedwith the reference parameters. If they do not match within a predefinedtolerance level stored by the controller and set by the user with theuser interface 116, then the probe is considered to be defective.Otherwise, the controller uses the reference measurements to calibratethe probe in the ways described later. The specific types ofcalibrations that can be made for the probes are described later.

In addition, the components of the SPM system 100 may include one ormore tip machining structures 121. At these structures, material of thetips of the SPM probes 122 may be machined by abrasively lapped andchemically lapped. This is done by rubbing the material of the tipagainst the tip machining structures.

The components of the SPM system 100 also include a probe disposal 126which is used to dispose of (or discard) SPM probes 122 that aredefective. In the case of a probe that is determined to be defective inthe manner just described, the user can instruct the controller 114 withthe user interface 116 to have the defective probe discarded. Inresponse, the controller controls the positioning system 103 to positionthe scanning head 120 over the probe disposal and lower it to the probedisposal. Then, the controller controls the scanning head to unload thecurrently loaded probe into the probe disposal.

In an alternative embodiment, each scanning head 120 could be fixed to acorresponding rough positioning subsystem 104 and a corresponding finepositioning subsystem 106. The probe suppliers 124 and 125, probedisposal 126, and the calibration structures 128 would then be locatedon the support table 108. In this way, each scanning head could beindependently positioned with respect to the probe suppliers and probedisposal for loading, unloading, and disposal of SPM probes 122 andindependently positioned for positioning a probe with respect to theobject 102 for inspection and/or modification of the object and thereference structures for calibration and examination of the probes.Moreover, in such an embodiment, there would be a corresponding scanninghead, a corresponding rough positioning subsystem, and a correspondingfine positioning subsystem for inspection and for modification.

The SPM probes 122 include probes with which the object 102 may beinspected in a number of ways using SPM technology and techniques. Thisinspection is performed with various components of the SPM systemincluding the controller 114, the user interface 116, the positioningsystem 103, the scanning heads 120, those of the calibration structures128 used to calibrate the probes, and those of the other components 123of the SPM system that are used for making SPM measurements with theprobes. In doing so, the user requests that an inspection be made withthe user interface. When this occurs, one or more of the probes areselectively loaded, calibrated, and unloaded in the manner discussedearlier for making SPM measurements of the object. Moreover, for eachprobe that is used to make certain SPM measurements of the object, thecontroller controls the positioning system, any of the other componentsof the SPM system used to make these SPM measurements, and the loadedprobe so that these SPM measurements are made with the probe. Thecontroller then processes all of the SPM measurements and generatesinspection data (or results) for the object. This inspection data mayinclude an image and/or analysis of the object. The analysis may be ofthe electrical, optical, chemical, (including catalytic), and/orbiological (including morphological) properties, operation, and/orcharacteristics of the object. The various types of probes used toinspect the object and the corresponding kinds of inspections they areused to make will be described in greater detail later.

Although it may be desired to simply inspect the object 102, certaincomponents of the SPM system 100 are used to modify the object based onthe inspection data generated by the inspection subsystem. Thus, the SPMprobes 122 also include probes with which the object 102 may be modifiedin a number of ways using SPM technology and techniques. Some of theseprobes may also be used to inspect the object, as just discussed. Thecomponents of the SPM system used for this purpose include thecontroller 114, the user interface 116, the positioning system 103, thescanning heads 120, those of the calibration structures 128 used tocalibrate the modification probes, and those of the other components 123of the SPM system that are used in making modifications to the objectwith the probes. With the user interface, the user requests that amodification be made to the object based on the inspection data justdescribed or on inspection data generated by some of the othercomponents 123 of the system without using any probes.

The controller 114 can compare the generated inspection data with targetdata (or parameters). This target data may include a target image and/oranalysis of the object which is/are compared with the generated imageand/or analysis. If they do not match within a predefined tolerancelevel stored by the controller and specified by the user with the userinterface 116, the controller generates modification data thatidentifies the types of modifications that need to be made to the objectto fall within the tolerance level. These modifications may be simply toremove particle contaminants on the object or more importantly tostructurally and/or chemically modify the material of the object byremoving, deforming, and/or chemically changing a portion of it oradding other material to it. Then, one or more of the modificationprobes are selectively loaded, calibrated, and unloaded in the mannerdescribed earlier to make these desired modifications. Furthermore, foreach modification probe used to make certain desired modifications tothe object, the controller controls the positioning system, any of theother components of the SPM system used in making these modifications,and, if needed, the modification probe so that these modifications aremade. The various types of SPM probes used to modify the object and thecorresponding kinds of modifications they make will be described ingreater detail later.

The process just described can be iteratively repeated until thegenerated inspection data converges to the target data so as to bewithin the predefined tolerance level. This process is particularlyuseful in fabrication and/or repair of semiconductor wafers andfabrication masks, lithographic structures, and thin film magneticread/write heads.

Repair and/or Fabrication of Masks and/or Wafers

Specifically, the SPM system 100 may be used to perform precisionrepairs of a completed mask or wafer after fabrication. In fact, the SPMsystem may even be used to perform precision repairs and/or fabricationsteps of a partially completed mask or wafer during fabrication. Theserepairs and/or fabrication steps comprise structurally and/or chemicallymodifying material of the mask or wafer by removing, deforming, and/orchemically changing a portion of it or adding other material to it.

For example, the SPM system 100 may be provided with repair and/orfabrication data for a mask or wafer that was previously inspected by aconventional mask or wafer inspection system. The provided repair and/orfabrication data identifies where a repair and/or a fabrication step isto be performed on the mask or wafer. Using one or more of the SPMprobes 122 and/or some of the other components 123 of the SPM system,the controller 114 locates a reference point on the wafer or mask. Then,using the reference point and the provided repair and/or fabricationdata, the controller may cause an inspection of the wafer or mask to bemade where the repair and/or fabrication step is to be performed. Thisis done with one or more of the probes in the manner briefly describedearlier and will described in greater detail later. As a result,inspection data is generated which comprises an image and/or analysis ofthe mask or wafer. By comparing the generated inspection data withtarget data stored by the controller, repair and/or fabrication (i.e.,modification) data is generated by the controller. Then, based on therepair and/or fabrication data, the controller causes the repair and/orfabrication step to be performed on material of the object with one ormore of the probes and under the direction of the user. This is done inthe manner described briefly earlier and will be described in greaterdetail later.

Then, the controller 114 causes another inspection of the mask or waferto be made after the repair and/or fabrication step. This inspection maybe done with or without any of the SPM probes 122 in the mannerdescribed earlier. Furthermore, this may be done in such a way that themask or wafer is inspected so as to simulate or emulate its use in theenvironment in which it is normally used.

For example, in the case of a mask, some of the other components 123 ofthe SPM system and/or one of the SPM probes 122 would cause radiation tobe directed at the mask. Such radiation may comprise electromagneticenergy, such as radio frequency waves, gamma rays, xrays, ultravioletlight, infrared light, visible light, and/or charged particles, such asprotons, electrons, alpha particles, or ions. The resulting radiationthat would be projected by the mask onto a wafer or that would bereflected and/or emitted by the mask would then be detected by some ofthe other components of the SPM system and/or one of the SPM probes.From the detected radiation, the controller generates and displays apatterned image of the detected radiation so as to emulate the way inwhich the mask would expose a wafer to radiation during actualfabrication of the wafer.

Alternatively, one or more of the SPM probes 122 may be used to make SPMmeasurements of the mask which are used by the controller 114 to producea structural image of the mask in response. From this producedstructural image, the controller 114 would simulate the detection ofresulting radiation that would be projected by it or reflected and/oremitted by it in response to radiation directed at it. From thissimulation, a patterned image of the detected radiation is generated.

In either case, the controller 114 compares the generated patternedimage with a recorded target patterned image or criteria to generaterepair and/or fabrication data that identifies any further repair and/orfabrication step to be performed on the mask. The controller 114 thencauses the entire process to be repeated until the generated patternedimage has converged to the target patterned image or criteria within thespecified tolerance level.

Furthermore, in the case of a wafer, one or more of the SPM probes 122may be used to make SPM measurements of the wafer. These SPMmeasurements may be used by the controller 114 to generate an analysisof the properties, operation, and/or characteristics of the wafer and/ora structural image of the wafer. This generated analysis and/or image isthen compared with a target analysis or image to generate repair and/orfabrication data that identifies that identifies any further repairand/or fabrication step to be performed on the wafer. The controller 114then causes the entire process to be repeated until the generatedanalysis and/or image converges to the target analysis or image withinthe specified tolerance level.

Removal of Particle Contaminants from Masks and/or Wafers

In addition to performing repairs and/or fabrication steps on a mask orwafer, the SPM system 100 could also be used to remove a particlecontaminant on a mask or wafer. This would be done in a similar mannerto that just described. Specifically, the SPM system would be providedwith inspection data from a conventional contaminant inspection systemthat indicates where the particle contaminant is located on the mask orwafer. Then, one or more of the SPM probes 122 would be used to removethe particle contaminant without modifying the material of the mask orwafer based on the inspection data. In order to confirm that theparticle contaminant has been removed, one or more of the SPM probescould be used to inspect the mask or wafer to determine whether this isthe case. This may also be done in the manner described earlier byinspecting the mask or wafer so as to simulate or emulate its use in theenvironment in which it is normally used. Thus, this process may berepeated until the particle contaminant is removed.

Lithographic Structure Fabrication and/or Repair

Since the SPM system 100 may be used to perform precision repairs and/orfabrication steps of a partially completed or fully completedsemiconductor fabrication mask, it may be also be used more generallyfor performing a repair or fabrication step on a lithographic structure.Such a lithographic structure may be a semiconductor mask as justdescribed or other lithographic master used to fabricate replicablestructures. Such replicable structures include optical structures(including x-ray and UV phase and diffraction optics), precisionmeasuring scales, micro-machines, biochemical patterns, phosphors,fluorescent structures, biological structures (including DNA, RNA,proteins, catalysts, and enzymes). This process would be performed inthe same manner just described for a semiconductor fabrication mask,except that the inspection or measurement imaging may includenanospectrophotometry, chemical analysis, and x-ray analysis.

Thin Film Read/Write Head Fabrication and/or Repair

The process just described can also be used to perform precision repairsand/or fabrication steps of a thin film magnetic read/write head orother magnetic structure. In particular, gaps (or grooves) in andbetween the write and read poles of the thin film magnetic material canbe precisely created and/or repaired. In addition, such gaps may bemagnetically characterized and then refined to optimize its magneticfield properties using the SPM probes. More generally, a gap (or groove)between magnetic elements of a magnetic microstructure can be createdand/or repaired and characterized using this process. Specifically, amagnetically sensitive SPM probe may be used to map the magnetic fieldof the magnetic microstructure at varying drive energies and then otherSPM probes may be used to modify the gap or apply additional magneticmaterial to obtain the desired field distribution for any given magneticmicrostructure design.

Probe Fabrication and/or Repair

The SPM system 100 may also be used to perform precision repairs and/orfabrication steps when the object 102 itself is an SPM probe, such asone of the SPM probes 122 disclosed herein. Specifically, material couldbe added and/or removed to and from the probe using the SPM probesdisclosed herein in order to create a desired shape or function for theprobe.

Structure of SPM Probe 122-1

Referring now to FIG. 2, there is shown a microstructured SPM (scanningprobe microscopy) probe 122-1 for use in inspecting the object 102 bymaking SPM measurements of the object, such as AFM (atomic forcemicroscopy), STM (scanning tunneling microscopy), and/or radiationmeasurements, such as NSOM (near-field scanning optical microscopy)measurements and/or far-field radiation measurements. This probe mayalso be used to modify the object.

The SPM probe 122-1 has a base 130 and apertures (or openings) 132 thatdefine corresponding inner perimeter surfaces 134 of the base. The probealso has several cantilevers 136 each connected to the base andextending into a corresponding aperture. On each cantilever is acorresponding tip 138. Each cantilever and corresponding tip form acorresponding SPM tool 137 that is used in making the SPM measurementsand is attached to the base, disposed in the corresponding aperture, andframed (or surrounded) by the corresponding inner surface of the base.

As shown in FIG. 3, when not engaged for inspecting the object 102, eachSPM tool 137 of the SPM probe 122-1 is normally kept in thecorresponding aperture 132 between the upper and lower surfaces 140 and142 of the base 130 so that the tool, and in particular the tip 138, isprotected from being damaged during loading onto and unloading from oneof the scanning heads 120. Moreover, referring to FIG. 1, the probe maybe supplied by one of the probe suppliers 124 that has a verticalstacking mechanism and extends vertically up through the roughpositioning subsystem 104. In such a probe supplier, the probe can bevertically stacked on top of other probes of this type without damagingthe tools of the probe.

Referring to FIG. 4, the tip 138 and cantilever 136 of each SPM tool 137of the SPM probe 122-1 have a core material 144 that comprises aconductive or semiconductive material, such as silicon or siliconnitride. Referring back to FIG. 3, the base 130 of the probe and the tipand cantilever of each tool of the probe may be integrally formedtogether from this core material. Alternatively, the base of the probemay be formed on and around each tool. In either case, this is doneusing conventional semiconductor manufacturing techniques.

As alluded to earlier, each SPM tool 137 of the SPM probe 122-1 can beused to make AFM measurements in order to inspect the object 102. Thus,in order to be resistant to frictional wear when being used in thismanner, the tip 138 of each tool may include an obdurate coating 146over the core material 144 at least at the sharp end of the tip, asshown in FIG. 4. This coating may comprise diamond, silicon carbide,carbon nitride, diamond like carbon, or some other obdurate material,and may have a thickness in the range of approximately 1 Angstroms to 10micrometers.

In the case where the obdurate coating 146 comprises diamond likecarbon, a mask may be placed over each tool so that only the tips 138are exposed. Then, carbon is vacuum arc deposited on the core material144 to form the carbon coating. This may be done in the manner describedin Ager, J. W. et al., “Multilayer Hard Carbon Films with Low WearRates”, Surface and Coatings Technology, submitted Mar. 26, 1996,Anders, S. et al., “Properties of Vacuum Arc Deposited Amorphous HardCarbon Films”, Applications of Diamond Films and Related Materials,Third International Conference, 1995, and Pharr, G. M. et al.,“Hardness, Elastic Modules, and Structure of Very Hard Carbon FilmsProduced by Cathodic Arc Deposition with Substrate Pulse Biasing.

But, in the case where the obdurate coating 146 comprises diamond,carbon is deposited on the exposed surface of the core material 144 ofthe tips in the same manner as just described. In this case however, thecarbon forms seed sites for growing diamond crystals. Alternatively,seed sites may be formed by pushing or rubbing each tip on a surfacecontaining fine grain diamond (such as a lap or polycrystalline diamondcoated surface). The probe is then placed in a methane and hydrogen ormethane and argon atmosphere for chemical vapor deposition (CVD) ofdiamond on the exposed surfaces. As a result of the seed sites, apolycrystalline diamond coating is grown on the exposed surfaces withthe diamond crystals being grown normal to the exposed surfaces. The useof a methane and argon atmosphere has several advantages over the use ofa methane and hydrogen atmosphere. Specifically, a methane and argonatmosphere is safer because it is less volatile. And, in a methane andargon atmosphere, the rate of growth and size of the diamond crystals issmaller. This is desirable for fabrication of the tips 138 of themicrostructured SPM probe 122-1.

Moreover, during the deposition process, a bias voltage may be appliedto the core material 144 of the probe 122-1. This voltage should besufficient to create an electrical field at the sharp end of the tips138 pf the probe which is large enough so that the diamond crystalsgrown at the sharp end of the tips are symmetrically aligned but smallenough so that the diamond crystals grown below the sharp end of thetips are not symmetrically aligned. The advantage of this is to obtain aconsistent orientation and tip behavior at the sharp end withoutsacrificing the durability and stability of the obdurate coating 146below the sharp end.

And, when the obdurate coating 146 comprises carbon nitride, the sameseeding processes as was just described for diamond growth may be used.Then, the probe 122-1 is placed in an atmosphere of monatomic nitrogen.The monatomic nitrogen is obtained by passing nitrogen gas through ahollow tungsten heater consisting of a hollow tungsten structure throughwhich an electric current is passed. The tungsten heater is maintainedat a temperature of 2100 to 3000° C. In one embodiment, the tungstenheater also includes a quantity of carbon sufficient to combinechemically to form a carbon nitride layer on the carbon seed sites atthe cool exposed surfaces (800° C.) of the core material 144 of thetips. In another embodiment, the process begins without introducingnitrogen gas. After a few atoms of carbon are deposited, the nitrogengas is introduced into the tungsten electrode and deposition and growthof the polycrystalline carbon nitride coating is initiated.

In addition, the tools 137 of the probe 122-1 can be used to make STMmeasurements in order to inspect the object 102. Thus, so that each tip138 can be used in this manner, the obdurate coating 146 of each tip canbe made to be conductive. This is done by doping the diamond, siliconcarbide, carbon nitride, diamond like carbon, or other material whichcomprises the obdurate coating with a suitable impurity, such as boron.In the case of diamond like carbon, this is not necessary since it isconductive but may be done anyway to improve conductivity.

Formation of conductive diamond, silicon carbide, and carbon nitridecrystals on SPM tips is further described in U.S. patent applicationSer. No. 08/906,602, PCT Application No. PCT/US95/09553, U.S. patentapplication Ser. No. 08/506,516, and PCT Application No. PCT/US96/12255referenced earlier. And, growth of diamond and silicon crystals isfurther described in “Deposition, Characterization, and DeviceDevelopment in Diamond, Silicon Carbide, and Gallium Nitride ThinFilms”, by Robert F. Davis, Journal of Vacuum Science and Technology,volume A 11(4) (July/August 1993), which is hereby incorporated byreference. Furthermore, growth of diamond crystals on field emissivetips is described in E. I. Givargizov et al., “Growth of DiamondParticles on Sharpened Silicon Tips for Field Emission”, Diamond andRelated Materials 5 (1996), pp. 938-942, E. I. Givargizov et al.,“Growth of Diamond Particles on Sharpened Silicon Tips”, MaterialsLetters 18 (1993), pp. 61-63, K. Okano et al., “Mold Growth ofPolycrystalline Pyramidal-Shape Diamond for Field Emitters”, Diamond andRelated Materials 5 (1996), pp. 19-24, which are also herebyincorporated by reference in their entirety.

Furthermore, referring to FIG. 3, the tools 137 of the probe 122-1 canbe used to make radiation measurements in order to inspect the object102. Thus, for each tool of the probe, the probe includes acorresponding lens 147 and lens support 149 that supports the lens. Aswith the tip and cantilever of each tool, the lens and lens support foreach tool may be integrally formed together with the base 130 or thebase may be formed on and around the lens support. This is also doneusing conventional semiconductor manufacturing techniques.

In order to make these radiation measurements, the each tip 138 of theprobe 122-1 has a reflective coating 143 that reflects light so as tocontain within the tip any light that propagates in the tip. Thiscoating may comprise a light reflective material, such as aluminum,tungsten, or gold. It may be formed over the obdurate coating 146 usingconventional techniques and have a thickness in the range ofapproximately 1 Angstrom to 1 micron. A small portion of the reflectivecoating 143 is removed or rubbed off at the sharp end of each tip 138using conventional techniques to at least the point where the reflectivecoating is no longer opaque to light propagating through the tip.Furthermore, the reflective coating is removed or rubbed off only sothat it ends approximately 5 to 10 nm from the point of the sharp end.As a result, an aperture having a diameter in the range of approximately5 to 100 nm is formed at the sharp end. Moreover, in the case where thelight reflective coating 143 is conductive, it can also be used to makethe STM measurements. In this case, the obdurate coating 146 need not bemade conductive.

As an additional note, the formation of the tips 138 and cantilevers 138of the probe 122-1 are similarly described in U.S. Patent ApplicationNo., PCT Application No. PCT/US95/09553, U.S. patent application Ser.No. 08/506,516, and PCT Application No. PCT/US96/12255 referencedearlier.

Referring again to FIG. 2, and as mentioned earlier, the probe 122-1 hasmultiple tools 137 each comprising a cantilever 136 and a tip 138 on thecantilever. Thus, when the tip of one of the probe's tools is determinedto be defective in the manner to be described later, then another one ofthe probe's tools with a tip determined not to be defective can be usedfor inspecting the object 102 without having to load another probe ofthis type.

Probe Loading and Unloading

FIG. 5 shows the way in which the probe 122-1 is loaded onto one of thescanning heads 120. The scanning head includes a housing 154 with aprobe holding plate 156. As shown in FIG. 6, the probe holding plateincludes a seat 158 formed by a recess in the probe holding plate thatis in the shape of the base of the probe and seats (or holds) the probe.And, the other components 123 of the SPM system 100 include a rotary camassembly 160 that is formed in the probe holding plate. Thus, when theprobe is being loaded onto the scanning head in the manner describedearlier, the controller 114 controls the rotary cam assembly so that itsrotary cam rotates and presses against the probe and locks it into placein the seat of the probe holding plate. In this way, the probe is loadedonto the scanning head. Similarly, when the probe is being unloaded fromthe scanning head in the manner described earlier, the controllercontrols the rotary cam assembly so that the rotary cam rotates and nolonger presses against the probe and unlocks it from the seat of theprobe holding plate.

Furthermore, as shown in FIG. 3, the base 130 of the SPM probe 122-1 hasa tapered outer perimeter surface 157 so that the bottom surface 142 hasan area larger than that of the top surface 140. In addition, referringto FIG. 6, the bottom surface has an area larger than that of the recessthat forms the seat 158 in the probe holding plate 156. Thus, as shownin FIG. 5, when the probe is loaded onto one of the scanning heads 120,the base of the probe is wedged into the recess so that the probe isproperly seated in the seat of the scanning head's probe holder 156 withno movement between the probe and the probe holding plate.

Tip Activation and Deactivation

Referring now to FIGS. 5 and 7, fixed to the probe holding plate 156 aretip actuators 174 that are each used to selectively activate anddeactivate a corresponding tip 138 of the SPM probe 122-1 for use ininspecting the object 102. Each tip actuator includes an L-shaped leverarm 170, a pivot 171, an engagement transducer 172, and an adjustmenttransducer 173. The L-shaped lever arm has one end fixed to theengagement and adjustment transducers and a rounded end that extendsinto an aperture 159 in the seat 158 of the probe holding plate 156. Theengagement and adjustment transducers may each comprise a material, suchas a piezoelectric material or a resistive metal (e.g., Nickel Chromiumalloy), which change dimensions when a voltage or current signal isapplied to it. Alternatively, electromagnetic or electrostatictransducers or actuators could be used.

The other components 123 of the SPM system 100 also include a tipactuator control circuit 175. In selectively activating the tip 136 ofone of the SPM tools 137 of the SPM probe 122-1, the controller 114causes the control circuit to control the change in dimension of theengagement transducer 172 of the corresponding tip actuator 174 so thatit pushes up on the end of the lever arm 170 to which it is fixed. Inresponse, the lever arm pivots on the pivot 171 and, as shown in FIG. 8,the rounded end of the lever arm extends down through the aperture 159in the seat 158 of the holding plate 156 and into the correspondingaperture 132 of the probe. In doing so, the rounded end engages andpresses against the corresponding cantilever 136 so as to push down onit. As a result, the cantilever bends so that the tip 138 on thecantilever is moved below the lower surface 142 of the base 130 of theprobe and is activated for operation in inspecting the object 102.Similarly, the tip is selectively deactivated when the controllercontrols the change in dimension of the engagement transducer 172 of thecorresponding tip actuator so that it pulls down on the end of the leverarm to which it is fixed. In response, the lever arm pivots on the pivotand the rounded end of the lever arm extends up so that the cantileverbends up until the tip is located above the lower surface of the base.As a result, and tip is then protected against being damaged.

In alternative embodiment, each tool 137 of the probe 122-1 may includean electrostatic (i.e., capacitive) tip actuator. Such a tip actuatorwould be configured and operate like the electrostatic tip actuators 162of the gap sensors 164 of the probe, as shown in FIG. 18 and describedlater.

Calibration with AFM Measurements

Turning now to FIG. 9, the calibration structures 128 include a firstcalibration structure 128-1 that, referring to FIG. 1, may be located onthe rough positioning subsystem 104. And, it may be used to calibrateand examine an activated tip 138 of the SPM probe 122-1 by calibratingits position and examining its profile (or shape) to determine whetherit is defective. So that this may be done, the calibration structureincludes various reference substructures 180 to 184 on its base 185.These reference substructures have different shapes, sizes,orientations, and positions with respect to a precisely known referencelocation in the SPM system 100.

Turning again to FIG. 1, when the tip 138 of one of the SPM tools 137 ofthe SPM probe 122-1 is to be used to inspect the object 102, the useruses the user interface 116 to instruct the controller 114 to first havethe positioning of the activated tip calibrated and its profileexamined. In response, the controller controls loading of the probe ontothe scanning head 120 and activation of the tip in the manner justdiscussed. Referring back to FIG. 9, the controller then calibratespositioning of the activated tip by controlling the positioning system103 to scan (or position) the activated tip over the referencesubstructures 180 to 184 of the calibration structure 128-1. As this isdone, an AFM measurement of the deflection of the cantilever 136 onwhich the activated tip is located is made at each scan point.

Referring to FIG. 5, in order to make these AFM measurements, the othercomponents 123 of the SPM system 100 may include in each of the scanningheads 120 a cantilever deflection measurement system 200. The cantileverdeflection measurement system has optics that comprise a light source201, lenses 202 and 203, and a photodetector 204. As is well known tothose skilled in the art, the optics 201 to 204 are used as aninterferometer to optically detect and measure the deflection of thecantilever 136. This kind of arrangement may be configured in the mannerdescribed in U.S. patent application Ser. No. 08/613,982 referencedearlier where the light source and photodetector are located externallyfrom the scanning head. Alternatively, the cantilever deflectionmeasurement system may comprise components to electrostatically (i.e.,capacitively) detect and measure the cantilever deflection.

The AFM measurements of the deflection of the cantilever 136 are used bythe controller 114 to calibrate the activated tip 138 of the SPM probe122-1 for precise positioning of the tip with respect to the referencelocation and to examine its profile. This is done by producing an imageof the calibration structure 128-1 from these measurements. Thisproduced image is then compared with a stored reference image of thecalibration structure which was produced similarly using a reference tipthat was precisely scanned (or positioned) over the calibrationstructure with respect to the reference location and has a preciselyknown reference profile. The images are compared to determine thepositional offset between them. Based on the determined positionaloffset, precise positioning of the tip with respect to the referencelocation is then calibrated. Moreover, by comparing the resolution ofthe images, it can be determined if the tip is defective from wear ormalformation. If the tip is defective, then the tip of another tool ofthe probe may be activated, have its position calibrated, and beexamined to determine if it is defective in the manner just described.But, if all of the tips of the tools of the probe are defective, thenthe probe must be discarded and another probe will have to be loadedonto the scanning head 120 from one of the probe suppliers 124.Otherwise, if the activated tip is not defective, it can then be used toinspect the object 102.

Additionally, the position calibration technique just described may beused in combination with any of the other position calibrationsdescribed herein. This would be done to provide a particular optimalreference process in which a more precise position calibration isdetermined or in which the position calibration is derived in a shortertime.

Calibration using Reference SPM Probe 131

Furthermore, as shown in FIG. 10, in order to calibrate and examine theactivated tip 138 of the selected SPM tool 137, the calibrationstructure 128-1 may also include a reference SPM probe 131. Thereference SPM probe comprises a reference cantilever 136 connected toand suspended over the base 185 of the calibration structure and areference tip 138 on the cantilever. The reference tip and cantilevermay be constructed like the activated tip and cantilever of the selectedSPM tool. The other components 123 of the SPM system 100 will theninclude another cantilever deflection measurement system 205 thatcomprises optics used in conjunction with the reference tip andreference cantilever. The optics comprise a light source 206 and aphotodetector 207. Like the optics 201 to 204 in each scanning head 120,these optics are used as an interferometer to optically detect andmeasure the deflection of the reference cantilever 136 of thecalibration structure. In order that the light provided by the lightsource be reflected by the cantilever, the light may be transparent tothe rough positioning apparatus and the base of the reference structurebut not transparent to the cantilever. Alternatively, if the light isalso transparent to the cantilever, the optics would include areflective material on the cantilever that reflects the light. And, inan alternative embodiment, the cantilever deflection measurement systemmay comprise components to electrostatically (i.e., capacitively) detectand measure the deflection of the reference cantilever in the mannerdescribed later for the electrostatic deflection sensors 161 shown inFIG. 18 and described later.

Turning again to FIG. 1, in this case, the controller 114 calibrates theposition of the activated tip 138 of the SPM probe 122-1 by controllingthe positioning system 103 to scan the activated tip over the referencetip 138 of the calibration structure 128-1. Referring to FIG. 10, asthis occurs, the deflection of the reference cantilever 136 is measuredby the cantilever deflection measurement system 205 at each scan pointas just described. Since the reference tip is at a precisely knownposition with respect to the reference location, the AFM measurements ofthe deflection of the reference cantilever are used to calibrate theprecise position of the activated tip of the probe with respect to thereference location and to examine the tip's profile. Specifically, theAFM measurements are used to produce an image of the activated tip. Fromthe produced image, the positional offset of the activated tip at theknown position of the reference tip can be determined. Based on thispositional offset, the precise positioning of the tip with respect tothe reference location is then calibrated. Moreover, from the producedimage, it can be determined whether or not the activated tip isdefective.

Furthermore, the reference tip 138 can be made conductive in the samemanner was described earlier for the activated tip 138 of the SPM probe122-1. In this case, the position of the activated tip can be calibratedand its profile examined using STM measurements. This would be done inthe same manner was just described for making AFM measurements, exceptthat STM measurements of the tunneling current between the reference tipand the activated tip would be made to produce an image of the activatedtip. This would be done using the STM measurement circuit 213 in themanner described later.

Additionally, the position calibration technique just described may beused in combination with any of the other position calibrationsdescribed herein. This would be done to provide a particular optimalreference process in which a more precise position calibration isdetermined or in which the position calibration is derived in a shortertime.

Calibration Using SPM Probe 133

Turning now to FIG. 9, the calibration structure 128-1 may include areference SPM probe 133 for calibrating the position of and examiningthe profile of the activated tip 138 of the SPM probe 122-1. This isdone by generating a particle beam that strikes the activated tip andcollecting the secondary particles that result. The SPM probe 133 isformed in the base 185 of the calibration structure and is located at aprecisely known location with respect to the reference locationdiscussed earlier.

For example, the reference SPM probe 133 may be constructed like thee-beam tool 382 of the eigth SPM probe 122-8 discussed later, exceptthat it has a duct 399 formed in the base 185 of the calibrationstructure. The duct is connected to the aperture 132 of the referenceSPM probe, as shown in FIG. 87. Referring to FIG. 1, the duct is alsoconnected to a corresponding flexible tube 345. Thus, when thecontroller 114 calibrates the position of the activated tip 138 of thefirst SPM probe 122-1, it causes the valve 346 to be opened so that thevacuum source 192 is in fluid communication with the aperture 132 of theSPM probe 133. As a result, a microvacuum chamber (i.e., zone or space)is created in the gap between the SPM probe 122-1 and the base 185. Thisis done in a similar way to that described in more detail forestablishing a gap between the first SPM probe 122-1 and the object 102using the apertures 132 in the first probe.

Then, referring to FIG. 9, the controller 114 controls the positioningsystem 103 to scan the activated tip 138 over the reference SPM probe133. The other components 123 of the SPM system 100 further include aparticle measurement control circuit 187, as shown in FIG. 43. Thecontroller controls the particle measurement control circuit to causethe SPM probe to produce an e-beam that and detect any secondaryelectrons in the manner discussed later for the e-beam tool 382 of theSPM probe 122-8. The particle measurement control circuit makes aparticle measurement of the detected electrons and provides it to thecontroller. The controller collects the particle measurements andproduces an image of the activated tip in the same manner as aconventional particle microscope, such as an electron microscope. Fromthe produced image, the positional offset of the tip at the knownposition of the SPM probe can be determined. Based on this positionaloffset, the precise positioning of the tip with respect to the referencelocation is then calibrated. Moreover, from the produced image, it canbe determined whether or not the tip is defective.

Similarly, the reference SPM probe 133 could be constructed like each ofthe ion beam tools 450 of the eleventh SPM probe 122-11 discussed later.Here, the position of the activated tip 138 would be done in a similarmanner to that just described. But, in this case, an ion beam would beproduced and secondary ions would be collected by such a reference SPMprobe in the manner discussed later for the eleventh probe.

Additionally, the position calibration technique just described may beused in combination with any of the other position calibrationsdescribed herein. This would be done to provide a particular optimalreference process in which a more precise position calibration isdetermined or in which the position calibration is derived in a shortertime.

Calibration with Radiation Measurements

The position of the activated tip 138 of the SPM probe 122-1 may also becalibrated in another way. In order to do this, the SPM system 100includes another calibration structure 128-2 that, like the firstcalibration structure 128-1, may be located on the rough positioningsubsystem 104. As shown in FIG. 11, this calibration structure mayinclude one or more reference materials 189 on an insulating material199 on the base 190 of the reference structure. Each reference materialhas a precisely known position with respect to the reference location.And, each reference material may comprise a material that has knownradiation properties when light interacts with it. For example, this maybe a material with known light absorption properties or known lightreflection properties. Furthermore, this may be a material with knownlight frequency altering properties. For example, such a material may bea frequency doubling material, such as gallium arsenide or galliumnitride. Or this material could be a fluorescing material or a materialwhich produces second harmonic or Raman characteristics when lightinteracts with it.

Referring to FIG. 5, as alluded to earlier, the probe 122-1 is used formaking radiation measurements and includes a lens 147 over each tip 138for doing so. In addition, in order to make radiation measurements, themeasurement components include measurement optics 224 comprising a lightsource 208, a photodetector 209, and mirrors 210 and 211 which are alllocated in the scanning head 120 and optically coupled together. But,these optics and the lens over an activated tip may also be used tocalibrate the position of the tip.

Turning again to FIG. 1, in this case, the controller 114 calibrates theposition of the activated tip 138 by controlling the positioning system103 to attempt to position the tip over one of the reference materials189 of the calibration structure 128-2. Then, referring to FIG. 5, thecontroller controls the light source 208 to provide radiation in theform of a narrow beam of light with a desired wavelength (i.e.,frequency) spectrum. The narrow beam of light is directed to the lens147 of the probe 122-1 by the mirror 210. The lens focuses the narrowbeam of light within the activated tip 138. The tip acts as an antennaor waveguide and the focused light propagates through the tip until itis emitted by the tip's aperture, which was described earlier. Theemitted light then optically interacts with the reference material. Theresulting light from the optical interaction is captured by the tip'saperture and propagates back through the tip to the lens. The lens thendirects the resulting light to the mirror 210 which re-directs it to theother mirror 211. This mirror then directs the resulting light to thephotodetector 209 which detects it and makes NSOM measurements of itsconstituent wavelengths. These NSOM measurements are further describedin U.S. patent application Ser. No. 08/906,602, U.S. patent applicationSer. No. 08/412,380, and PCT Application No. PCT/US95/09553 referencedearlier.

And, referring to FIG. 11, in an alternative embodiment, the othercomponents 123 of the SPM system 100 may include a radiation measurementsystem 389 which is used instead of the photodetector 209 to detect theresulting light from the optical interaction of the light emitted by thetip and the reference material. Or, the resulting light may be detectedusing one of the SPM probes 122-14, 122-15, or 122-16 in the mannerdescribed later. In this case, the narrow beam of light may be choppedor modulated in a characteristic way by the light source 208. Then, thischopping or modulation is reproduced in the radiation measurement system389 or the radiation measurement circuit 514 used with the SPM probes122-14, 122-15, or 122-16 so that the excitation and/or resultingradiation can easily be distinguished from the background or noiseradiation by the radiation measurement system.

Furthermore, in another embodiment, rather than using the mirrors 210and 211, a fiber optic guide may be used to deliver the light to theactivated tip 138 and direct the resulting light back to thephotodetector. Additionally, a fresnel lens integrated in the cantileverover the tip could be used rather than the refractive lens 147 to focusthe narrow beam of light within the tip and direct the resulting lightfrom the optical interaction with the reference material back to thefiber optic guide. Such a configuration is described in U.S. patentapplication Ser. Nos. 08/281,883, 08/412,380, and PCT Application No.PCT/US95/09553 referenced earlier.

From the radiation measurements made by either the photodetector 209,the radiation measurement system 389, or one of the SPM probes 122-14,122-15 or 122-16, the controller 114 generates a spectrum of themeasured wavelengths (i.e., frequency spectrum) and compares thegenerated spectrum and its intensity (i.e., amplitude) with a storedknown reference spectrum of wavelengths for radiation that results whenlight with the same wavelength spectrum as the narrow beam of lightoptically interacts with the reference material 189. If they match andthe intensity is maximized, this means that activated tip 138 waspositioned directly over the reference material. Thus, in a closedfeedback loop, the tip is positioned, the light is emitted from the tip,the wavelengths and the intensity of the resulting radiation aremeasured, and the generated and reference spectrums are compared in themanner just described until it is determined by the controller that thetip is in fact positioned over the reference material. Since the tipwill be positioned in very small motions about the reference material189, the use of the chopped or modulated narrow beam of light is veryhelpful in this process because the resulting radiation and itsintensity can be easily measured independent of noise.

Once it is determined by the controller that the tip 138 is positionedover the reference material 189, the positional offset of the activatedtip at the known position of the reference material is determined. Basedon this positional offset, the precise positioning of the tip withrespect to the reference location is then calibrated.

Since there may be more then one reference material 189, the processjust described may be repeated for each of these reference materials. Inthis way, the results of the calibrations computed for all of thereference materials may be combined to provide a weighted or averagedcalibration of the position of the activated tip 138.

The second calibration structure 128-2 may additionally include one ormore reference radiation detection devices 460 formed on the insulatingmaterial 199 of the base 190 of the calibration structure. Eachradiation detection device has a precisely known position with respectto the reference location. More specifically, referring to FIG. 52, eachradiation detection device includes an aperture structure 466 and asemiconductor radiation detector 463 formed on the insulating material.The aperture structure blocks (or absorbs) extraneous radiation fromcontacting the radiation detector and is grounded by the radiationmeasurement circuit 181. But, it also allows radiation that is directedto the radiation detector to pass through the aperture 467 in theaperture structure and contact the radiation detector. The radiationdetector may comprise a radiation sensitive semiconductor junction diodeor junction transistor, such as a photodiode or phototransistor, that isformed in the manner well known to those skilled in the art and in themanner described in “Radiation Detection and Measurement”, by Glenn F.Knoll, Wiley, New York, 1979, Ch. 11, pp. 359-413, Ch. 2, pp. 39-78. Theradiation detector may be suitably doped and constructed to detect awide spectrum of radiation or selected kinds of radiation. Here, theradiation detector detects radiation in the form of light that passesthrough the aperture.

Turning again to FIG. 1, in this case, the controller 114 calibrates theposition of the activated tip 138 in a similar way to that justdescribed. Here, however, the controller controls the positioning system103 to attempt to position the tip over one of the radiation detectiondevices 460. Then, referring to FIG. 5, the controller causes light tobe emitted from the tip's aperture in the manner just discussed. Theradiation detector then provides a signal representing the light itdetects to a radiation measurement circuit 181. The radiationmeasurement circuit is one of the other components 123 of the SPM system100 and makes a measurement of the detected light. It then provides thismeasurement to the controller 114 which analyses the measurement todetermine if the radiation detector detected the light emitted by thetip. Thus, in a closed feedback loop, the tip is positioned, the lightis emitted by the tip, and the measurement from the radiationmeasurement circuit is analyzed in the manner just described until it isdetermined by the controller that the tip is in fact positioned over thereference material. Once this occurs, a positional offset is computedand the precise positioning of the tip with respect to the referencelocation is then calibrated based on the positional offset in the mannerjust described.

If there are mutiple radiation datetion devices 460 for deterting light,the results of the calibrations computed for all of the radiationdetection devices may be combined to provide a weighted or averagedcalibration of the position of the activated tip. Or, the controller 114compares the relative intensities or time of flights of the radiationdetected by the radiation detection devices to determine which one isclose to the tip.

Additionally, the position calibration technique just described may beused in combination with any of the other position calibrationsdescribed herein. This would be done to provide a particular optimalreference process in which a more precise position calibration isdetermined or in which the position calibration is derived in a shortertime.

Calibration with STM Measurements

Referring to FIG. 10 again, the second calibration structure 128-2 alsoincludes one or more other reference structures 191 that may be used tocalibrate the position of the activated tip 138. These referencestructures are formed on an insulating material 199 on the base 190 ofthe calibration structure. The reference structures may each comprise aconductive tip at precisely known position with respect to the referencelocation. Each conductive tip is coated with a conductive material withknown conductive properties and is connected to an STM measurementcircuit 213. The STM measurement circuit is one of the other components123 of the SPM system 100.

As discussed earlier, the SPM probe 122-1 may be used to make STMmeasurements. As shown in FIG. 4, depending on which is conductive, theobdurate coating 146 or the reflective coating 143 of each tip of theprobe 122-1 is coupled to the STM measurement circuit 213. Thus, anactivated tip 138 of the probe may have its position calibrated by usingit to make STM measurements with the reference structures 191 on thecalibration structure 128-2.

Specifically, referring again to FIG. 1, the controller 114 calibratesthe position of the activated tip 138 of the SPM probe 122-1 bycontrolling the positioning system 103 to attempt to position theactivated tip over one of the reference structures 191 of thecalibration structure 128-2. Then, referring to FIG. 10, the controllercontrols the STM measurement circuit 213 to apply a specific voltageacross whichever of the obdurate coating 146 and the reflective coating143 of the tip is conductive and the reference structure so as togenerate and measure a tunneling current between them. The controllercompares the generated STM measurement with a stored precisely knownreference measurement of a tunneling current between the referencestructure and a reference tip caused by the same voltage. If they match,this means that activated tip 138 was positioned directly over thereference material. Thus, in a closed feedback loop, the tip ispositioned and the generated and reference STM measurements are comparedin the manner just described until it is determined that the tip is infact positioned over the reference structure. Once this occurs, thepositional offset of the activated tip at the known position of thereference structure is determined. Based on this positional offset, theprecise positioning of the tip with respect to the reference location isthen calibrated.

Also, since there may be more then one reference structure 191, theprocess just described may be repeated for each of these referencestructures. Thus, as with the reference materials 189, the results ofthe calibrations computed for all of the reference structures 191 may becombined to provide a weighted or averaged calibration of the positionof the activated tip 138.

Additionally, the reference structures 191 may also be used to calibratethe activated tip 138 of the SPM probe 122-1 for making STMmeasurements. Specifically, the controller 114 controls the generatingof an STM measurement of the tunneling current between the activated tipand one of the reference structures 191 in the manner just described.Then, the controller compares this generated STM measurement with thereference measurement described earlier to determine the offset betweenthem. Based on this offset, the precise tunneling current between theactivated tip and the object 102 can be calibrated for making STMmeasurements. And, this process may be repeated for each of thereference structures. Thus, similar to the position calibration usingthese reference structures, the results of the STM measurementcalibrations computed for all of these reference structures may becombined to provide a weighted or averaged STM measurement calibrationfor the activated tip.

Additionally, the position calibration technique just described may beused in combination with any of the other position calibrationsdescribed herein. This would be done to provide a particular optimalreference process in which a more precise position calibration isdetermined or in which the position calibration is derived in a shortertime.

Tip Machining Structures

As mentioned earlier, the components of the SPM system 100 may includeone or more tip machining structures 121. As shown in FIG. 84, such atip machining structure includes abrasive and chemical lappingmicrostructures 820 and 821 on a base 822 of the structure. Theselapping structures may be used to machine the activated tip 138 of theSPM probe 122-1 to sharpen and/or shape it.

The abrasive lapping microstructures 820 may be used to abrasivelyremove (or lap) material from the activated tip 138. For example, asshown in FIG. 85, such a lapping microstructure may be shaped like thetip. Then, the controller 114 controls the positioning system 103 tomove the tip so that it rubs against the lapping microstructure. Thisabrasively shapes and/or sharpens the tip. For example, the abrasivelapping microstructure may comprise silicon and be used to shape and/orsharpen the obdurate coating 146 of the tip.

Similarly, the chemical lapping microstructures 821 may be used tochemically remove (or lap) material from the activated tip 138. As shownin FIG. 85, such a lapping microstructure may also be shaped like thetip. Similar to the abrasive lapping microstructure 820, the controller114 controls the positioning system 103 to move the tip so that it rubsagainst the chemical lapping microstructure. This chemically shapesand/or sharpens the tip. For example, the chemical lappingmicrostructure may comprise iron and be used to shape and/or sharpen thediamond coating 146 of the tip by chemically dissolving it.

As those skilled in the art will recognize, this may be done similarlyfor the tips 138, 238, 242, and 320 of any of the SPM probes 122-1 to122-7, 122-17, and 122-18 described herein.

Calibration with Force Balance 128-3

Referring to FIG. 12, the calibration structures 128 include ananostructured force balance (or sensor) 128-3 for calibrating theactivated tip and the cantilever 136 on which it is located for AFMoperation. The force balance includes an electrostatically (i.e.,capacitively) and mechanically displacible (i.e., moveable) balanceplatform 214. It also includes a suspension system 225 that comprisesspring arms (or crab legs) 215. Each spring arm has one end coupled tothe balance platform. As shown in FIG. 13, the force balance alsoincludes a base 216 and anchors 217. The other end of each spring arm iscoupled (i.e., anchored) to the base with a corresponding anchor. As aresult, the spring arms displacibly (i.e., moveably) suspend the balanceplatform over the base so that it can be displaced.

Referring still to FIG. 13, the force balance 128-3 includes a Zdimension lower displacement actuator/sensor 227 that comprises astationary lower plate electrode 218 and a displaceable plate electrode220 that is also part of the balance platform 214. The lower plateelectrode is formed on an insulating plate 219 on the base 216 and isthereby connected to the base. The lower plate electrode and thedisplaceable plate electrode together form a capacitor.

The force balance 128-3 also includes a Z dimension upper displacementactuator/sensor 229 that comprises insulating support anchors 221, astationary upper plate electrode 223, and the displaceable plateelectrode 220 just mentioned. The support anchors are anchored to thebase and fixedly support the cantilevered electrodes 222 that form thestationary upper plate electrode. As a result, they connect thecantilevered electrodes to the base and suspend the cantileverelectrodes over the balance platform. The upper plate electrode and thedisplaceable plate electrode together form a capacitor.

The upper displacement actuator/sensor 229 may be used to displace (ormove) the balance platform 214 in the Z dimension in a direction up awayfrom the base 216 and may be used to sense displacement (or movement) ofthe balance platform in this direction. Similarly, the lowerdisplacement actuator/sensor 227 may be used to displace the balanceplatform 214 in the opposite direction in the Z dimension down towardthe base 216 and may also be used to sense displacement of the balanceplatform in this direction.

Specifically, in the case of the displacement actuator/sensor 227, whena differential voltage is applied between the displaceable plateelectrode 220 and the stationary plate electrode 218 in a displacementactuating mode, a corresponding electrostatic force is caused whichelectrostatically (i.e., capacitively) displaces the balance platform214 down toward the stationary lower plate electrode in the Z dimension.Alternatively, in a displacement sensing mode, the change in the voltagebetween the displaceable plate electrode and the stationary lower plateelectrode can be electrostatically (i.e., capacitively) sensed tomeasure the displacement of the balance platform in the Z dimension.Similarly, in the case of the displacement actuator/sensor 229, anelectrostatic force is caused which electrostatically (i.e.,capacitively) displaces the balance platform up toward the cantileveredelectrodes 222 in the Z dimension when a corresponding differentialvoltage is applied between the displaceable plate electrode and thecantilevered electrodes in a displacement actuating mode. And, in adisplacement sensing mode, the displacement of the balance platform inthe Z dimension can be electrostatically (i.e., capacitively) sensed bymeasuring the change in the voltage between the displaceable plateelectrode and the cantilevered electrodes.

Turning back to FIG. 12, the force balance 128-3 aleo includes X and Ydimension displacement actuators/sensors 230. The X dimensionactuators/sensors may be used to cause and sense displacement of thebalance platform 214 in opposite directions in the X dimension.Similarly, the Y dimension actuators/sensors may be used to cause andsense displacement of the balance platform in opposite directions in theY dimension.

Each of the displacement actuators/sensors 230 includes a displaceablecomb structure 232 that is part of and fixed to the balance platform anda corresponding stationary comb structure 234 that is formed on theinsulating plate 219. The fingers of each of the displaceable combstructures are interdigitized with (i.e., aligned between) the fingersof the corresponding stationary comb structure.

Each pair of corresponding displaceable and stationary comb structures232 and 234 forms an electrostatic (i.e., capacitive) comb drive of thetype described in “Electrostatic Comb Drive for Resonant Sensor andActuator Applications”, University of California at Berkeley DoctoralDissertation, by William Chi-Keung Tang Nov. 21, 1990, which is herebyexplicitly incorporated by reference. This type of electrostatic combdrive is also described in U.S. patent application Ser. No. 08/506,516and PCT Application No. PCT/US96/12255 referenced earlier. Inparticular, the stationary and displaceable comb structures are made tobe conductive. Thus, when a differential voltage is applied across apair of corresponding stationary and displaceable comb structures in adisplacement actuating mode, their comb fingers interactelectrostatically (i.e., capacitively) with each other and cause anelectrostatic force. This force causes the displaceable comb structureto move in a linear direction toward the stationary comb structure inthe corresponding X or Y dimension. Alternatively, in a displacementsensing mode, the differential voltages across a pair of correspondingstationary and displaceable comb structures can be electrostatically(i.e., capacitively) sensed to measure the displacement of the balanceplatform in the corresponding X or Y dimension. Since the displaceablecomb structures are fixed to each side of the balance platform,displacement of the balance platform can be electrostatically (i.e.,capacitively) caused or sensed in both directions in the X dimension andin both directions in the Y dimension.

The force balance 128-3 also includes a balance control circuit 253. Inresponse to control signals from the controller 114, the balance controlcircuit controls the voltages (i.e., the electrostatic forces) appliedto the balance platform 214 by any of the displacement actuators/sensors227, 229, and 230. Additionally, the balance control circuit measuresany displacements of the balance platform in the X, Y, and Z dimensionsfrom the changes in voltages sensed by these displacementactuators/sensors. In response, the balance control circuit generatesdisplacement measurement signals that are provided to the controller andrepresent these measured displacements. The control circuit ispreferably located on the base 216 of the force balance to minimize theamount of stray capacitances which may affect the operation of thecontrol circuit.

In alternative embodiments, the Z dimension lower and upper displacementactuators/sensors 227 and 229 may each comprise a comb drive withdisplaceable and stationary comb structures like those of the X and Ydimension displacement actuators/sensors 230. Conversely, the X and Ydimension displacement actuators/sensors may comprise displaceable andstationary plate electrodes like those of the Z dimension lower andupper displacement actuators/sensors. In other embodiments,piezoresistors or piezoelectric bimorphs could be used as displacementactuators in the X, Y, and Z dimensions to cause displacements in the X,Y, and Z directions.

Furthermore, referring to FIG. 13, the balance platform 214 may includeinsulating bushings (or dimples) 236 that extend out from thedisplaceable electrode plate 220. The bushings that extend out from theupper surface of the displaceable plate electrode prevent it fromcontacting the stationary plate electrode 218 when it is pulled downtoward the stationary plate electrode so as not to cause a shortcircuit. Similarly, the bushings that extend out from the lower surfaceof the displaceable plate electrode prevent it from contacting thecantilevered electrodes 222 and thereby not causing a short circuit thisway.

The displaceable electrode plate 220 and the displaceable combstructures 232 may be formed from the same semiconductor material, suchas polysilicon, which is conductive. In this way, the displaceableelectrode plate and the displaceable comb structures are electricallyconnected together. In this way, the same voltage (preferably ground)can be applied to the displaceable plate electrode and the moveable combstructures so that differential voltages can be conveniently applied andmeasured across these structures and the stationary plate electrode 218,the cantilevered electrodes 222, and the stationary comb structures 234.Moreover, the stationary plate electrode and the cantilevered electrodesmay also be formed from a conductive material, such as polysilicon madeor tungsten, while the stationary comb structures would be formed fromthe same conductive material as the moveable comb structures. Theinsulating plate 219, the insulating support anchors 221, the spring armsupport anchors 217, and the insulating bushings 236 may be formed froman insulating material, such as silicon dioxide.

Additionally, in order to prevent particles from effecting the operationof the force balance 128-3, it includes an enclosure 233. The enclosureis connected to the base 216 and prevents entry of particles into theforce balance.

In order to enable the force balance to operate properly, the enclosure233 includes a flexible membrane (or diaphragm) 235 that is flexible inthe X, Y, and Z dimensions. In this way, contact can be made with thecontact platform 214 via the membrane so that displacement of thebalance platform in the X, Y, and Z dimensions due to the contact willnot be impeded. Specifically, the flexidle membrane includes a connectorportion 257, a spring portion 255, and a contact portion 241, as shownin FIG. 14. The contact portion is the portion of the membrane to whichcontact is made in order to cause displacement of the balance platform214. The connector portion is connected to the main body 243 of theenclosure. The spring portion is connected between the connector andcontact portions. The spring portion is corrugated and acts as a springin the X and Y dimensions. This makes the membrane flexible through avery limited range all of the X, Y, and Z dimensions. Referring to FIG.15, the connector, spring, and contact portions of the membrane areannular.

Referring back to FIG. 13, the enclosure 233 has an opening 245 tomaintain a constant pressure within the enclosure during operation ofthe force balance 128-3. The enclosure further includes a filter 247that extends across the opening and prevents any particles from enteringinto the enclosure through the opening.

In order to enable the contact platform 214 to be contacted through theenclosure 233 via the membrane 235, the contact platform 214 furthercomprises a contact portion 238 that protrudes out from the displaceableplate electrode 220 passed the cantilevered electrodes 222. In order toprevent wear of the balance platform 214, the contact portion maycomprise an obdurate material, such as diamond, silicon carbide, carbonnitride, or diamond like carbon. In this case, the contact portion isformed on the plate electrode in a similar manner to that discussedearlier for the obdurate coating 146 of the tips 138 of the probe 122-1.

Turning again to FIG. 1, the user may use the user interface 116 toinstruct the controller 114 to calibrate the first SPM probe 122-1 forthe forces that are imparted by its activated tip 138 in response tocorresponding positioning displacements in the position of the probe.This may be done in order to calibrate the probe for making SPMmeasurements, in particular AFM measurements, and SPM modifications, aswill be explained later.

Referring back to FIGS. 5 and 12, the controller calibrates these forcesby selectively controlling the positioning system 103 and the X, Y, andZ dimension displacement actuators/sensors 227, 229, and 230 toselectively apply opposing contact and actuator forces to the balanceplatform 214 of the force balance 128-3 while the activated tip is incontact with the balance platform. The contact forces are caused bypositioning displacements in the position of the probe made with thepositioning system. The actuator forces are electrostatic forces appliedby the X, Y, and Z dimension displacement actuators/sensors 227, 229,and 230. The cantilever deflection measurement system 200 or the X, Y,and Z displacement actuators/sensors may be used to monitor the contactand actuator displacements of the balance platform due to the appliedcontact and actuator forces. As those skilled in the art will recognize,this calibration may be done in a number of ways.

For example, this can be done in a first DC mode. Specifically, the SPMsystem 100 is operated in a simple closed feedback loop using thepositioning system 103, the cantilever deflection measurement system200, and the X, Y, and Z dimension actuators/sensors 227, 229, and 230.The controller 114 initially controls the positioning system 103 toposition the SPM probe 122-1 at a reference position where the activatedtip 138 just contacts the balance platform 214 (via the membrane 235 )without any bending of the cantilever 136 being measured by thecantilever deflection measurement system. Then, the controller 114causes a known value of actuator force in the Z dimension to be appliedto the balance platform by the upper Z dimension actuator/sensor 229.This causes an actuator displacement of the balance platform up towardthe cantilevered electrodes 222 in the Z dimension. The contactdisplacement of the balance platform can be measured with the cantileverdeflection measurement system by measuring the correspondingdisplacement of the tip. Alternatively, this displacement can be sensedby the lower Z dimension displacement actuator/sensor 227 and measuredby the balance control circuit 253. In response to the measureddisplacement, the positioning system causes a positioning displacementin the position of the probe so that the cantilever 136 bends and theactivated tip applies an opposing contact force to the balance platform.This causes an opposing contact displacement of the balance platformwhich is measured in the same way as the actuator displacement. Thecontroller monitors the measured contact and actuator displacements forthe point as they are nulled out by each other. The actuator force andthe positioning displacement of the probe are recorded at this nullpoint. Since the contact and actuator forces are also nulled out by eachother, the value of the actuator force at this point is a measure of thecontact force that is normal to the balance platform. This process isthen repeated for other known values of the actuator force so that aforce calibration table of contact forces in the Z direction andcorresponding positioning displacements is recorded.

This process is done in a similar manner in the X and Y dimensions usingthe X and Y dimension displacement actuators/sensors 230. In this case,one of the X dimension displacement actuators/sensors is used as anactuator to cause actuator displacement of the balance platform in the Xdimension while the other one is used to sense the actuator and contactdisplacements of the balance platform in the X dimension. Similarly, inthe Y dimension, one of the Y dimension displacement actuators/sensorsis used as an actuator to cause actuator displacement of the balanceplatform in the Y dimension while the other one is used to sense theactuator and contact displacements of the balance platform in the Ydimension. Here, the recorded contact forces are lateral forces. Forexample, these forces may include a cutting force when a tip 138, 238,and 320 of one of the SPM probes 122-1 to 122-7 is used to make a cut inor mill the contact portion 238 of the contact platform 214 in themanner described herein. These forces could also be stiction andfriction forces.

As a result, a complete force calibration table of contact forces andcorresponding positioning displacements can be compiled in this way. Inother words, each contact force for a corresponding positioningdisplacement has normal and lateral components in the X, Y. and Zdirection. For example, this complete force calibration table mayidentify the machining characteristics for the tip 138, 238, and 320 ofone of the SPM probes 122-1 to 122-7 discussed herein.

In a second DC mode, the SPM probe 122-1 is positioned initially at thereference position as in the first DC mode just discussed. Then, thecontroller 114 causes the positioning system 103 to cause a knownpositioning displacement in the position of the probe. As a result, thecantilever 136 bends and the activated tip applies a contact force tothe balance platform which causes a contact displacement of the balanceplatform in the X, Y, and Z dimensions. This contact displacement ismeasured in the manner discussed earlier. In response to the measuredcontact displacement, the controller causes an opposing actuator forcein the X, Y, and Z dimensions to be applied to the balance platform bythe upper Z dimension actuator/sensor 229. This causes an opposingactuator displacement of the balance platform in the X, Y, and Zdimensions which is measured in the manner discussed earlier. As in thefirst DC mode, the controller then records the value of the actuatorforce and the positioning displacement of the probe at the point wherethe measured contact and actuator displacements are nulled out by eachother. This process is then repeated for other known displacements ofthe probe so that a complete force calibration table of contact forcesin the X, Y, and Z dimensions and corresponding positioningdisplacements is recorded.

In the DC modes just described, the lower Z dimension displacementactuator/sensor 227 is not needed and the force balance 128-3 could beconstructed without them. But, in variations of the DC modes justdescribed, the lower Z dimension displacement actuator/sensor 227 can beused to perform these modes at a biased reference position. In thesemodes, the SPM probe 122-1 is positioned at a reference position wherethe activated tip 138 does contact the balance platform 214 with bendingof the cantilever 136. Then, the controller 114 causes the lower Zdimension displacement actuator/sensor to apply an actuator force to thebalance platform. This causes an actuator displacement of the balanceplatform down toward the base 216. The controller monitors thedeflection of the cantilever measured by the cantilever deflectionmeasurement system. Then, at the point where no more bending of thecantilever is detected by the controller, the above DC modes areperformed.

An AC mode may also be used to calibrate the activated tip 138. In thismode, the controller 114 first causes the lower Z dimension displacementactuator/sensor 227 to apply a reference actuator force with a knownvalue to the balance platform 214 while the activated tip is not incontact with the balance platform. This causes the balance platform tobe displaced in the Z dimension down toward the base 216. Then, whilethis force is still being applied without contact by the tip, thecontroller causes the balance platform to oscillate up and down in the Zdimension. This is done by causing the lower and upper Z dimensiondisplacement actuators/sensors 227 and 229 to alternately apply actuatorforces in the Z dimension to the balance platform. The frequency atwhich these forces are alternately applied is varied until the resonantfrequency of oscillation is found. The known value of the referenceactuator force and the resonant frequency are then recorded. Thisprocess is then repeated for other known values of the referenceactuator force so that a Z dimension reference table of actuator forcesin the Z dimension and corresponding resonant frequencies is recorded.

This process is similarly performed in the X and Y dimensions to obtainX and Y dimension reference tables of reference actuator forces in the Xand Y dimensions for corresponding resonant frequencies. However, in theX dimension, the X dimension displacement actuators/sensors are used tocause actuator displacements of the balance platform in the X dimension.Similarly, the Y dimension displacement actuators/sensors are used tocause actuator displacements of the balance platform in the Y dimension.

Then, the SPM probe 122-1 is positioned initially at a referenceposition as described earlier without bending of the cantilever 136. Thecontroller 114 then causes the positioning system 103 to cause a knownpositioning displacement in the position of the probe from the referenceposition. As described earlier, this causes the cantilever 136 to bendand the activated tip applies a contact force to the balance platformwhich causes a contact displacement of the balance platform in the X, Y,and Z dimensions. The controller then causes the balance platform to beoscillated in the X, Y, and Z dimensions in the manner just described.The frequencies at which the actuator forces are alternately applied inthe X, Y, and Z dimensions are varied until the resonant frequencies ofoscillation in the X, Y, and Z dimensions are found. The referenceactuator forces in the X, Y, and Z dimension reference tables thatcorrespond to these resonant frequencies are measures of the componentsin the X, Y, and Z dimensions of the contact force applied to thecontact platform. These components are recorded as the contact force forthe corresponding positioning displacement of the probe. This process isthen repeated for other known positioning displacements to obtain acomplete force calibration table of contact forces and correspondingpositioning displacements.

The forces calibrated with the force balance 128-3 in the manner justdescribed are at the micro, nano, pico, and femto Newton level. Thus, asthose skilled in the art will recognize, the SPM system 100 can be usedwith the force balance 128-3 as a force measurement system to measure acontact force applied by an object to the balance platform 214 of theforce balance 128-3. The controller 114 then causes the resultingcontact and actuator displacements of the balance platform to be nulledin the manner described earlier. The value of the actuator force appliedto cause this nulling effect is a measure of the contact force. Thus,this process could be used to simply measure the weight of an object atthe micro, nano, pico, and femto Newton level which is placed on thebalance platform. Or, it can be used in an inertial sensor to measure aninertial input that causes a corresponding displacement of an element ofthe inertial sensor that contacts the balance platform.

Furthermore, a similar procedure can be used to calibrate the forcebalance 128-3. Specifically, a contact force with a known value can beapplied to the balance platform 214 to cause the contact displacement.The controller 114 then causes the resulting contact and actuatordisplacements of the balance platform to be nulled in the mannerdescribed earlier using the lower Z dimension displacementactuator/sensor 227. The value of the voltage applied to the lower Zdimension displacement actuator/sensor in order to cause the actuatorforce corresponding to the actuator displacement is recorded along withthe known value of the contact force. The known value of the contactforce is a measure of the value of the actuator force. This process isrepeated for other contact forces with known values to create acalibration table of voltage values and corresponding actuator forcevalues. This calibration table is then used in the above DC and AC modesto apply actuator forces with known values. This process is repeated forthe other displacement actuators/sensors 229 and 230.

The force balance 128-3 was described previously for use in measuring orcalibrating forces in the X, Y, and Z dimensions. However, as thoseskilled in the art will recognize, the force balance 128-3 can be usedto measure or calibrate forces in only one or two dimensions as well. Inthis case, the force balance could be constructed without those of thedisplacement actuators/sensors 227, 229, and 230 for the correspondingdimension(s) not needed.

Additionally, the force balance 128-3 was described for use incalibrating the contact forces applied by the tip 138 of an SPM probe122-1. However, it may be more generally used to calibrate the contactforces applied by any object which has a contact portion (e.g., the tipof the probe) and a positionable portion (e.g., the base 130 or theprobe) and a spring portion (e.g., the cantilever) that connects thecontact and positionable portions. More specifically, it could be usedto calibrate the contact forces applied by the contact portion of theobject with respect to positioned displacements of the positionableportion of the object.

Imaging Optics

Referring to FIG. 5, each scanning head 120 has imaging optics 226. Theimaging optics are used to make an optical image of the object forproperly inspecting the object 102 with the probe 122-1. These opticsinclude image forming optics 228 and the lenses 202 and 203. The imageforming optics may be conventional or confocal image forming optics asfound in a conventional or confocal microscope. This kind of arrangementmay be configured in the manner described in U.S. patent applicationSer. No. 08/613,982 referenced earlier where the image forming opticsare located externally from the scanning head.

The imaging optics 226 may be used to produce a low magnificationoptical image of the object 102 or a calibration structure 128.Specifically, the controller 114 causes the positioning system to scanthe object 102 or a calibration structure 128 with the scanning head120. At each scan point, the image forming optics 228 causes light to bedirected to the lenses 202 and 203 which focus the light on the objector calibration structure. The resulting light reflected by the object orcalibration structure is directed back to the image forming optics bythe lenses. The image forming optics detects this resulting light and inresponse forms an optical image of the object or calibration structure.This optical image is then provided to the controller.

The optical images produced by the imaging optics 226 may be used by thecontroller 114 in various ways. They may be used in conjunction with SPMmeasurements to inspect the object in the manner described in U.S.patent application Ser. Nos. 08/906,602, 08/885,014, 08/776,361, and08/613,982. Or, they may be used to produce complete images of themodifications being made to the object or the calibrations being made tothe probe 122-1. Specifically, the image optics may be used to findreference points and/or specific (optically) resolvable structures to bemodified and/or inspected.

SPM Inspections with SPM Probe 122-1

Referring again to FIG. 1, after calibrating the activated tip 138 ofthe probe 122-1 for making SPM measurements, it may be used to inspectthe object 102 by performing SPM measurements of the object. Thus, whenthe user instructs the controller 114 with the user interface to use theactivated tip to perform SPM measurements, the controller controls thepositioning subsystem 103, the corresponding components 123 of the SPMsystem 100, and, as needed, the probe in inspecting the object 102. Thisis done by causing the probe to be scanned over the object and thedesired SPM measurements of the object to be made at selected scanpoints.

For example, turning to FIG. 5, the SPM measurements may include AFMmeasurements made by scanning the activated tip 138 over the surface 166of the object 102 and measuring the deflection of the cantilever 136 onwhich the tip is located at selected scan points. This is done with thecantilever deflection measurement system 200 in the same way asdescribed earlier for calibrating the positioning of the tip 138.Moreover, this may be done using the force calibration table generatedduring calibration and described earlier.

Furthermore, the SPM measurements may also include STM measurements madeby scanning the activated tip 138 over the surface 166 of the object 102and causing and measuring a tunneling current between the activated tipand the object at selected scan points. This is done with the STMmeasurement circuit 213 in the same way as described earlier forcalibrating the positioning of the tip 138.

The SPM measurements may also include radiation measurements made byscanning the activated tip 138 over the surface 166 of the object 102and causing optical interaction between the tip and the object 102 atselected scan points. This may done in the manner discussed earlier forcalibrating the position of the tip.

The SPM measurements just described may be combined together or usedseparately by the controller 114 to generate the inspection data for theobject 102. As described earlier, this may include an image of theobject and/or various analysis of the object and may be done in themanner described in U.S. patent application Ser. Nos. 08/906,602,08/885,014, 08/776,361, and 08/613,982 referenced earlier.

For example, the AFM, STM, and radiation measurements may be combined togenerate an image of the object with the AFM measurements being used toproduce the basic image and the STM and radiation measurements beingused to supplement the basic image. The AFM measurements would provideinformation about the heights of the surface at the various scan points.The STM measurements would provide information on the electricalproperties of the object with which to supplement the basic image andthe radiation measurements would provide information on the compositionof the object (from the measured wavelength spectrum) with which tosupplement the basic image. In addition, if the narrow beam of lightused in producing the radiation measurements is rotationally polarized,as described in the patent applications just referenced, then theradiation measurements can be used to identify deep surface features,such as a pit, wall, or projection, and supplement the basic image withthis information. Additionally, the STM measurements could simply beused by themselves to generate an electrical map or analysis of theobject's conductivity and electrical properties according to thepositioning of the tip in making the STM measurements. And, theradiation measurements could be used to generate a compositionalanalysis on the composition of the object mapped according to thepositioning of the tip in making the radiation measurements. The AFM,STM, and radiation measurements can be made simultaneously during thesurface scan using an activated tip 138 of the SPM probe 122-1.

Furthermore, as discussed earlier, the inspection data may be used tomodify the object 102. In doing so, the controller 114 may compare thegenerated inspection data with target data that it stores. The targetdata may include a target image and/or analysis of the object which arecompared with the generated image and/or analysis of the object. Theresulting modification data from this comparison indicates where and howthe object needs to be modified in order to fall within a predefinedtolerance level of the reference parameters. Then, based on themodification data, the controller controls modification of the object102 using the probe 122-1 or one or more of the other SPM probesdescribed herein.

SPM Modifications with SPM Probe 122-1

The tip 138 of each SPM tool 137 of the SPM probe 122-1 has an obduratecoating 146, as mentioned earlier. As a result, an activated tip of theprobe can also be used to make SPM modifications of the object 102 bymaking cuts in and/or deforming the material of the object. The mannerin which this is done is described in greater detail in the discussionregarding the fifth SPM probe 122-5.

Operation with Vacuum

As an additional feature, the accuracy of the calibrations,examinations, inspections, and modifications just described can beimproved by operating the probe 122-1 in a vacuum. Specifically, bydoing so, the AFM, STM, and radiation measurements and the SPMmodifications of the object that were described earlier will be moreaccurate.

Referring to FIG. 1, in order to operate the probe 122-1 in a vacuum,the components of the SPM system 100 include a fluid system 344.Referring to FIG. 5, the fluid system includes a vacuum source 192 and acorresponding flexible tube 345 for each scanning head 120. The vacuumsource comprises a vacuum pump 193, a large vacuum chamber 194, and aconnector tube 195. The large vacuum chamber includes a valve 346 foreach flexible tube. The connector tube enables the vacuum pump and thevacuum chamber to be in fluid communication with each other. As aresult, the vacuum pump produces a vacuum in the large vacuum chamber.The large vacuum chamber is connected to each scanning head with acorresponding flexible tube. Each valve of the vacuum chamber can beindividually controlled by the controller 114.

Referring to FIG. 5, the large vacuum chamber 194 is connected to theinternal chamber 135 of the housing 154 of each scanning head 120 with acorresponding flexible tube 345. This means that a vacuum is alsoproduced in the internal chamber when the corresponding valve 346 of thelarge vacuum chamber is opened by the controller 114. As shown in FIG.2, the probe 122-1 has an aperture 132 for each tool 137 of the probe.Thus, turning back to FIG. 5, the vacuum source is in fluidcommunication with the apertures of the probe so that a microvacuumchamber (i.e., zone or space) can be created in the gap (or spacing) 198between the probe 122-1 and the object 102 or calibration structure 128in the space around these apertures when making SPM measurements.Furthermore, since the base 130 of the probe is wedged into the seat 158as described earlier, a good vacuum seal is formed. Alternatively, theaperture may be directly connected to the vacuum chamber via one or moretubes.

To show that such a microvacuum chamber can be created under thesecircumstances, it will be assumed that the apertures 132 in the probe122-1 approximate a single square aperture with 1 mm sides. It will alsobe assumed that base 130 of the probe approximates a circular plate with10 mm diameter and has a lower surface 142 that is flat to within ±1 μm(i.e., 1 μm rms surface roughness) and that the surface 166 of theobject is also flat to within ±1 μm. This will be assumed for a gap 198between the object and the base with a width between 20 nm and 10 μm.

The gap 198 between the object and the base defines a duct where ambientgas may leak into the microvacuum chamber. The flow characteristics forthis flow of gas are largely viscous with the given external pressureassumed to be 1.1 Atmospheres. The Knudsen number for the flow is givenby K=(ησL)⁻¹, where L is the width of the gap. For 1.1 Atmospheres, theparticle density η≈3.0×10¹⁹ cm⁻³. The molecular momentum exchange crosssection σ can be gleaned from the known viscosity μ. This is done usingμ=m<v>σ⁻¹, where m is the mass and v is the velocity across the crosssection, so that the cross section σ is on the order of 7.5×10⁻¹⁵ cm².Thus the limiting width L is 0.04 μm, which is less than the rmsroughness of the mating surfaces. Thus, K<1 until the gas pressurereduces to less than 0.04 Atmospheres and the rate-limiting step isviscous transport.

Adding a zone of Knudsen flow to the calculations will not affect theresult obtained from the viscous calculation by a significant amount.Moreover, the viscous regime will increase to almost the entire leakpath zone as the gap 198 is widened to several μm. As we shall see, thegas leak rate is a function of the radial aspect ratio onlylogarithmically, so that the addition of a molecular flow zone is not alarge effect.

The problem geometry can be approximated by turning the outside squaregeometry with sides of 10 mm into an equivalent circle with radius of 5mm. The gas leak rate in the actual square geometry can be bounded bythe gas leak rate for the circular geometry just described and acircular geometry with the outer diameter set to the diagonal length ofthe square $5\sqrt{2}\quad {{mm}.}$

Therefore, the result for the gas leak rate for a constant viscosity μindependent of gas pressure (accurate to first order) is given by firstsolving for the flux ┌ using the equation of continuity ∇·┌=0. Thisgives ┌=˜∇φ, where ∇²φ=0 and the solution for the circular geometry isφ≈C₁ log r+C₂. Since the flow is viscous, we have that ┌=−k∇p². In otherwords, the flow is proportional to the pressure gradient times thepressure (where isothermal flow conditions are assumed). The velocityprofile in the duct is given by v_(r)(z)=V(r)(1−4Z²/L²), where Z istaken to extend form −L/2 to +L/2. Substituting into the momentumequation ∂p/∂r=μ∇²v_(r), we have that V(r)=L²/(8 μ)∂p/∂r. Theappropriate boundary conditions give p(r)=p₀(log(r/a)/log(b/a))^(0.5),where b is the outer radius and a is the inner radius. Differentiatingthis to obtain the pressure gradient ∂p/∂r at the outer edge, we havethe complete expression for the gas leak rate:$Q = \frac{\pi \quad p^{2}{\langle L\rangle}{\langle L^{2}\rangle}}{12\quad {kT}\quad \mu \quad {\log \left( {b/a} \right)}}$

where T is the temperature and k is Boltzman's constant. For theparameters given, b/a=10, μ=1.8×10⁻⁴ g cm s⁻¹, and <L> varies between 20nm and 10 μm. The value of <L²>, the rms channel width, also appears inthe formula. Here, it is most appropriate to use <L²>=δ²+L² _(rms),where L_(rms) is the rms surface roughness and δ is the nominal spacing.We see that the surface roughness dominates for small δ. For the curvesin FIGS. 16 and 17, which will be described shortly, the parameter <L>was taken as $\sqrt{\langle L^{2}\rangle}.$

Another question of interest is the outlet gas density in themicrovacuum chamber. This can be found by using the free-streamingformula Q=Aη<v>/4, where A is the area of the aperture. A calculation ofthe average velocity v_(r) at the atmospheric side was also done toverify that the flow is dominantly subsonic.

For the various widths L, the curve in FIG. 16 shows the outlet gasdensity (expressed as an equivalent pressure in torr at 300 Kelvin ).Similarly, the curve in FIG. 17 shows the gas leak rate in standard cm³per second.

Furthermore, the ion mean free path in the microvacuum chamber can beobtained from the outlet gas pressure. Using an estimate of 10⁻¹⁶ cm²for a typical ion-neutral collision cross section, a 1.0-torr pressure(η=3.5×10¹⁶ cm⁻³) gives a mean free path of about 3 mm. The mean freepath depends not only upon the gas pressure but upon the energy andspecies of the ion. Thus, the above estimate is only a rough guide.Furthermore, since a large vacuum chamber 194 and a high capacity vacuumpump 193 are in fluid communication with internal chamber 135 of thehousing 154 of the scanning head 120, the mean free path is actuallymuch larger.

The approximation of circular geometry can now be used to examine thesquare geometry. The result for the square geometry will lie between theresults for the two limiting circular cases. For b/a=10, these resultsdiffer by ${\log \quad 10{\sqrt{2}/\log}\quad 10},$

or about fifteen percent.

As a final note, the analysis above was made for a single aperture thatapproximates the size of the apertures 132 of the probe 122-1. Thus, inalternative embodiment, the probe could have just one such aperturerather than multiple apertures.

As those skilled in the art will recognize, the principles discussedabove can be more general thought of in terms of a micro differentialpressure chamber being formed in the gap 198. In other words, themicrovacuum pressure chamber is simply a specific case where thedifferential pressure formed in the gap was due to a vacuum createdthere. Moreover, as will be discussed later, a differential pressurechamber may also be created in the gap by introducing a gas through theapertures 132 or other outlets in the probe.

Gap Sensing for Vacuum Operation

Referring back to FIG. 6, the width of the gap (or spacing) 198 betweenthe object 102 and the base 130 of the probe 122-1 must be properly set(or adjusted) so that a microvacuum chamber can be maintained in the gaparound the area of the apertures 132 of the probe 122-1. Thus, eachscanning head 120 includes displacement transducers 177 on the seat 158of the holding plate 156 of the housing 154. Like the engagement andadjustment transducers 172 and 173 discussed earlier, the displacementtransducers may each comprise a material, such as a piezoelectricmaterial or a resistive metal (e.g., Nickel Chromium alloy), whichchange dimensions when a voltage or current signal is applied to it.

In doing so, the components of the SPM system 100 further include a gapcontrol circuit 176 that is coupled to the controller 114 and thedisplacement transducers 177. As a result, the controller 114selectively controls the gap control circuit to change the dimension ofthe displacement transducers so that the they selectively push down onthe upper surface 140 of the base and displace the base in varyingamounts at different points. Thus, the width of the gap 198 between thelower surface 142 of the base and the surface 166 of the object can befinely set in this manner.

Referring to FIG. 2, the probe 122-1 has a number of recesses 163 in thebased 130. Formed in these recesses are cantilevered gap sensors 164.Each gap sensor comprises a corresponding cantilever 165 and acorresponding tip 167 on the cantilever. As shown in FIG. 18, thecantilever of each gap sensor is connected to the base so that it issuspended in the corresponding recess.

Still referring to FIG. 18, each gap sensor 164 also includes anelectrostatic (i.e., capacitive) tip actuator 162 for activating thecorresponding tip 167 for sensing the gap between the object 102 and thebase 130 of the probe 122-1. This tip actuator comprises a moveableplate electrode 139, an insulating plate 153 on an outcropping of thebase 130 that extends into the recess 163, and a stationary lower plateelectrode 168 on the insulating plate. The lower plate electrode istherefore connected to the base 130 and disposed below the cantilever.In this embodiment, the cantilever comprises a semiconductor material,such as silicon or silicon nitride, that is made conductive usingconventional techniques. As a result, the cantilever comprises themoveable plate electrode. Alternatively, the moveable plate electrodemay be formed on an insulating plate of the tip actuator which is formedon the cantilever so that the moveable plate electrode is connected tothe cantilever. In either case, the moveable plate electrode and thestationary lower plate electrode form a capacitor so that, when thecontroller 114 causes the gap control circuit 176 to apply a suitablevoltage between the moveable plate electrode and the lower plateelectrode, the cantilever is electrostatically (i.e., capacitively)deflected (i.e., bent) down toward the object 102. As a result, the tipis activated for sensing the gap between the object and the base.

Each gap sensor 164 further includes a electrostatic (i.e., capacitive)deflection sensor 161 that comprises the moveable plate electrode 139,an insulating plate 155 on the surface of the recess 163, and astationary upper plate electrode 169 on the insulating plate. Thestationary upper plate electrode is disposed over the cantilever andconnected to the base. The moveable plate electrode and the stationaryupper plate electrode form a capacitor. Thus, when the corresponding tip167 is activated, the gap control circuit electrostatically (i.e.,capacitively) senses changes in voltage across the moveable plateelectrode and the upper plate electrode caused by the deflection of thecantilever. In response, it makes gap measurements of the width of thegap and provides them to the controller 114. The gap measurements arethen monitored by the controller 114.

In alternative embodiment shown in FIG. 19, the gap sensors 164 could beelectrostatic (i.e., capacitive) gap sensors when the object 102 isconductive. In this case, each gap sensor includes an insulating plate178 on the base 130 of the SPM probe 122-1, a plate electrode 179 on theinsulating plate, and the object. The plate electrode and the objectform a capacitor. Thus, the change in voltage across the plate electrodeand the object can be electrostatically (i.e., capacitively) sensed bythe gap control circuit. In response, the gap control circuit 176 thengenerates a gap measurement signal that represents a measurement of thewidth of the gap between the object and the plate electrode.

Thus, in positioning the SPM probe 122-1 for making SPM measurements ofthe object 102, the controller 114 monitors the gap measurements made bythe gap control circuit 176. Based on these gap measurements, thecontroller controls the positioning system 103 and gap control circuit176 so as to provide the proper gap 198 between the upper surface 166 ofthe object 102 and the lower surface 142 of the probe. In this way, theentire gap can be set to have a uniform width between the upper surfaceof the object and the lower surface of the base so that the microvacuumchamber discussed earlier can be properly established and maintained.The above process is also used in establishing a gap between the lowersurface of the probe and the upper surface of a calibration structurewhen the probe is being calibrated.

Referring to FIG. 1, as alluded to earlier, the vacuum source 192 of theSPM system includes a large vacuum chamber 194 for each flexible tube345 connected to a scanning head 120. Thus, a vacuum can be maintainedin the large vacuum chamber regardless of whether the correspondingvalve of the large vacuum chamber is kept open or closed. And, since thevolume of the internal chamber 135 of the housing 154 of the scanninghead 120 is much smaller than the volume of the large vacuum chamber,the controller 114 can quickly establish a vacuum in the internalchamber and the microvacuum chamber in the gap 198 between the object102 and the base 130 of the probe 122-1 by opening the valve. Similarly,the controller can end this vacuum by closing the valve.

Probe Loading and Unloading using Vacuum

Thus, referring to FIG. 5, not only can a vacuum between the object andthe base of the probe 122-1 be easily established and ended in themanner just described, but the probe 122-1 itself can be loaded onto andunloaded from a scanning head 120. Specifically, turning to FIGS. 1 and6, during the loading process, the controller 114 lowers the scanninghead onto the probe so that the probe is within the seat 158. Then,referring back to FIGS. 1 and 5, the controller causes the correspondingvalve 345 of the large vacuum chamber 194 to be opened so that a vacuumis created in the internal chamber 135 of the housing 154 of thescanning head. As a result, the probe will be locked onto the seat sothat it is loaded onto the scanning head. Similarly, the probe can beunloaded by the controller by causing the valve to be closed and endingthe vacuum in the internal chamber. Thus, this method of loading andunloading the probe onto and from the scanning head could be usedinstead of the rotary cam assembly 160 described earlier.

Structure of SPM Probe 122-2

Turning now to FIG. 20, there is shown another microstrucured SPM probe122-2 for use in inspecting the object 102 by making SPM measurements.It is constructed in the same manner as the first SPM probe 122-1,except that it has different tips 238 than the tips 138 of the firstprobe.

In particular, in order to be resistant to frictional wear when beingused to make AFM measurements, the tip 238 of each tool 237 of the SPMprobe 122-2 may include and be coated with an obdurate plate 146 at thesharp end of the tip, as shown in FIG. 21. The tapered core material 144of the tip may be shaped to have a flat portion at the sharp end of thetip on which the obdurate plate is formed. As with the first SPM probe122-1, the obdurate plate may comprise diamond, diamond like carbon,silicon carbide, carbon nitride, or some other obdurate material andhave a thickness in the range of approximately 1 Angstroms to 10micrometers. The obdurate plate may be formed similar to the obduratecoating 146 described earlier for the first probe but with somemodifications.

Specifically, the SPM probe 122-1 is formed so that the target surface150 of each tip 138 of the probe on which the obdurate plate 146 isformed is oriented with respect to a particular crystal axis (ordirection) 152 of the core material 144 with a desired orientationangle. Then, the obdurate plate comprises a crystal that comprise theobdurate plate is grown on the target surface of each tip with thecrystal growth (or deposition) vector 154 being oriented with respect tothe crystal axis of the core material with a desired crystal growthangle. Moreover, during crystal growth of the obdurate plate, a desiredbias voltage can be applied to the core material to create an electricalfield. By positioning the target surface in the bias electric fieldand/or a bias magnetic field in different ways about the axis of thecrystal growth vector, different orientations (or alignments) of thegrown crystal on the target surface can be formed, as shown in FIGS. 22and 23. Thus, the orientation and crystal growth angles, the biasvoltage, and the position of the target surface about the axis of thecrystal growth vector, can be selected to produce a tip with an obdurateplate that has a desired crystal orientation on the target surface. And,it may be made conductive in the same way as was described earlier forthe obdurate coating 146 so that it can be used with the STM measurementcircuit 213 to make STM measurements.

For example, in the case where the core material 144 comprises silicon,the target surface 150 of each tip 138 of the probe 122-2 may be formedparallel to (or along) the [100] crystal axis of the silicon corematerial. Then, diamond like carbon could be formed on the targetsurface as the obdurate plate itself or as a seed site for actualdiamond growth.

In the case where the diamond like carbon is used as a seed site, orwhere a seed site is formed by rubbing the tip in diamond as describedearlier, a diamond crystal may be grown at the seed site in the mannerdescribed earlier for the diamond crystals of the obdurate coating 146.However, in this case, a hexagonal shaped diamond crystal is grownnormal to the target surface to form the diamond plate when the crystalgrowth vector is perpendicular to the target surface. Growth offlattened hexagonal diamond crystals is described in Keiji Hirabayashiet al., “Synthesis and Growth of Flattened Diamond Crystals by ChemicalVapor Deposition, Diamond and Related Materials 5 (1996), pp. 48-52.And, referring back to FIGS. 22 and 23, a suitable bias voltage can beapplied to the core material 144 to select the orientation of thediamond crystal on the target surface, as suggested earlier. It may thenbe doped with an impurity, such as boron, or grown with Boron in thegrowth plasma so that it is made conductive.

Similarly, the obdurate plate 146 may be formed with a silicon carbideor carbon nitride crystal that has a desired crystal orientation on thetarget surface 150. In order to do so, the process described earlier forgrowth of silicon carbide and carbon nitride crystals in forming theobdurate coating 146 would be modified. This would be done in the sameway that the earlier described process of growing diamond crystals toform the obdurate coating was modified to grow the diamond crystal thatforms the obdurate plate 146.

The obdurate plate 146 was just described as being a single crystalgrown on the target surface 150 of the core material 144. However, thoseskilled in the art will recognize that the obdurate plate could beformed by one or more crystals that are grown on the target surface. Inthis case, the application of the bias voltage to the core materialwould cause these crystals to be symmetrically aligned.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, Inspection and Modification Operation, and Vacuum Operationof SPM Probe 122-2

Referring back to FIG. 20, unlike the first SPM probe 122-1, the secondSPM probe 122-2 does not include a lens over each tip 238. Thus, thesecond probe is not used to make radiation measurements in the samemanner as the first probe. However, the second probe may be loaded ontoand unloaded from one of the scanning heads 120 in the same ways as weredescribed earlier for the first probe. In addition, the tip 238 of eachtool of the second probe may be activated and deactivated, calibrated,and have its profile examined in the ways described earlier for thefirst probe, except that the positioning of the tip of the second probewould not be calibrated using radiation measurements in the same manneras the first probe. And, the activated tip of each tool of the secondprobe would be used to make SPM measurements and SPM modifications inthe ways described earlier for the first probe, except that, as justmentioned, it would not be used to make radiations measurements in thesame manner as the first probe. Furthermore, optical images would beproduced by the imaging optics 226 in the manner discussed earlierduring operation and/or calibration of the second probe. Finally, duringoperation and/or calibration, a microvacuum chamber in the gap 198between the second probe and the object 102 or calibration structure 128may be established in any of the ways described earlier for the firstprobe using gap sensors 164 in the second probe.

Structure of SPM Probe 122-3

Turning now to FIG. 24, there is shown a third microstrucured SPM probe122-3 for use in making SPM measurements. It is constructed like thefirst and second probes 122-1 and 122-2 except that it has differenttips 242 than the tips 138 and 238 of the first and second probes.

The tip 242 of each SPM tool 239 of the SPM probe 122-3 includes atapered core material 144 and a multiwalled nanotube (i.e.,nanostructured tube) 244. The nanotube may comprise carbon or boronnitride and be formed in the manner described in S. Iijima, Nature(London) 354, 56 (1991) and A. Loiseau et al., “Boron Nitride Nanotubeswith Reduced Number of Layers Synthezised by Arc Discharge”, PhysicalReview Letters, vol. 76, no. 25, (June 1996), pp. 4737-4740, and NasreenG. Chopra et al., “Boron Nitride Nanotubes”, which are hereby explicitlyincorporated by reference. Moreover, in the manner described in HonggjieDai et al., “Nanotubes as Nanoprobes in Scanning Probe Microscopy”,Nature, vol. 334 (November 1996), pp. 147-150, which is also herebyexplicitly incorporated by reference, the nanotube is attached to thecore material for use in making SPM measurements by bonding it to thecore material. And, as described in this reference, the narrow diameter(e.g., 5-20 nanometers) of the nanotube enables it provide sub nanometerresolution. And, its flexibility allows it to bend back into itsoriginal shape and position in case of inadvertent crashes into theobject 102 or one of the calibration structures 128.

Turning to FIG. 25, the tip 242 of each SPM tool 239 includes one ormore crystals of an obdurate coating 246 on the nanotube 244. Since theends of the nanotube 244 are closed when formed, as described in “BoronNitride Nanotubes with Reduced Number of Layers Synthezised by ArcDischarge” just referenced, a crystal of the obdurate material can beformed on the closed surface 248 at the free (or unattached) end of thenanotube. Moreover, crystals of the obdurate material may also be grownat the free end on the side walls 250 of the nanotube. As with theprobes 122-1 and 122-2, the obdurate coating may comprise diamond,silicon carbide, carbon nitride, diamond like carbon, or some othersuitable obdurate material and may be formed in the ways describedearlier. Thus, as shown in FIG. 25, the obdurate coating could comprisea plate on the closed surface 248 and plates on the side walls 252 thatare formed with a desired crystal orientation in the manner describedearlier for the obdurate plate of each tip 238 of the second probe. And,these plates may be made conductive in the same way as was describedearlier for the obdurate coating 146 so that it can be used with the STMmeasurement circuit 123-11 to make STM measurements.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, Inspection and Modification Operation, and Operation of SPMProbe 122-3

Furthermore, referring back to FIG. 24, the third probe may be loadedonto and unloaded from one of the scanning heads 120 in the same ways aswere described earlier for the first and second probes. Moreover, thehollow nanotube 244 may be used to capture light at or near a contactsurface or guide light down it in the same manner as was describedearlier for the SPM probe 122-1 to make radiation measurements. And, thetip of each tool of the third probe may be activated, deactivated,calibrated, and have its profile examined in the ways described earlierfor the first probe, but without optical calibration of the position ofeach tip. Moreover, like the second probe, the activated tip of eachtool of the third probe would be used to make SPM measurements in theways described earlier for the first probe, except that it would not beused to make radiation measurements. Furthermore, optical images wouldbe produced by the imaging optics 226 in the manner discussed earlierduring operation and/or calibration of the third probe. And finally,during operation and/or calibration, a microvacuum chamber in the gap198 between the third probe and the object 102 or calibration structure128 may be established in any of the ways described earlier for thefirst probe with the apertures 132 and the gap sensors 164 of the thirdprobe.

Structure of SPM Probe 122-4

Turning to FIG. 26, there is shown a fourth microstructured SPM probe122-4 for use in making SPM electrical measurements of the object 102.It has a pair of SPM electrical tools 259 for making such electricalmeasurements between two points on the object. Each of the toolsincludes a cantilever 136 and a corresponding conductive tip 238 on thecantilever like those discussed earlier for the first and second SPMprobes 122-1 and 122-2. The tip of each tool may also be constructedlike one of the tips 138 or 242 discussed earlier for the first andthird SPM probes 122-1 and 122-3. In this probe, the cantilever of eachtool is connected to a corresponding positioning system 263 for the toolinstead of being directly connected to the base 130 of the probe. Thebase 130 has the same basic shape and construction as the base discussedfor the first probe 122-1.

The positioning system 263 for each electrical tool 259 of the probe122-4 can position the corresponding cantilever 136, and therefore thecorresponding tip 238, in the X and Y dimensions with respect to theobject 102 or one of the calibration structures 128. A fixed end of thecantilever is connected to a first moveable comb structure 268 of thepositioning system. The cantilever and the first moveable comb structureare moveably suspended by a first suspension system 267 over a secondmoveable comb structure 272 of the positioning system. The firstsuspension system comprises spring arms (or connectors) 266 which eachhave one end connected to the first moveable comb structure or thecantilever and another end connected to the second moveable combstructure. The fingers of the first moveable comb structure areinterdigitized with (i.e., aligned between) the fingers of acorresponding first stationary comb structure 270 of the positioningsystem that is stationary with respect to the first moveable combstructure. This stationary comb structure is formed on a firstinsulating plate 271 that is on the second moveable comb structure. Thefingers of this second moveable comb structure are interdigitized withthe fingers of a corresponding second stationary comb structure 274 ofthe positioning system that is formed on a second insulating plate 276on the base 130 of the probe. The second moveable comb structure ismoveably suspended by a second suspension system 279 over the base. Thesecond suspension system comprises spring arms 278 that each have oneend connected to the second moveable comb structure and another endconnected to the base.

The base 130, the moveable comb structures 268 and 270, and the springarms 266 and 278 may be integrally formed together and comprise asemiconductor material, such as polysilicon, that is conductive.Similarly, the stationary comb structures may also comprise such asemiconductor material. And, the insulating plates 271 and 276 maycomprise an insulating material, such as silicon dioxide.

The two moveable comb structures 268 and 272 of the positioning system263 of each electrical tool 259 of the probe 122-4 are respectivelymoveable in the X and Y dimensions to enable the tool to be positionedin the X and Y dimensions. Specifically, each pair of correspondingmoveable and stationary comb structures forms an electrostatic (i.e.,capacitive) comb drive of the type described earlier for the nanoforcebalance 128-3. Thus, by applying a differential voltage across them,their comb fingers interact electrostatically (i.e., capacitively) witheach other and the moveable comb structure moves linearly with respectto the stationary comb structure. Thus, since one end of the cantilever260 of each tool is connected to the moveable comb structure 268, thecantilever may be moved so as to position the tip 262.

SPM Inspections with SPM Probe 122-4

The components of the SPM system 100 also include a measurement controlcircuit 265. The controller 114 can control the measurement controlcircuit to cause the positioning systems 263 of the electrical tools 259of the probe 122-4 to position the tips 262 of the tools in the mannerdescribed earlier so that they are positioned at different scan pointson the object 102 or calibration structure 128. Then, the controller cancause the measurement control circuit to make an SPM electricalmeasurement between these two points by applying a suitable voltageacross the conductive tips 262. The measurement control circuit thenprovides the controller with an electrical measurement signal thatrepresents the electrical measurement. These electrical measurements maythen be used by the controller to generate an electrical analysis forperforming a test, repair, and/or fabrication step of the object in themanner described earlier.

In fact, the-SPM probe 122-4 is particularly useful in testing,repairing, and/or performing fabrication steps on a semiconductor wafer.In particular, where an integrated circuit is being fabricated on thewafer, the SPM probe 122-4 may be used to analyze the electricalproperties of the circuit when performing a test, repair, or fabricationstep of the integrated circuit.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, and Operation of SPM Probe 122-4

The fourth SPM probe 122-4 may be loaded onto and unloaded from one ofthe scanning heads 120 in the same ways as were described earlier forthe first SPM probe 122-1, except that it would be loaded from one ofthe horizontal probe suppliers 125. The tip of each electrical tool 259of the fourth probe may be calibrated and have its profile examined inthe ways described earlier for the first probe, but without opticalcalibration of the positioning of each tip. Furthermore, optical imageswould be produced by the imaging optics 226 during operation and/orcalibration of the fourth probe in the manner discussed earlier for thefirst probe. And finally, like the first SPM probe 122-1, the fourthprobe has an aperture 132 and gap sensors 164 and may be operated and/orcalibrated in a microvacuum chamber in the gap 198 between the fourthprobe and the object 102 or calibration structure 128 in the same way aswas described for the first probe.

Structure of SPM probe 122-5

Referring now to FIG. 27, there is shown a fifth microstructured SPMprobe 122-5 for modifying the object 102 by making cuts in its material.It is constructed like the first to third SPM probes 122-1 to 122-3except for several differences. First, it has different tips 320 thanthe tips 138, 238, and 242 of the first to third probes. Second, it doesnot have a lens 147 and a lens support 149 over each tip. Third, it hasa particle removal structure 342 that is used to remove particles fromthe object.

Referring to FIGS. 28 and 29, similar to each tip 238 of the second SPMprobe 122-2, the tip 320 of each cutting tool 322 of the SPM probe 122-5includes and is coated with an obdurate plate 146 at the sharp end ofthe tip along a tapered side of the core material 144 of the tip. Thismakes the tip resistant to frictional wear when being used to make cutsin the object 102. As with obdurate plate of each tip of the secondprobe, the obdurate plate of each tip of the fifth probe may comprisediamond, diamond like carbon, silicon carbide, carbon nitride, boronnitride or some other obdurate material and have a thickness in therange of approximately 1 Angstroms to 100 micrometers.

Furthermore, the tip 320 of each cutting tool 322 of the fifth SPM probe122-5 is formed in a similar manner to that described earlier for thetip 238 of each SPM tool 237 of the second SPM probe 122-2 but with somemodifications. Specifically, in constructing each cutting tool of thefifth probe, the target surface 150 for forming the obdurate plate 146is formed so as to be oriented with respect to a particular crystal axis(or direction) 152 of the core material 144 with a desired orientationangle and with respect to the lower surface 151 of the cantilever with adesired cutting angle. Then, one or more crystals that comprise theobdurate plate are grown on the target surface of each tip in the mannerdiscussed earlier for the second probe. Thus, by selecting theorientation, cutting, and crystal growth angles, the bias voltage, andthe position of the target surface about the axis of the crystal growthvector 154, a tip with an obdurate plate having a desired cutting angleand a desired orientation of its crystal(s) can be produced. Then, thecore material at each tip's sharp end may be etched away so that desirededges of the crystal(s) at the sharp end are exposed to form the cuttingedges 149.

For example, in the case where the core material 144 is silicon, thetarget surface 150 of each tip 320 of the cuffing probe 122-5 may beparallel to the [100] crystal axis of the silicon core material. Then,one or more crystals that comprise the obdurate plate are grown on thetarget surface of each tip with the crystal growth vector 154perpendicular to the crystal axis of the core material. During crystalgrowth of the obdurate plate, a desired bias voltage can be applied tothe core material to create an electrical field. By positioning thetarget surface in the electric field in different ways about the axis ofthe crystal growth vector, different crystal orientations of theobdurate plate can be formed on the target surface. In the case wheremultiple crystals are grown, they will all be symmetrically oriented onthe target surface, as shown in FIGS. 30 and 31.

Furthermore, as with the first to third SPM probes 122-1 to 122-3, thefifth SPM probe 122-5 has multiple cutting tools 322. Thus, referring toFIGS. 28 and 29, the cutting tools may have tips 320 with differentcutting angles and different crystal orientations from each other whichare formed in the manner just discussed. As a result, these cuttingtools can be used for performing different types of cuts in the object102.

Alternatively, rather than forming an obdurate plate 146 on a corematerial 144 to form each cutting tool 322 of the cutting probe 122-5 asjust described, the core material 144 of each cutting tool may in factcomprise diamond, silicon carbide, carbon nitride, boron nitride, orsome other suitable obdurate material. Referring to FIG. 32, in order todo so, a mold 159 is used that comprises a semiconductor material, suchas silicon. The obdurate material is then grown on the mold with athickness sufficient to produce the cantilever 136 and tip 320 of thecutting tool. Then, the mold is etched away so as to leave the cuttingtool, as shown in FIG. 33. As shown in FIG. 34, a material 161, such aspolysilicon or tungsten, can be optionally deposited on top of theobdurate material to provide a reflective surface and mechanicallystrengthen the cantilever. Then, referring back to FIG. 27, the base 130of the cutting probe is formed on and around each such cutting tool toproduce the entire fifth SPM probe 122-5.

In another example, each tip 320 may be tetrahedronally shaped in themanner shown in FIGS. 82 and 83. Such a tip has three exposed surfaces800, 801, and 802. Two of these surfaces meet at right angles at thebase of the tip (i.e., where the tip is connected to the cantilever 136)to form a right angle corner 804 of the tip. For each of these twosurfaces, the external angle 806 (i.e., external to the tip) formedbetween it and the lower surface 807 of the cantilever or the XY planeof motion of the cantilever is less than or equal to 90°. Conversely,the internal angle 808 (i.e., internal to the tip) formed between thissurface and the lower surface of the cantilever and or the XY plane ofmotion is greater than or equal to 90°.

Here, each of the exposed surfaces 800 to 801 may be coated with anobdurate coating or plate 146 as described earlier for SPM probes 122-1,122-2, and 122-5 or the entire tip 320 or cutting tool 322 may be formedof an obdurate material 146 as just described. As a result, the sharpend 810 of each tip may be used to make cuts in the object 102 so as toform a ledge in the object or cut below specific material of the objectso as to remove other material below it but not remove this specificmaterial.

Furthermore, as indicated earlier, the SPM probe 122-5 has multiplecutting tools 322. Thus, each tip 320 of the cutting tools 322 may havea different orientation on its corresponding cantilever 136 than any ofthe other tips. For example, as shown in FIG. 82, the SPM probe may havefour cutting tools. In this case, the right angle corner 804 and sharpend 810 of each tip is rotated 90°, 180°, and 270° from the right anglecorners and sharp ends of the other tips. As a result, these tips couldbe used to cut any material of the object 102 to leave a sharp corner atthe ends of any cut series having common points.

Alternatively, the fine positioning system 104 of each scanning head 120may be configured to rotate the scanning head. Thus, the controller 114could cause the fine position system to rotate the scanning head so thata single tip 320 of the SPM probe 122-5 could be rotated so as toperform this same cut series without changing tips. Similarly, the roughpositioning system 104 could be configured to rotate. Thus, under thecontrol of the controller the object could be rotated by the roughpositioning system so that a single tip 320 of the SPM probe 122-5 couldperform this same cut series.

Those skilled in the art will recognize that this embodiment of tip 320may be used to make AFM measurements in the manner described earlier forSPM probe 122-1. In fact, this embodiment is particularly useful formaking AFM measurements of material below a ledge or overhang of theobject 102 after the tip was used to perform the cut that created theledge or overhang. Furthermore, those skilled in the art will recognizethat similar shapes, such as pyramidal shapes, may be used for thisembodiment as well.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, and Vacuum Operation of SPM Probe 122-5

Referring to FIG. 35, the fifth SPM probe 122-5 may be loaded onto andunloaded from one of the scanning heads 120 in the same ways as weredescribed earlier for the first SPM probe 122-1. In addition, the tip320 of each cutting tool 322 of the fifth probe may be activated anddeactivated, calibrated, and have its profile examined in the waysdescribed earlier for the first probe, except that the positioning ofthe tip of the fifth probe would not be optically calibrated.Furthermore, optical images would be produced by the imaging optics 226during operation and/or calibration of the fifth probe in the mannerdiscussed earlier for the first probe. Finally, during operation and/orcalibration, a microvacuum chamber in the gap 198 between the fifthprobe and the object 102 or calibration structure 128 may be establishedin any of the ways described earlier for the first probe with theapertures 132 and the gap sensors 164 of the fifth probe.

SPM Modifications With SPM Probe 122-5

Referring again to FIG. 1, as mentioned earlier, the SPM probe 122-5 maybe used to modify the object 102. This is done by performing a cut inthe material of the object to remove material from the object. This isdone when the user instructs the controller 114 with the user interface116 to use the cutting probe to perform this operation. Referring toFIG. 35, in the manner described earlier, the controller controlsloading of the cutting probe onto the scanning head 120 and theactivation of the tip 320 of one of the cutting tools 322 of the probe.Then, the controller controls the positioning system 103 to lower theactivated tip onto the target area of the object such that the activatedtip pushes down on a target area of the object with sufficient force tomake a desired cut in the material of the object when the tip is draggedacross it. Then, the controller causes the positioning system to dragthe tip in this way and make the desired cut. The controller then causesthe positioning system to raise the tip from the cut or return it to thebeginning of cut stroke without lowering it into the material.

As mentioned earlier, the fifth SPM probe 122-5 may have multiplecutting tools 322 with tips 320 with different cutting angles andcrystal orientations. In this case, the controller 114 selects thecutting tool with the appropriate cutting angle and crystal orientationto perform the desired cut.

Moreover, the amount of force with which the activated tip 320 of theSPM probe 122-5 pushes down on the target area may be selected andselectively adjusted. Referring back to FIG. 35, the controller 114causes the tip activation circuit 175 to control the tip actuator 174 inorder to do this. Specifically, the tip activation circuit causes achange in the dimension of the adjustment transducer 173 so that itpushes or pulls against the end of the lever arm 170 to which it isfixed. In response, the lever arm is moved over the pivot 171 so thatthe pivot point of the lever arm (about which the lever arm pivots onthe pivot) will change. This changes the point at which the rounded endof the lever arm contacts the cantilever 136 on which is located theactivated tip. Since this contact point is also a pivot point for thedeflection of the cantilever, the amount of force imparted on the targetarea depends on the location of this contact point. In this way, theamount of force imparted by the activated tip can be selected andselectively adjusted.

Moreover, the activated tip 320 the fifth SPM probe 122-5 can becalibrated using the force balance 128-3 in the manner described earlierfor the first SPM probe 122-1. Thus, by using the force calibrationtable created for the tip during this calibration, a precise known forcecan be applied to the object 102 by the tip. As a result, a precise cutin the material of the object can be made to remove material from theobject.

As was alluded to earlier, the first and second SPM probes 122-1 and122-2 may also be used to make modifications to the material of theobject 102. In particular, the first and second probes would be used tomake cuts in and for deform the material of the object. The cuts wouldbe done in the same manner as was just described with a precise forceapplied to the material of the object while dragging the activated tips136 and 238 of the first and second probes across the material of theobject. Deformations would be similarly done by lowering the tips of thefirst and second probes onto, but not dragging across, the material ofthe object.

This is particularly useful in repairing and/or performing fabricationsteps on a semiconductor wafer or fabrication mask. In particular, whenexcess material is on the wafer or mask, the SPM probes 122-1, 122-2,and 122-5 may be used to perform a precise cut to remove or etch awaythis material.

Moreover, this is also useful in performing precision repairs and/orfabrication steps of a magnetic microstructure. Specifically, a gapbetween magnetic elements of the magnetic microstructure can beprecisely created and/or repaired by using the SPM probes 122-1, 122-2,and 122-5 to perform a precise cut in the magnetic material between themagnetic elements. This is particularly applicable to creating orrepairing the gap between the write and read poles of the thin filmmagnetic material of a thin film magnetic read/write head.

Inspections With SPM Probe 122-5

Referring again to FIG. 27, the SPM probe 122-5 could also be used toinspect the object 102 by making SPM measurements of the object. Thisparticularly true for the case when each cutting tool 322 of the probeis of the embodiment shown in FIGS. 32 to 34. As a result, AFMmeasurements could be made from the deflection of the cantilever 136 asthe tip 320 is scanned over the surface 166 of the object in the mannerdiscussed earlier for the first to third SPM probes 122-1 to 122-3.Furthermore, the obdurate material 146 could be made conductive in themanner discussed earlier for the first to third probes to make the tipof the fifth probe conductive. As a result, STM measurements could bemade using this conductive tip in the manner discussed earlier for thefirst to third probes.

Particle Removal Structure

As mentioned earlier, the fifth SPM probe 122-5 includes a particleremoval structure 342, as shown in FIGS. 27 and 35. As will be describedshortly, the particle removal structure is used to remove particles fromthe object 102 or calibration structure 128 during operation and/orcalibration of the probe. These particles may be contaminant particlesfrom external sources or debris particles of particulate materialremoved from the object when cuts are made in the object with the tips320 of the probe.

Referring to FIG. 1, in order to remove such particles, the fluid system344 is used. As shown in FIG. 35, a flexible tube 346 for each scanninghead is connected to a corresponding connector tube 347 of the scanninghead.

The particle removal structure 342 includes an inlet (i.e., input port)337 on the upper surface 140 of the fifth SPM probe 122-5, a duct 340formed in the base 130 of the probe, and an outer annular outlet (i.e.,output port) 336 on the lower surface 142 of the probe, as shown in FIG.35. The duct connects the inlet and the outer annular outlet so thatthey are in fluid communication with each other. As shown in FIG. 86,the surface 142 of the base of the SPM probe 122-5 has steps 830 in it.

Referring now to FIGS. 1, 27, and 35, a corresponding connector tube 347is connected to the inlet 337. Thus, when the controller 114 controlsthe corresponding valve 346 of the fluid system 344 to open, a gassource of the fluid system is in fluid communication with the inlet toprovide it with a high pressure low viscosity gas, such as air, argon,helium, or other suitable gas. The gas travels through the duct 340 andexits at the outer annular outlet 336.

Similarly, as shown in FIG. 35, the particle removal structure 342includes an inlet 330 on the upper surface 140 of the fifth SPM probe122-5, a duct 341 formed in the base 130 of the probe, and an innerannular outlet 335 on the lower surface 142 of the probe. The ductconnects the inlet and the annular inner outlet so that they are influid communication with each other.

Turning now to FIGS. 1, 27, 35, and 86 a corresponding connector tube347 is connected to the inlet 330. Thus, when the controller 114controls the corresponding valve 346 of the fluid system 344 to open, agas source of the fluid system is in fluid communication with the inletto provide it with a low pressure high viscosity gas, such as carbondioxide. The gas travels through the duct 341 and exits at the innerannular outlet 335.

The inner annular outlet 335 is at a step 832 lower than the step 830 atwhich the aperture opens out at. The low viscosity gas serves as seal toprevent the high viscosity gas discussed from entering the microvacuumchamber created in the gap between the step 831 and the surface 166 ofthe object 102. This microvacuum chamber is created in the mannerdiscussed earlier for SPM probe 122-1. Moreover, a differential pressurechamber is created in the gap between the step 830 and the surface ofthe object. This is created in the same way as the microvacuum chamberjust mentioned except that the high viscosity gas is introduced ratherthan a vacuum.

Additionally, the particle removal structure 342 includes an outlet 331on the upper surface 140 of the fifth SPM probe 122-5, a duct 339 formedin the base 130 of the probe, and a middle annular inlet 337 on thelower surface 142 of the probe, as shown in FIG. 35. The duct connectsthe outlet and the annular middle inlet so that they are in fluidcommunication with each other.

Referring again to FIGS. 1, 27, and 35, the outlet 331 of the particleremoval structure 342 is connected to a corresponding connector tube347. When the controller 114 controls the corresponding valve 346 of thefluid system 344 to open, a low pressure gas sink of the fluid system isin fluid communication with this outlet to draw the low pressure highviscosity and high pressure low viscosity gases in through the middleannular inlet 332 and the duct 339.

Specifically, the low pressure gas sink causes a high rate flow of thehigh pressure low viscosity gas from the outer annular outlet to theannular middle inlet. As a result, particles are swept up and removedfrom the upper surface 166 of the object 102 or calibration structure128 by this high rate flow. Moreover, in order to increase the flow ofthe high viscosity gas, the step 832 is provided and is lower than thesteps 831 and 830. This makes the gap 198 wider in this area so that thehigh viscosity gas can flow easier. An additional step could have beenused for the middle annular inlet 337 to further increase the flow.

Furthermore, the low pressure gas sink causes a low rate of flow of thelow pressure high viscosity gas from the inner annular outlet 335 to themiddle annular inlet. As indicated earlier, this low rate flow acts as abuffer for the microvacuum chamber created in the gap 198 and preventsthe high pressure low viscosity gas and the particles that it carries toenter this microvacuum chamber. Moreover, since the inner annular outletis at a step 831 higher than the middle annular inlet 337, the flow ofthe high viscosity gas into the middle annular inlet is increased. Andfinally, the inner annular outlet 335 can serve as a gas bearingstructure which operates like that of the gas bearing structure 402discussed later.

In this way, the controller 114 can control the removal of particlesfrom the upper surface 166 of the object 102 or calibration structure128. This is done by selectively causing the valves 346 of the fluidsystem 344 to be opened during operation and/or calibration of the fifthSPM probe 122-5.

The particle removal structure 342 just described is particularly usefulfor performing repairs and/or fabrication steps on semiconductor wafersand fabrication masks and thin film magnetic microstructure. In thisway, any particles that can potentially damage or effect the performanceof the wafer, mask, or magnetic microstructure can be easily removedfrom its surface during a repair and/or fabrication step.

Finally, the particle removal structure 342 is particularly useful forperforming repairs and/or fabrication steps in which material is removedfrom an object 102 when cuts are made with the fifth SPM probe 122-5.However, it can also be used when the fifth probe is simply used to makeSPM measurements in the manner described earlier. Thus, those skilled inthe art will recognize that the first to fourth SPM probes 122-1 to122-4 described earlier may also be constructed with such a particleremoval structure for removal of particles while making SPM measurementsand/or SPM modifications.

Particle Removal With Sweeping Motion of SPM Probe 122-5

In addition, the SPM probe 122-5 may be used to sweep or collect debrisparticles resulting from a modification made with the probe to an areaof the object 102 where they have no deleterious effect. Namely, theyare swept to an area of the object where they do not obstruct inspectionof the modification just made or further modification of the object inthe area where the original modification was just made or in anotherarea. Moreover, the collected debris particles may then be removed by aseparate process, such as etching, or fixed in place by an adhesive orthermal fixing.

More specifically, after a modification is made with the SPM probe122-5, the controller 114 controls the positioning system 103 so thatsweeping motions of the SPM probe are made over the object 102. In doingso, the controller first controls the positioning system to position thetip 320 of the probe in the Z dimension so that it is just above or justcontacts the surface 166 of the object while the sweeping motions aremade. Then, the controller controls the positioning system so that thesweeping motions are made to remove the debris particles from the areawhere the modification was made. These motions include motions whichfollow a complex surface previously scanned or a surface calculated tobe the result of the previous material removal activity. As discussedlater, these sweeping motions can be made in 2-D (two dimensional) or3-D (three dimensional).

The debris particles may be swept to an area where they will notobstruct further modifications to the object or inspection of themodification just made. These other modifications may be to themodification just made or in another area of the object. Moreover, theymay be made using any of the SPM probes 122-1 to 122-18 in the mannerdiscussed herein. Additionally, the inspections may be made with theother components 123 of the SPM system 100 separately or in conjunctionwith any of the SPM probes 122-1 to 122-18 also in the manner describedherein.

The collected debris particles may be fixed to the object in an areawhere they will not affect the performance of the object as it is to benormally used. For example, the object 102 may be a semiconductormanufacturing mask. In this case, the SPM probe 122-5 may be used toperform a cut in some of the material of the mask, such as chrome. Theresulting debris particles could then be swept to an area of the maskwhere the material can be fixed to the mask and not effect itsperformance when it is used in its normal environment. This may be donein several ways. For example, the other components 123 of the SPM systemmay include an adhesive mist source which sprays an adhesive mist ontothe mask under the direction of the controller 114. The collected debrisparticles would then be adhesively fixed together on the mask.Alternatively, the other components of the SPM system may include alaser source that would under the control of the controller provide alaser beam to heat the collected debris particles. These debrisparticles would then be fused together on the mask. This may also bedone by heating the debris particles with the SPM probe 122-18 describedlater.

Furthermore, the debris particles may be removed from the object 102. Inthis case, the resulting debris particles would also be swept to an areaof the mask where the material will not effect its performance when itis used in its normal environment. Then, the debris particles may beremoved from this area. For example, in the case of a semiconductormanufacturing mask, the other components 123 of the SPM system 100 mayinclude an acid bath station. The controller 114 would then control theobject loader 115 described earlier to place the mask in the acid bathprovided by the acid bath station. The concentration of the acid bathwould be selected so that the acid bath dissolves the small debrisparticles but does not appreciably dissolve away the larger materials ofthe object. For example, the debris particles may be removed from chromematerial on the mask. The acid bath would dissolve the small chromedebris particles away but would not appreciably dissolve the main chromematerial of the mask.

As those skilled in the art will recognize, this sweeping technique maybe used for any of the SPM probes 122-1 to 122-18 described herein.

Structure of SPM Probe 122-6

Referring now to FIGS. 36 and 37, there is shown a sixth microstructuredSPM probe 122-6 for modifying the object 102 by making cuts in itsmaterial. The sixth probe includes several cutting tools 350. As withthe fifth SPM probe 122-5, each cutting tool has a correspondingcantilever 136 and a corresponding tip 322 on one end of the cantilever.Alternatively, the tip may be one of the tips 138 and 238 of the firstand second SPM probes 122-1 and 122-2. Furthermore, the base 130 and theparticle removal structure 342 of the sixth probe are respectivelyconstructed in the same manner as was described for the first and fifthprobes.

However, the cantilever 136 of each cutting tool 350 is connected to acorresponding positioning system 352 for the tool instead of beingdirectly connected to the base 130 of the probe. The positioning systemfor each cutting tool can position the corresponding cantilever, andtherefore the corresponding tip 320, in one dimension with respect tothe object 102 or one of the calibration structures 128. A fixed end ofthe cantilever is connected to a moveable comb structure 354 of thepositioning system. The cantilever and the moveable comb structure aremoveably suspended by a suspension system 356 under a stationary upperplate electrode 370. The suspension system comprises spring arms (orconnectors) 360 that each have one end connected to the base 130. Theother end of one of the spring arms is connected to the moveable combstructure or the fixed end of the cantilever and the other end of theother spring arm is connected to the free end of the cantilever. Thefingers of the moveable comb structure are interdigitized with (i.e.,aligned between) the fingers of a corresponding stationary combstructure 355. This stationary comb structure is formed on an insulatingplate 371 and is therefore connected to the base via the insulatingplate.

The moveable comb structure 354 of the positioning system 352 of eachcutting tool 350 of the probe 122-6 is moveable in one dimension toenable the tool to be positioned in that dimension. The components ofthe SPM system 100 include a cutting control circuit 351 to do this.Specifically, the pair of corresponding moveable and stationary combstructures 354 and 355 of the cutting tool forms an electrostatic (i.e.,capacitive) comb drive of the type described earlier for the nanoforcebalance 128-3. Thus, when the cutting control circuit applies adifferential voltage across the moveable and stationary comb structures,their comb fingers interact electrostatically (i.e., capacitively) witheach other and the moveable comb structure moves linearly with respectto the stationary comb structure. Since one end of the cantilever 136 ofeach tool is connected to the moveable comb structure, the cantilevermay be moved so as to position the tip 320.

Furthermore, each cutting tool 350 of the sixth SPM probe 122-6 has atip deactuator 366 for removing the tip 320 from the object after a cutis made with the cutting tool. The tip deactuator includes an insulatingplate 368 on a support platform 362 of the base 130, the upper plateelectrode 370 on the insulating plate, and a moveable plate electrode367. The support platform is suspended in a corresponding aperture 132by corresponding bridges 364 of the base. In this embodiment, thecantilever comprises a conductive material, such as polysilicon which ismade to be conductive, so that the cantilever actually comprises themoveable plate electrode. Alternatively, the tip deactuator may includean insulating plate formed on the cantilever with the moveable plateelectrode being formed on the insulating plate. In either case, themoveable plate electrode and the upper plate electrode form a capacitor.Thus, when the cutting control circuit 351 applies an appropriatevoltage is applied between the moveable plate electrode and the upperelectrode plate, the cantilever can be electrostatically (i.e.,capacitively) pulled toward the electrode plate.

The base 130, the moveable comb structure 354, the cantilever 136 andthe spring arms 360 of each cutting tool 350 may be integrally formedtogether and comprise a semiconductor material, such as polysilicon,that is conductive. In this way, the moveable comb structure and thecantilever (i.e., the moveable plate electrode 367 ) may be electricallyconnected together for convenience. Similarly, the stationary combstructure 355 may also comprise such a semiconductor material. The plateelectrodes may comprise a conductive material, such as polysilicon ortungsten. And, the insulating plates 371 and 368 may comprise aninsulating material, such as silicon dioxide.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, Vacuum Operation, and Particle Removal Operation of SPMProbe 122-6

The sixth SPM probe 122-6 may be loaded onto and unloaded from one ofthe scanning heads 120 in the same ways as were described earlier forthe first probe. In addition, the tip 320 of each cutting tool 322 ofthe sixth probe may have its position calibrated and its profileexamined in the ways described earlier for the first probe, except thatthe positioning of the tip of the sixth probe would not be opticallycalibrated. Furthermore, optical images would be produced duringoperation and/or calibration of the sixth probe by the imaging optics226 in the manner discussed earlier for the first probe. Duringoperation and/or calibration, a microvacuum chamber in the gap 198between the sixth probe and the object 102 or calibration structure 128may be established in any of the ways described earlier for the firstprobe with the apertures 132 and the gap sensors 164 of the sixth probe.Finally, particles can be removed during operation and/or calibrationusing the particle removal structure 342 of the sixth probe in themanner described earlier for the fifth SPM probe 122-5.

SPM Modifications with SPM Probe 122-6

Referring again to FIG. 1, the SPM probe 122-6 may be used to modify theobject 102 by making a cut in the object to remove material from theobject. This is done when the user instructs the controller 114 with theuser interface 116 to use the probe to perform this operation. Thecontroller controls loading of the probe onto the scanning head 120.Then, the controller controls the positioning system 103 to lower theactivated tip onto the target area of the object such that the activatedtip pushes down on the target area with sufficient force to make adesired cut in the material of the object when the tip is dragged acrossit. Then, referring to FIG. 36, the controller controls the cuttingcontrol circuit 351 to cause the positioning system 352 of the cuttingtool to move the tip in the manner described earlier so that it isdragged across the object to make the desired cut. The controller thencontrols the cutting control circuit to cause the tip deactuator 366 ofthe cutting tool to raise the tip from the cut in the manner describedearlier.

Moreover, the activated tip 320 of the SPM probe 122-6 may be calibratedfor the amount of force with which it pushes down on the object 102 inperforming a cut using the force balance 128-3 in the manner describedearlier for the first SPM probe 122-1. Thus, by using the forcecalibration table created for the tip during this calibration, a preciseknown force can be applied to the object 102 by the tip. As a result, aprecise cut in the material of the object can be made to remove materialfrom the object.

As with the fifth SPM probe 122-5, the sixth SPM probe 122-6 may havemultiple cutting tools 350 with tips 320 with different cutting anglesand crystal orientations. In this case, the controller 114 selects thecutting tool with the appropriate cutting angle and crystal orientationto perform the desired cut. And, like the fifth SPM probe 122-5, thesixth SPM probe 122-6 is particularly useful in repairing and/orperforming fabrication steps on a semiconductor wafer or fabricationmask or a magnetic microstructure.

Structure of SPM Probe 122-7

Referring now to FIGS. 38 and 39, there is shown a seventhmicrostructured SPM probe 122-7 for modifying the object 102 by millingthe material of the object. The seventh probe includes a rotary millingtool 372. The milling tool has a tip 320 like that of each of thecutting tools 350 of the fifth SPM probe 122-5. Alternatively, the tipmay be one of the tips 138 and 238 of the first and second SPM probes122-1 and 122-2. Furthermore, the base 130 and the particle removalstructure 342 of the seventh probe are respectively constructed in thesame manner as was described for the first and fifth probes.

However, unlike the cutting tools 350 of the fifth SPM probe 122-5, themilling tool 372 has a milling platform 374. The tip 320 of the millingtool is centrally located on the milling platform. The milling platformis connected to a rotary movement system 376 of the milling tool.

The milling platform 376 has support arms 377 that extend in opposingdirections (e.g., +Y and −Y) in the same dimension (e.g., Y). The rotarymovement system 376 comprises two moveable comb structures 378 connectedto each support arm of the milling platform. The milling platform andthe moveable comb structures are moveably suspended by a suspensionsystem 380 over a stationary upper plate electrode 370 on the base 130.The suspension system comprises spring arms (or connectors) 379 whicheach have one end connected to the milling platform and another endconnected to the base 130.

Each of the moveable comb structures 378 has a set of curved fingersthat extend out from the corresponding support arm 377 in two directions(e.g., +X or −X and −Y or +Y). For each moveable comb structure, therotary movement system 376 has a corresponding stationary comb structure381 with curved fingers that extend in the opposite directions (e.g., −Xor +X and +Y or −Y). Each set of curved fingers of each moveable combstructure is interdigitized with (i.e., aligned between) the curvedfingers of the corresponding stationary comb structure. The stationarycomb structures are formed on insulating plates 386 and are thereforeconnected to the base via the insulating plates.

Each of the moveable comb structures 378 of the rotary movement system376 is moveable in an arc to enable the milling platform 376 to berotated. Specifically, each stationary comb structure 381 and thecorresponding moveable comb structure 378 forms an electrostatic (i.e.,capacitive) comb drive of the type described earlier for the nanoforcebalance 128-3. Thus, by applying a differential voltage across this pairof corresponding moveable and stationary comb structures, their combfingers interact electrostatically (i.e., capacitively) with each otherand the moveable comb structure moves in one direction (e.g., clockwiseor counter clockwise) in an arc with respect to the stationary combstructure.

Since the moveable comb structures 378 are connected to the support arms377 of the milling platform 372, the milling platform may be rotated inthis manner to perform milling operations with the tip 320 of themilling tool. In order to do so, the components of the SPM system 100further include a milling control circuit 377. The controller 114 causesthe milling control circuit to alternatingly apply voltages to the pairsof corresponding moveable and stationary comb structures that cause themilling platform to rotate in the counter clockwise direction andvoltages to the pairs of corresponding moveable and stationary combstructures that cause the milling platform to rotate in the clockwisedirection. As a result, the milling platform oscillatingly rotates backand forth in the clockwise and counter clockwise directions.

In an alternative embodiment, the milling tool 372 could include morethan two moveable comb structures 378. In this case, the moveable combstructures would be disposed equidistant from one another around themilling platform 376.

Furthermore, the milling tool 372 has a tip deactuator 366 for removingthe tip 320 from the object after a milling operation is performed. Thetip deactuator is constructed and operates like the one describedearlier for the each cutting tool 350 of the sixth SPM probe 122-6,except that the milling platform 376 comprises the moveable plateelectrode 367. In an alternative embodiment, the tip deactuator mayinclude an insulating plate formed on the milling platform with themoveable plate electrode being formed on the insulating plate.

The base 130, the milling platform 372, the moveable comb structures378, and the spring arms 379 may be integrally formed together andcomprise a semiconductor material, such as polysilicon, that isconductive. In this way, the moveable comb structures and the millingplatform (i.e., the moveable plate electrode 367 ) may all beelectrically connected together for convenience. Furthermore, thestationary comb structures 384 may also comprise such a semiconductormaterial. The upper plate electrode 370 may comprise a conductivematerial, such as polysilicon or tungsten. And, the insulating plates368 and 386 may comprise an insulating material, such as silicondioxide.

Probe Loading and Unloading, Calibration, Vacuum Operation, and ParticleRemoval Operation of SPM Probe 122-7

The seventh SPM probe 122-7 may be loaded onto and unloaded from one ofthe scanning heads 120 in the same ways as were described earlier forthe first probe. In addition, the tip 320 of the milling tool of theseventh probe may have its position calibrated and its profile examinedin the ways described earlier for the first probe, except that thepositioning of the tip of the seventh probe would not be opticallycalibrated. Furthermore, optical images would be produced by the imagingoptics 226 during operation and/or calibration of the seventh probe inthe manner discussed earlier for the first probe. During operationand/or calibration, a microvacuum chamber in the gap 198 between theseventh probe and the object 102 or calibration structure 128 may beestablished in any of the ways described earlier for the first probewith the aperture 132 and the gap sensors 164 of the seventh probe.Finally, particles can be removed during operation and/or calibrationusing the particle removal structure 342 of the seventh probe in themanner described earlier for the fifth SPM probe 122-5.

SPM Modifications With SPM Probe 122-7

Referring again to FIG. 1, the seventh SPM probe 122-7 may be used tomodify the object 102 by performing milling operations on the object toremove material from the object. This is done when the user instructsthe controller 114 with the user interface 116 to use the probe toperform this operation. The controller controls loading of the probeonto the scanning head 120. Then, the controller controls thepositioning system 103 to lower the activated tip onto the target areaof the object such that the activated tip pushes down on the target areawith sufficient force to perform the desired milling operation in thematerial of the object when the tip is rotated back and forth. Then,referring to FIG. 38, the controller controls the milling controlcircuit 377 to cause the rotary movement system 376 of the milling probeto oscillatingly rotate the milling platform back and forth (i.e.,clockwise and counter clockwise) in the manner described earlier so thatthe tip is rotated back and forth and performs the desired millingoperation. The controller then controls the milling control circuit tocause the tip deactuator 366 of the milling tool to raise the tip fromthe milled material of the object in the manner described earlier.

Moreover, the activated tip 320 of the SPM probe 122-6 may be calibratedfor the amount of force with which it pushes down on the object 102 inperforming a cut using the force balance 128-3 in the manner describedearlier for the first SPM probe 122-1. Thus, by using the forcecalibration table created for the tip during this calibration, a preciseknown force can be applied to the object 102 by the tip. As a result, aprecise cut in the material of the object can be made to remove materialfrom the object.

Structure of SPM Probe 122-8

Turning now to FIG. 40, there is shown an eighth SPM probe 122-8 for usein making SPM measurements of the object 102 and/or SPM modifications ofthe object 102. In this case, the SPM measurements and the SPMmodifications are made in response to radiation in the form of chargedparticles that are produced by the probe and directed at the object.

More specifically, the eighth SPM probe 122-8 has an e-beam tool 382 forgenerating an e-beam used in making the SPM measurements and the SPMmodifications. The tool is suspended in the aperture 132 of the base 130of the probe within the inner perimeter surface 134 so that the tool isbetween the lower and upper surfaces 142 and 140 of the base to preventit from being damaged. Otherwise, the base has the same basic shape andconstruction as the base discussed for the first probe 122-1.

Referring to FIG. 41, the e-beam tool 382 includes a support platform386 that is suspended in the aperture by the bridges 384 of the tool.The bridges connect the support platform to the inner perimeter surface134 of the base 130 of the SPM probe 122-8. The support platform and thebridges may be separately formed or may be an integral portion of thebase. A tip 388 is formed on the support platform and is constructed soas to emit an e-beam.

For example, the tip 388 may be made to be a field emissively conductiveso that it can emit an e-beam. Thus, it may have a field emissiveconductive coating 390 formed over the tip's core material 144. Thiscoating may comprise conductive diamond, silicon carbide, carbonnitride, diamond like carbon, or other suitable conductive material andmay be formed in the ways described earlier for the probes 122-1 to122-3. In the case of diamond, this may be formed in the mannerdescribed in “Growth of Diamond Particles on Sharpened Silicon Tips forField Emission”, “Growth of Diamond Particles on Sharpened SiliconTips”, “Mold Growth of Polycrystalline Pyramidal-Shape Diamond for FieldEmitters” referenced earlier. Thus, an e-beam is produced when an e-beamcontrol circuit 383 applies a suitable voltage across the field emissivecoating 390 and the accelerating electrode 392 of the e-beam tool 382.The e-beam control circuit is one of the other components of the SPMsystem 100.

The particle beam tool 382 also includes an accelerating electrode 392,a steering electrode assembly 394, and a collection electrode 396 thatare all formed on insulating support structures 398 of the tool. Theinsulating support structures support the accelerating electrode, thesteering electrodes 395 of the steering electrode assembly, and thecollection electrode so that the accelerating electrode is disposedbelow the field emissive coating 390 of the tip 388, the steeringelectrodes are disposed below the accelerating electrode, and thecollection electrode is disposed below the steering electrodes. Theaccelerating, steering, and collection electrodes may comprise aconductive material, such as polysilicon or tungsten, while theinsulating support structures comprise an insulating material, such assilicon dioxide.

Turning back to FIG. 40, the steering electrodes 395 are electricallyisolated from one another. In this way, the e-beam can be steered (i.e.,focused or directed) in selected directions by causing the e-beamcontrol circuit 383 to selectively apply separate voltages to thesesteering electrodes. As those skilled in the art will recognize, asingle steering electrode could also be used to steer the e-beam.

Furthermore, referring back to FIG. 41, there are apertures 400 in theaccelerating, steering, and collection electrodes 392, 395, and 396through which the e-beam passes to allow the e-beam to strike the object102. In response, secondary electrons are reflected and/or emitted bythe object and strike the collection electrode so as to be collected bythe collection electrode.

Turning again to FIG. 40, the SPM probe 122-8 may also include steeringmagnets 385 that each comprise a coil around a magnetic material. Thesteering magnets are fixed to the lower surface 142 of the base 130 ofthe probe and are spaced equally apart. As a result, the e-beam can befurther steered by selectively applying separate currents to thesteering magnets to selectively recurve or bend the e-beam.

SPM Inspections With SPM Probe 122-8

As mentioned earlier, the SPM probe 122-8 can be used to make radiationmeasurements in order to inspect the object 102. Referring to FIG. 42,in doing so, the controller 114 controls the loading and unloading ofthe probe from a scanning head 120 in the same way as was discussed forthe first probe 122-1. However, the components of the SPM system 100 inthis embodiment may also include a steering coil 387 fixed to the probeholder 156 of the scanning head. The steering coil is also used toselectively steer the e-beam by providing it with a selected current tocause the e-beam to have a spiral trajectory with a radius that is afunction of the current.

Then, the controller 114 controls the positioning system 103 to positionthe probe 122-8 for a scan of the object 102. Referring back to FIGS. 40to 42, at each scan point, the controller causes the e-beam controlcircuit 383 to produce an e-beam in the manner discussed earlier. At thesame time, it causes the e-beam control circuit to apply suitablevoltages and currents to the steering electrodes 394, the steeringmagnets 385, and the steering coil 387 to selectively steer the e-beamat the object 102. In this way, the e-beam can be steered at areas ofthe object 102, such as the sides and undersides of the object, that aredifficult to reach. Then, when the e-beam interacts with the object 102,it causes secondary electrons to be reflected and/or emitted back to thecollection electrode 396. This causes a current in the collectionelectrode which represents the electrons that contact the collectionelectrode. This current is measured by the e-beam control circuit as aradiation measurement of the electrons collected by the collectionelectrode. The radiation measurements made at all of the scan points maybe collected and used by the controller to produce an image of theobject like that made with a conventional scanning electron microscope.

Additionally, as discussed earlier, the SPM system 100 also include aradiation measurement system 389, as shown in FIG. 42. At each scanpoint, the radiation measurement system is used to detect and measureradiation, such as secondary charged particles or electromagneticenergy, reflected and/or emitted by the object 102 in response to theparticle beam striking it. Specifically, the radiation measurementsystem makes a radiation measurement of the radiation it detects at thescan point. For example, this radiation measurement may be aspectrophotometric measurement of the spectrum of wavelengths of thedetected radiation. In response, the radiation measurement systemprovides the radiation measurement to the controller 114 and thecontroller uses the radiation measurements collected over the scan togenerate inspection data in the manner discussed earlier.

In an alternative embodiment shown in FIG. 43, the radiation measurementsystem 389 may comprise a radiation detector 391 that is located in thescanning head 120. In this case, the radiation detector may comprise asemiconductor radiation detector as described in “SemiconductorDetectors” referenced earlier. However, in this embodiment, the imagingoptics 226 are replaced by the radiation detector and the radiationmeasurement system also includes a radiation measurement circuit 393.Thus, at each scan point, the radiation detector is used to detectradiation emitted by the object 102 in response to the e-beam strikingit. The radiation measurement circuit than makes a radiation measurementof the detected radiation and provides it to the controller 114. Theradiation measurements collected over the scan are then used by thecontroller to generate inspection data in the manner just discussed.

The radiation measurements made with the eighth SPM probe 122-8 and theradiation measurement system 398 are particularly useful for inspectinga lithographic structure, such as a semiconductor fabrication mask. Sucha lithographic structure is used to expose only a certain portion of areplicable structure to electrons with which it is irradiated duringfabrication. Thus, after a repair and/or fabrication step has beenperformed on the lithographic structure using any of the other SPMprobes 122-1 to 122-8 to 122-18 discussed herein, the eighth probe canbe used in conjunction with the radiation measurement system to emulatethe way in which such a replicable structure would be exposed toelectrons by the lithographic structure during actual fabrication.

Specifically, at each scan spot, the controller 114 causes the eighthSPM probe 122-8 to direct a e-beam at the lithographic structure. Theradiation measurement system would then detect the resulting radiationthat would be projected by the lithographic structure onto a replicablestructure or that would be reflected and/or emitted by the lithographicstructure. From the detected radiation, the controller 114 generates apatterned image of the detected radiation. Thus, this serves to emulatethe way in which the lithographic structure would expose such areplicable structure to radiation during actual fabrication. Thecontroller then compares the generated patterned image with a recordedtarget patterned image to generate repair and/or fabrication data thatidentifies any further repair and/or fabrication step to be performed onthe lithographic structure. The entire process is then repeated untilthe generated patterned image has converged to the target patternedimage within a specified tolerance level.

SPM Modifications With SPM Probe 122-8

The SPM probe 122-8 can also be used to make SPM modifications of theobject 102 using the e-beam it generates. Specifically, the userinstructs the controller 114 with the user interface 116 to use theprobe to make an SPM modification to the object 102. In doing so, thecontroller controls the positioning system 103 and the e-beam controlcircuit 383 in causing the probe to generate an e-beam that strikes theobject at a selected spot. This is done in the same way as describedearlier. However, in this case, e-beam can then be used to heat thematerial of or remove material from the object. Or, it can be done tomake chemical changes in the object. In this regard, an electron beamcan provide the energy and/or free electrons necessary to cause chemicalchanges or induce chemical combinations in materials. For instance anelectron beam can break bonds in proteins (including DNA and RNA) orpolymers like plastics, oils or cause solid, liquid or gaseous materialto change chemical states or go into combinations with materials muchlike heat or light can be used to make such changes. Typically an e-beamis more energetic and site specific then heating or electromagneticexposure (even at x-ray energies because of the difficulty of focusingor controlling very energetic photons such as x or gamma radiation.

Calibration of SPM Probe 122-8

The position of the e-beam tool 382 of the SPM probe 122-8 may becalibrated and its profile examined using the AFM probe 131 and SEMprobe 133 of the calibration structure 128-1 in the manner discussedearlier for the first SPM probe 122-1. Furthermore, the position of thee-beam tool 382 of the SPM probe 122-8 may be calibrated using thecalibration structure 128-2 shown in FIG. 11. This calibration structure128-2 may include one or more reference materials 188 on the insulatingmaterial 199 on the base 190 of the reference structure. Each referencematerial has a precisely known position with respect to the referencelocation. And, each reference material may comprise a material that hasknown radiation properties for when electrons strike it. For example,this may be a material, such as bismuth, which produces a known type ofradiation, such as xrays, in response to electrons striking it.

Turning again to FIG. 1, in this case, the controller 114 can calibratethe position of the e-beam tool 382 of the SPM probe 122-8 prior tomaking the radiation measurements just described. This is done bycontrolling the positioning system 103 to attempt to position the e-beamtool over one of the reference materials 188 of the calibrationstructure 128-2. Then, referring to FIGS. 40 to 43, the controllercontrols the making of an e-beam with the e-beam tool in the mannerdiscussed earlier. From the radiation measurements made by the radiationmeasurement system 389, the controller generates a spectrum of themeasured wavelengths (i.e., frequency spectrum) and compares thegenerated spectrum with a stored known reference spectrum of wavelengthsfor radiation that results when an e-beam strikes the reference material188 If they match, this means that e-beam tool was positioned directlyover the reference material. Alternatively, the controller may cause thee-beam to be chopped or modulated and lock on the results from the x-raydetector based on this chopping or modulation. This is done in the samemanner discussed earlier for chopping or modulating the light emittedfrom the tip 138 of the SPM probe 122-1. When a peak in the intensity isdetected by the controller, then the e-beam tool is positioned directlyover the reference material. Thus, in a closed feedback loop, the e-beamtool is positioned, the e-beam is produced, the wavelengths or theintensity of the resulting radiation are measured, and the generated andreference spectrums are compared in the manner just described until itis determined by the controller that the e-beam tool is in factpositioned over the reference material. Once this occurs, the positionaloffset of the e-beam tool at the known position of the referencematerial is determined. Based on this positional offset, the precisepositioning of the e-beam tool with respect to the reference location isthen calibrated. If there are multiple reference materials, the resultsof the calibrations computed for all of the reference materials may becombined to provide a weighted or averaged calibration of the positionof the e-beam tool.

Referring to FIGS. 11 and 52, as mentioned earlier, the calibrationstructure 128-2 may include one or more radiation detection devices 460.Turning again to FIG. 1, in this case, the controller 114 calibrates theposition of the e-beam tool 382 of the SPM probe 122-8 by controllingthe positioning system 103 to attempt to position the e-beam tool overone of these radiation detection devices. Then, referring to FIG. 42,the controller causes the e-beam tool to produce an e-beam in the mannerjust discussed. The radiation detected by the radiation detector 464 ofthis radiation detection device is measured by the radiation measurementcircuit 181. The controller analyses the measurement to determine if theradiation detection device in fact detected the electrons of the e-beamgenerated by the e-beam tool. Thus, in a closed feedback loop, thee-beam tool is positioned, the e-beam is produced, and the measurementfrom the radiation measurement circuit is analyzed in the manner justdescribed until it is determined by the controller that the e-beam toolis in fact positioned over the radiation detection device. Once thisoccurs, a positional offset is computed and the precise positioning ofthe e-beam tool with respect to the reference location is thencalibrated based on the positional offset in the manner describedearlier. If there are multiple radiation detection devices 460, theresults of the calibrations computed for all of these radiationdetection devices may be combined to provide a weighted or averagedcalibration of the position of the e-beam tool 382.

Referring to FIGS. 11 and 52, the calibration structure 128-2 mayfurther include one or more radiation detection devices 461. Each ofthese radiation detection devices is constructed like each radiationdetection device 460 described earlier, but includes instead a radiationdetector 464 for detecting radiation in the form of charged particles,such as ions, electrons, protons, or alpha particles, that pass throughthe aperture 467 of the aperture structure 166. Thus, this radiationdetector may simply comprise a collection electrode for collecting suchcharged particles. Then, the position of the e-beam tool is done in thesame manner as just described for the radiation detectors 460, exceptthat it is done with radiation measurements of the electrons of thee-beam that are collected by the collection electrode. Thesemeasurements are made by the radiation measurement circuit 181.

The radiation measurements of electrons collected with the collectionelectrode 396 of an e-beam tool 382 of the SPM probe 122-8 can also beused by the controller 114 to calibrate the e-beam tool for positioning.This is done by scanning the probe over the first calibration structure128-1 to produce an image of the first calibration structure 128-1 fromthe radiation measurements made at the scan points. This produced imageis then compared with a stored reference image of the calibrationstructure which was produced similarly using a reference particle beamtool that was precisely scanned (or positioned) over the calibrationstructure with respect to the reference location of the SPM system 100.The images are compared to determine the positional offset between them.Based on the determined positional offset, precise positioning of thee-beam tool with respect to the reference location is then calibrated.

Vacuum Operation With Gas Bearing Structure for Maintaining Gap

As shown in FIGS. 40 to 42, the eighth SPM probe 122-8 has an aperture132. Thus, a microvacuum chamber in the gap 198 between the eighth probeand the object 102 or calibration structure 128 may be establishedduring operation of the probe in a similar manner as described for thefirst SPM probe 122-1. Thus, the object 102 or calibration structure 128can be effectively irradiated with the e-beam produced by the eighthprobe without the danger of the e-beam colliding with other particles.

But, for the eighth SPM probe, the gap 198 may be set with a gas bearingstructure 402 formed in the base 130 of the probe. As shown in FIG. 40,the gas bearing structure comprises an inlet 403, an annular outlet (oropening) 404, and a duct 405 for providing gas received at the inlet tothe outlet.

Referring to FIG. 1, as mentioned earlier, the components of the SPMsystem 100 include a fluid supply/sink system 344 and correspondingflexible tubes 349 for each scanning head 120. The fluid supply/sinksystem includes a corresponding valve 346 for each flexible tube so thateach flexible tube is connected to the fluid supply/sink system via thecorresponding valve. As shown in FIG. 42, one of the flexible tubes isconnected to a corresponding connector tube 347 of each of the scanningheads. Referring to FIG. 40, this connector tube is connected to theinlet 403 of the gas bearing structure 402 of the SPM probe 122-8.

Referring now to FIGS. 1, 40, and 42, when the controller 114 controlsthe corresponding valve 346 of the fluid supply/sink system 344 to open,a gas source of the fluid supply/sink system is in fluid communicationwith the gas bearing structure 402. This gas source provides a gas thatenters the inlet 403, travels through the duct 405, and exits at theoutlet 404. The pressure of the exiting gas establishes a gas bearingbetween the lower surface 142 of the base 130 of the probe and the uppersurface 166 of the object 102 or calibration structure 128. Thispressure may be approximately 1.1 atmospheres and is sufficient tomaintain the width of the gap 198.

Furthermore, the object 102 may comprise a small free moving orpartially constrained specimen, such as a micromachine or biologicalcell or material, and a flat specimen support structure, such asmicroscope slide, on which the specimen is located. In this case, themicrovacuum chamber is created in the gap 198 between the SPM probe122-8 and the specimen support structure. The annular outlet 404 of thegas bearing structure 402 and the aperture 132 can be selected so thatthe diameter of the specimen is smaller than the diameter of the annularoutlet. In this way, the specimen is kept centered at a fixed positionon the specimen support structure. Furthermore, in the case where thediameter of the specimen is larger than the diameter of the annularoutlet, the specimen can still be kept centered and in a fixed positionon the specimen support structure by the pressure of the gas exiting theoutlet. Thus, the SPM system 100 may include multiple SPM probes 122-8with annular outlets and apertures of different diameters for differenttypes of objects that are to be inspected or modified.

In alternative embodiment, multiple outlets could be used rather thanthe single annular outlet 405. In this case, the multiple outlets couldbe arranged in a triangular fashion. In this way, the maintenance of thewidth of the gap 198 would be triangulated.

Referring back to FIG. 1, the components of the SPM system 100 alsoincludes a valve 310 for each flexible tube 307 connected to a scanninghead 120. Thus, by controlling the valve, the pressure of the gas thatexits the outlets 304 of the gas bearing structure can be preciselycontrolled by the controller 114. In this way, the controller canprecisely control the width of the gap 198.

As those skilled in the art will recognize, the SPM probes 122-1 to122-7 described earlier could also be constructed with a gas bearingstructure 402 in order to establish a microvacuum chamber in the gap198. Conversely, the microvacuum chamber in the gap 198 for the eighthSPM probe 122-8 could be established instead in the manner describedearlier for the first SPM probe 122-1. In this case, the eighth probewould include the gap sensors 164 discussed earlier. Furthermore, theeighth probe could have a particle removal structure 342 as describedearlier for the fifth SPM probe 122-5. In this case, referring to FIG.27, the inlet 332, the duct 340, and the outer annular outlet 336 or theinlet 330, the duct 341, and the inner annular outlet 335 could be usedas the gas bearing structure 402.

Vacuum Operation With Conformal Seal

Referring to FIG. 42, in alternative embodiment, a conformal seal 412could be used to establish the microvacuum chamber in the gap 198. Theconformal seal could be attached to the probe holder 156 of the scanninghead 120 or to the SPM probe 122-8 itself. The conformal seal wouldcreate a seal between the lower surface 142 of the base 130 of the probeand the upper surface 166 of the object 102 or calibration structure128. This would enable the microvacuum chamber to be established in thegap without the need of maintaining the precise width of the gap as isdone using the gap sensors 164 or the gas bearing structure 402discussed earlier. As with the gas bearing structure, the conformal sealcould also be used in order to establish a microvacuum chamber in thegap 198 for the SPM probes 122-1 to 122-7 described earlier.

Structure of SPM Probe 122-9

Turning now to FIG. 44, there is shown a ninth microstructured SPM probe122-9 for use in making SPM modifications of the object 102. The probehas fluid material delivery tools 414 that each deliver fluid materialto the object. This fluid material may simply comprise a fluid, such asa gas or liquid chemical, or it may comprise small microstructure, suchas biological matter, and a carrier fluid, such as a gas or liquidbiological agent, in which the small microstructure are carried.

Each fluid material delivery tool 414 has a support platform 416, suchas a cantilever, and a tip 418 on the support platform. The supportplatform is connected to the base 130 of the SPM probe 122-9 andsuspended in the aperture 132 of the base within the corresponding innerperimeter surface 134 of the base. This is done so that the tip isbetween the lower and upper surfaces 142 and 140 of the base to preventit from being damaged. The support platform may be separately formed ormay be an integral portion of the base. Otherwise, the base has the samebasic shape and construction as the base discussed for the first probe122-1.

Turning now to FIG. 45, the tip 418 of each fluid material delivery tool414 includes a capillary 420 in the core material 144 of the tip. Thecapillary is connected to and in fluid communication with a duct 422 inthe support platform 416 of the tool. The duct is connected to and influid communication with the outlet 425 of a microstructured pump 424 ofthe fluid material delivery tool. In this embodiment, the pump is formedin the base 130 of the SPM probe 122-9.

The pump 424 has an inlet 426 on the upper surface 140 of the base forreceiving fluid material to be delivered to the object 102. The inlet isconnected to and in fluid communication with a pumping chamber 428 ofthe pump. Between the pumping chamber and the inlet of the pump is acheck valve 430. The check valve includes a sealing plate 432 thatextends across the inlet and is suspended in the inlet by a suspensionmechanism 433 that comprises spring arms or a spring web. The checkvalve further includes sealing arms 434 that extend out from the sealingplate. The inlet includes sealing seats 436 for the sealing arms 434.The pump also includes a venting chamber 438 and a flexible membrane (ordiaphragm) 440 between the pumping chamber and the venting chamber. Themembrane serves as a displaceable lower wall of the pumping chamber anda displaceable upper wall of the venting chamber. One or more ventingoutlets 439 of the pump are located on the lower surface 142 of the baseand are connected to and in fluid communication with the ventingchamber. On the fixed lower wall of the venting chamber, the pumpfurther includes an insulating plate 441 and a plate electrode 442 onthe insulating plate.

The base 130, the tip 418, the support structure 416, the membrane 440,the suspension mechanism, the sealing plate 432, and the sealing arms436 may be integrally formed together and comprise a semiconductormaterial, such as polysilicon, that is conductive. The plate electrode442 may comprise a conductive material, such as polysilicon or tungsten.And, the insulating plate 441 may comprise an insulating material, suchas silicon dioxide.

Probe Loading and Unloading, Vacuum Operation, and Particle RemovalOperation of SPM Probe 122-9

Referring to FIG. 46, the ninth SPM probe 122-9 may be loaded onto oneof the scanning heads 120 in the same ways as were described earlier forthe first probe. In addition, the tip 418 of each fluid materialdelivery tool 416 may have its profile examined in the manner discussedearlier for the first probe. The tip may be activated and deactivated inthe ways described earlier for the first probe. Furthermore, opticalimages would be produced by the imaging optics 226 during operationand/or calibration of the ninth probe in the manner discussed earlierfor the first probe. During operation and/or calibration, a microvacuumchamber in the gap 198 between the ninth probe and the object 102 orcalibration structure 128 may be established in any of the waysdescribed earlier for the first probe with the aperture 132 and the gapsensors 164 of the ninth probe. Or, the ninth probe may include insteada gas bearing structure 342 like that described earlier for the eighthSPM probe 122-8. Finally, the ninth probe could also include a particleremoval structure 342 to remove particles during operation and/orcalibration in the manner described earlier for the fifth SPM probe122-5.

SPM Modifications With SPM Probe 122-9

Turning to FIG. 1, in order to make SPM modifications to the object 102by delivering fluid material to the object 102 with the SPM probe 122-9,the fluid supply/sink system 344 includes a fluid material source foreach of the fluid material delivery tools 414 of the probe. Each fluidmaterial source is connected to a corresponding flexible tube 345 foreach scanning head 120. As shown in FIG. 46, each of these flexibletubes is connected to a corresponding connector tube 347 of the scanninghead. Each connector tube is in turn connected to a corresponding fluidmaterial delivery tool 414.

The controller 114 then controls the positioning system 103 to positionthe probe for a scan of the object 102. Referring back to FIGS. 44 to46, at each scan point, the controller causes the corresponding valve346 to open so that the fluid source is in fluid communication with aselected fluid material delivery tool 414 of the probe whose tip 418 hasbeen activated. As a result, the fluid material source provides thefluid material delivery tool with the fluid material.

Referring back to FIG. 45, at each scan point, the fluid material isreceived from the connector tube 347 at the inlet 426 of the pump 424 ofthe selected fluid material delivery tool 414 with a pressure sufficientto open the check valve 430. In doing so, the pressure of the fluidmaterial on the sealing plate 432 of the check valve has a force largerthan the spring force of the suspension mechanism 433. As a result, thesealing plate lifts the sealing arms 434 off of the sealing seats 436 ofthe inlet. The fluid material then travels through the inlet into thepumping chamber 428 of the pump.

The components of the SPM system 100 further include a pumping controlcircuit 444. At each scan point, while the fluid material is beingprovided to the pumping chamber 428 of the pump 424, a voltage isapplied across the membrane 440 and the plate electrode 442 by thepumping control circuit 444 so that the membrane is displaced from itsnormal position toward the plate electrode and the pumping chamber isexpanded. This is done in such a way that the pressure of the fluidmaterial in the pumping chamber is kept below that which would cause thefluid material to be ejected by the capillary 420 of the activated tip418. Furthermore, the ambient gas in the venting chamber 438 is ventedout of the venting outlets 439 when this occurs so that the pressure ofthe ambient gas in the venting chamber is maintained at a constantlevel.

At each scan point, when the pumping chamber 428 contains the fluidmaterial to be delivered to the object 102, the controller 114 causesthe pumping control circuit 444 to apply a voltage across the membrane440 and the plate electrode 442 which causes the spring restoring forceof the membrane to restore the membrane to its normal position. Thisincreases the pressure of the fluid material in the pumping chamber.This pressure on the sealing plate 432 of the check valve 430 causes thesealing plate to seat the sealing arms 433 on the sealing seats 436 ofthe inlet 426 so that the check valve is closed. Then, because of theincreased pressure, the fluid material is pumped from the pumpingchamber out through the outlet 425 of the pump 424 and into the duct422. The fluid material travels through the duct and into the capillary420 of the activated tip 418 and is ejected by the capillary. In thisway, the fluid material is delivered to the object 102.

As shown in FIG. 46, the other components 123 of the SPM system 100 mayinclude a electroresisitive material and a drive connection at thenozzle of the ion beam tool to heat the fluid. Or it may include a laser(or other electromagentic source such as a microwave generator etc.)directed at the nozzle of the ion beam tool. Or, a catalytic substancemay be placed on the outside of the nozzle or adjacent to it on the toolprobe. Or, an ultrasonic source may induce a change in the ejected fluidby exciting the object with ultrasound from below or integrated in theprobe 122-10. Finally, a magnetic field from a coil located on the probecan be used to induce the fluid to change.

Furthermore, as mentioned earlier and shown in FIG. 44, the SPM probe122-9 includes multiple fluid material delivery tools 414. Thus, eachfluid material delivery tool could be used to deliver a different fluidmaterial from any of the other fluid material delivery tools.

Calibration of SPM Probe 122-9

The position of each fluid material delivery tool 414 of the SPM probe122-9 may be calibrated and its profile examined using the AFM probe 131and SEM probe 133 of the calibration structure 128-1 in the mannerdiscussed earlier for the first SPM probe 122-1. Furthermore, theposition of the each fluid material delivery tool may be calibratedusing the calibration structure 128-2 shown in FIG. 11.

Structure of SPM Probe 122-10

Turning now to FIGS. 47 and 48, there is shown a tenth microstructuredSPM probe 122-10 for use in making SPM modifications of the object 102.The probe has pipette tools 446 that each can remove fluid material fromand/or around the object. As with the fluid material delivery tools 414,this fluid material may simply comprise a fluid, such as a gas or liquidchemical, or it may comprise small microstructure, such as biologicalmatter or contaminant particles on and/or around the object, and acarrier fluid, such as a gas or liquid biological agent or ambient gas,in which the small microstructure are carried. Furthermore, each pipettetool 446 is constructed like each fluid material delivery tool 414 ofthe SPM probe 122-10. However, in the embodiment of FIG. 47, the pump424 does not have a check valve 430 and, in the embodiment of FIG. 48,the pump does not have the check valve and the inlet 426.

Probe Loading and Unloading, Tip Activation and Deactivation, VacuumOperation, and Particle Removal Operation of SPM Probe 122-10

The tenth SPM probe 122-10 may be loaded onto and unloaded from one ofthe scanning heads 120 in the same ways as were described earlier forthe first probe and similar to that shown for the ninth SPM probe 122-9in FIG. 46. Thus, the tip 418 of each pipette tool 446 of the tenthprobe may be activated and deactivated in the ways described earlier forthe first probe. And, the tip may have its profile examined in themanner discussed earlier for the first probe. Furthermore, opticalimages would be produced by the imaging optics 226 during operationand/or calibration of the tenth probe in the manner discussed earlierfor the first probe. During operation and/or calibration, a microvacuumchamber in the gap 198 between the tenth probe and the object 102 orcalibration structure 128 may be established in any of the waysdescribed earlier for the first probe with the aperture 132 and the gapsensors 164 of the tenth probe. Or, the tenth probe may include insteada gas bearing structure 342 like that described earlier for the eighthSPM probe 122-8. Finally, the tenth probe could also include a particleremoval structure 342 to remove particles during operation and/orcalibration in the manner described earlier for the fifth SPM probe122-5.

SPM Modifications With SPM Probe 122-10

Turning to FIG. 1, in order to make SPM modifications to the object 102by removing material from the object 102 with the SPM probe 122-10, thecontroller 114 controls the positioning system 103 to position the probefor a scan of the object 102. This is done at each scan point so thatthe capillary 420 of the activated tip 418 of a selected pipette tool446 of the probe is positioned in or near the material of the object.

Referring to the embodiment of FIG. 47, in order to make SPMmodifications to the object 102 by removing fluid material from theobject 102 with the SPM probe 122-10, each pipette tool 446 of the probeis in fluid communication with the vacuum source 192 via the inlet 426at each scan point. This is done in same manner as discussed earlier forthe aperture 132 of the first SPM probe 122-1. Alternatively, the inletmay be directly connected to the vacuum source via one or more tubes.Or, as in the embodiment of FIG. 48, the inlet may be removed for eachpipette tool 446 so that each pipette tool is self contained within theprobe.

At each scan point, the controller causes the pumping control circuit444 to apply a voltage across the membrane 440 and the plate electrode442 of the pump 424 so that the membrane is displaced from its normalposition toward the plate electrode and the pumping chamber is expanded.As a result, the fluid material to be removed from and/or around theobject is drawn into the capillary of the tip, through the duct 422, andinto the pumping chamber 428 via the inlet/outlet 425 of the pump. Atthe same time, the ambient gas in the venting chamber 438 is vented outof the venting outlets 439 when this occurs so that the pressure of theambient gas in the venting chamber is maintained at a constant level.The material can then be ejected from the pumping chamber at a desiredlocation or repository of the SPM system 100 in the manner describedearlier for the SPM probe 122-9.

Calibration of SPM Probe 122-10

The position of each pipette tool 446 of the SPM probe 122-10 may becalibrated and its profile examined using the AFM probe 131 and SEMprobe 133 of the calibration structure 128-1 in the manner discussedearlier for the first SPM probe 122-1. Furthermore, the position of eachpipette tool may be calibrated using the calibration structure 128-2shown in FIG. 11.

Structure of SPM Probe 122-11

Turning now to FIG. 49, there is shown an eleventh SPM probe 122-11 foruse in making SPM measurements and/or SPM modifications of the object102. Here, like the eighth SPM probe 122-8, the SPM measurements and theSPM modifications are made in response to radiation in the form ofcharged particles that are produced by the probe and directed at theobject. But, in this case, the charged particles comprise an ion beamproduced by one of the ion beam tools 450 of the eleventh probe.

Referring to FIG. 50, each ion beam tool 450 is constructed like one ofthe fluid material delivery tools 414 of the ninth SPM probe 122-9,except for several differences. Namely, like each e-beam tool of theeighth SPM probe 122-8, each ion beam tool includes an acceleratingelectrode 392, a steering electrode assembly 394, a collection electrode396, and insulating support structures 398 on the support structure 416of the tool. Here, the accelerating electrode is disposed below theopening of the capillary 420 of the tip 418. Otherwise, the base and thepump 424 formed in the base have the same basic shape and constructionas that discussed for the ninth probe.

Probe Loading and Unloading, Tip Activation and Deactivation, VacuumOperation, and Particle Removal Operation of SPM Probe 122-11

Referring to FIG. 51, the eleventh SPM probe 122-11 may be loaded ontoand unloaded from one of the scanning heads 120 in the same ways as weredescribed earlier for the first probe. Thus, the tip 418 of each ionbeam tool 450 of the eleventh probe may be activated and deactivated inthe ways described earlier for the first probe. And, the tip may haveits profile examined in the manner discussed earlier for the firstprobe. Furthermore, optical images would be produced by the imagingoptics 226 during operation and/or calibration of the eleventh probe inthe manner discussed earlier for the first probe. During operationand/or calibration, a microvacuum chamber in the gap 198 between theeleventh probe and the object 102 or calibration structure 128 may beestablished in any of the ways described earlier for the first probewith the aperture 132 and the gap sensors 164 of the eleventh probe. Or,the eleventh probe may include instead a gas bearing structure 342 likethat described earlier for the eighth SPM probe 122-8. Finally, theeleventh probe could also include a particle removal structure 342 toremove particles during operation and/or calibration in the mannerdescribed earlier for the fifth SPM probe 122-5.

SPM Modifications With SPM Probe 122-11

As mentioned earlier, the SPM probe 122-11 can be used to make SPMmodifications of the object. Referring now to FIG. 1, in doing so, thecontroller 114 controls the positioning system 103 to position the probefor a scan of the object 102. Then, referring to FIGS. 1 and 49 to 51,at each scan point, the inlet 426 of each ion beam tool 450 is in fluidcommunication with a fluid source of the fluid supply/sink system 344 toreceive fluid. This is done via a corresponding valve 346, flexible tube345, and connector tube 347 in the same manner as was described for eachfluid material delivery tool 414 of the SPM probe 122-9. Then, at eachscan point, the controller 114 controls the pumping control circuit 444to cause the pump 424 of the ion beam tool to pump the fluid out of thecapillary 420 of the tip 418. This is done in the manner discussedearlier for each fluid material delivery tool.

The other components 123 of the SPM system 100 further include an ionbeam control circuit 454. At the same time that the fluid is beingejected, the controller controls the ion beam control circuit to apply avoltage to the accelerating electrode 392 to ionize the ejected fluid.As a result, the ion beam tool 450 produces an ion beam that is directedat the object 102. As mentioned earlier for the first and eighth SPMprobes 122-1 and 122-8, because of the microvacuum chamber, the object102 can be effectively irradiated with the ion beam without collidingwith other particles.

The ion beam can be steered by the steering electrodes 395 of thesteering electrode assembly 394 in the same way as that described forthe e-beam produced by the e-beam tool 382 of the eighth SPM probe122-8. In addition, the SPM probe 122-11 could have steering magnets 385and steering coil 387 like those of the SPM probe 122-8 in order tofurther steer the ion beam.

The ion beam can then used as a plasma torch to heat the material of orremove material from the object. Or, in the case where the object is asemiconductor material, it could be used to dope the object with ions.Moreover, the ion beam can be used to go in chemical recombination withthe target. For example, this may be done to bombard silicon with carbonions (by biasing the silicon substrate electrically with respect to theplasma) which go into the surface to form SiC (silicon carbide)chemical.

SPM Inspections With SPM Probe 122-11

As mentioned earlier, the SPM probe 122-11 can be used to make radiationmeasurements in order to inspect the object 102. To do so, thecontroller 114 controls the positioning system 103 to position the probe122-8 for a scan of the object 102. At each scan point, the controllercauses a selected ion beam tool 450 of the probe to direct an ion beamat the object in the manner discussed earlier.

Referring back to FIGS. 40 to 42, at each scan point, the controllercauses the ion beam control circuit 454 to produce an ion beam in themanner just discussed. Then, when the ion beam interacts with the object102, it causes secondary radiation to be reflected and/or emitted backto the collection electrode 396. This causes a current in the collectionelectrode which represents the ions that contact the collectionelectrode. This current is measured by the ion beam control circuit as aradiation measurement of the ions collected by the collection electrode.The radiation measurements made at all of the scan points may becollected and used by the controller to produce an image of the objectlike that made with a conventional electron microscope or otherconventional particle microscope.

In addition, the radiation measurement system 389 may be used to detectand measure radiation, such as Optical, Radiofrequency or X-radiation(depending on the beam energy and the target), emitted by the object 102in response to the ion beam striking it. This is done in the same manneras that discussed earlier for the e-beam tool 382 of the SPM probe122-8, except that it is done in response to the ion beam striking theobject.

As with the eighth SPM probe 122-8, the radiation measurements made withthe eleventh SPM probe 122-11 and the radiation measurement system 398are particularly useful for inspecting a lithographic structure, such asa semiconductor fabrication mask. This would be done in the same manneras was described earlier using the e-beam produced by the eighth probe,except that an ion beam would be used.

Calibration of SPM Probe 122-11

The position of each ion beam tool 450 of the SPM probe 122-11 may becalibrated and its profile examined using the AFM probe 131 and SEMprobe 133 of the calibration structure 128-1 in the manner discussedearlier for the first SPM probe 122-1. Furthermore, the position of eachion beam tool may be calibrated using the calibration structure 128-2shown in FIG. 11 in the manner discussed next.

The calibration structure 128-2 may include one or more referencematerials 458 on the insulating material 199 on the base 190 of thereference structure. Each reference material has a precisely knownposition with respect to the reference location. And, each referencematerial may comprise a material that has known radiation properties forwhen ions strike it. For example, this may be a material, such astungsten, which produces specific wavelengths of radiation, such as xrays, in response to ions striking it. Then, the position of the ionbeam tool is calibrated using these reference materials in the same waythat the position of the e-beam tool 382 of the eighth SPM probe 122-8is calibrated using the reference materials 191, except that an ion beamis used.

Furthermore, referring to FIGS. 11 and 52 and as discussed earlier forthe eighth SPM probe 122-8, one or more of the radiation detectiondevices 461 of the calibration structure 128-2 may each have a radiationdetector 464 that detects charged particles, such as ions. Thecontroller 114 calibrates the position of the selected ion beam tool 450of the SPM probe 122-11 using these radiation detection devices in asimilar manner to that discussed for the e-beam tool 382 of the eighthprobe. Here, however, the radiation measurements made by the radiationmeasurement circuit 181 are a measure of ions detected by the radiationdetectors in response to an ion beam produced by the selected ion beamtool.

Structure of SPM Probe 122-12

Turning now to FIG. 53, there is shown a twelfth SPM probe 122-12 foruse in making SPM modifications of the object 102 depositing material onand/or removing material from the object 102. The twelfth probe hasvacuum arc tools 470 that are each suspended in a corresponding aperture132 of the base 130 of the twelfth probe. And, like the eighth SPM probe122-8, the twelfth probe also has a particle removal structure 342 andgap sensors 164 formed in the base 130 of the probe. Otherwise, the basehas the same basic shape and construction as that discussed for thefirst SPM probe 122-1.

Referring to FIG. 54, each vacuum arc tool 470 includes a pump 424 thatis formed in the base 130 like each fluid material delivery tool 414 ofthe ninth SPM probe 122-9. However, in this case, the pump includes twooutlets 425. Between each outlet and the pumping chamber 428 is acorresponding outlet valve 476.

Each outlet valve 476 includes a sealing plate 478 that extends acrossthe corresponding outlet and is suspended in the outlet by a suspensionmechanism 479 that comprises spring arms or a spring web. The outletvalve further includes sealing arms 480 that extend out from the base.In its normal position, the sealing plate is seated against the sealingarms so as to form a tight seal that prevents any fluid from enteringthe outlet. This is due to the spring force of the suspension mechanism.The sealing plate, the sealing arms, and the suspension mechanism mayintegrally formed with the base. Thus, the sealing plate comprises aconductive semiconductor material. Each outlet valve also includes aninsulating plate 482 on the inner surface of the outlet and a plateelectrode 484 on the insulating plate. The plate electrode may comprisea conductive material, such as polysilicon or tungsten, and theinsulating plate may comprise an insulating material, such as silicondioxide.

In addition, each vacuum arc tool 470 has a support platform 472 that isconnected to the base 130 of the SPM probe 122-12 and suspended in theaperture 132 of the base within the corresponding inner perimetersurface 134 of the base. This is done so that the tool is between thelower and upper surfaces 142 and 140 of the base to prevent it frombeing damaged. The support platform may be separately formed or may bean integral portion of the base. Each vacuum arc tool also includes aninsulating plate 486 on the support platform and a cathode 487 on theinsulating plate. And, each tool includes a support structure 488 and ananode 490 on the support structure. The support structure suspends theanode over the cathode. The anode has an aperture 491.

Each vacuum arc tool 470 further includes outlet ducts 492 and 494formed in the support platform 472. Each of the outlet ducts isconnected to a corresponding outlet 425 of the pump 424. The outlet duct492 opens into the aperture 132 so that fluid can be pumped into thespace between the anode 490 and the cathode 487. The other outlet ductopens into the aperture so that fluid may be pumped into the spacebetween the anode and the object 102.

Probe Loading and Unloading, Calibration, Vacuum Operation, and ParticleRemoval Operation of SPM Probe 122-12

Referring to FIG. 55, the twelfth SPM probe 122-12 may be loaded ontoand unloaded from one of the scanning heads 120 in the same ways as weredescribed earlier for the first SPM probe 122-1. And, each vacuum arctool 470 may have its profile examined in the manner discussed earlierfor the first probe. And, optical images would be produced by theimaging optics 226 during operation and/or calibration of the twelfthprobe in the manner discussed earlier for the first probe. Duringoperation and/or Galibration, a microvacuum chamber in the gap 198between the twelfth probe and the object 102 or calibration structure128 may be established in any of the ways described earlier for thefirst probe with the aperture 132 and the gap sensors 164 of the twelfthprobe. Or, the twelfth probe may include instead a gas bearing structure342 like that described earlier for the eighth SPM probe 122-8. Finally,the particle removal structure 342 removes particles during operationand/or calibration in the manner described earlier for the fifth SPMprobe 122-5.

SPM Modifications With SPM Probe 122-12

The SPM probe 122-12 is used to make SPM modifications of the object bydepositing material on the object or removing some of the material ofthe object. Referring now to FIG. 1, in doing so, the controller 114controls the positioning system 103 to position the probe for a scan ofthe object 102.

Referring to FIGS. 1 and 53 to 55, at each scan point, the inlet 426 ofeach vacuum arc tool 470 is in fluid communication with a fluid sourceof the fluid supply/sink system 344 to receive fluid. This is done via acorresponding valve 346, flexible tube 345, and connector tube 347 inthe same manner as was described for each fluid material delivery tool414 of the SPM probe 122-9. Then, at each scan point, the controller 114controls the pumping control circuit 444 to cause the pump 424 of thevacuum arc tool to pump the fluid out of one of the outlet ducts 492 and494. This is done in the manner discussed earlier for each fluidmaterial delivery tool except that the outlet valves 476 are used tocontrol which outlet duct the fluid is ejected from. For example, ifmaterial is being deposited on the object 102, then the controller 114causes the pumping control circuit to open the outlet valve that isconnected to the outlet duct 492 while keeping the other outlet valveclosed. As a result, the fluid is pumped into the space between theanode 490 and the cathode 487. Alternatively, if material is beingremoved from the object, then the controller causes the pumping controlcircuit to open the outlet valve connected to the outlet duct 494 whilekeeping the other outlet valve closed. In this case, the fluid is pumpedinto the into the space between the anode and the object 102.

In order to open one of the outlet valves 476, the pumping controlcircuit 444 applies a voltage across the sealing plate 478 of the outletvalve and the plate electrode 474. This causes the sealing plate toovercome the spring force of the suspension mechanism 479 of the outletvalve so that the sealing plate is displaced from its normal position ofbeing seated against the sealing arms 480 of the outlet valve. Then, inorder to close the outlet valve, the pumping control circuit applies anappropriate voltage across the sealing plate and the plate electrode sothat the sealing plate moves back to its normal position. This is due tothe spring force of the suspension mechanism. As those skilled in theart will recognize, the outlet valves just described could also be usedin place of the check valves 430 of the SPM probes 122-9 and 122-11.

The other components 123 of the SPM system 100 further include a vacuumarc control circuit 496. In the case where material is being depositedon the object 102, the controller controls the vacuum arc controlcircuit at each scan point to apply a voltage to across the anode 490and the cathode 487. Since a microvacuum chamber is created in the gap198, a vacuum arc is created due to the presence of the fluid pumpedinto the space between the anode and the cathode. This vacuum arc causesmaterial from the cathode to be ejected through the aperture of theanode and deposited on the object. The type of fluid, the material ofthe cathode 487, and some of the other components 123 of the SPM system100 are appropriately selected in order to deposit a desired material onthe object 102.

For example, it may be desired to deposit diamond like carbon on theobject 102 to make the object harder. In this case, the fluid could beargon, the material of the cathode 487 would be carbon, and the othercomponents 123 of the SPM system 100 would include a magnetic fieldsource to create a magnetic field for deposition of the diamond likecarbon. This may be done in the manner and under the conditionsdiscussed in “Multilayer Hard Carbon Films with Low Wear Rates”, by JoelW. Ager et. al., Surface and Coatings Technology, “Properties of VacuumArc Deposited Amorphous Hard carbon Films”, by Simone Anders et. al.,Applications of Diamond Films and Related Materials: The ThirdInternational Conference, pp. 809-812, 1995, “Hardness, Elastic Modulus,and Structure of Very Hard Carbon Films Produced by Cathodic-ArcDeposition with Substrate pulse Biasing”, by George M. Pharr et. al.,Applied Phys. Lett., vol. 68 (6), pp. 779-781, Feb. 5, 1996, and“Development of Hard Carbon Coatings for Thin-Film tape Heads”, byBharat Bhushan and B. K. Gupta, IEEE Trans. Magn., vol. 31, 2976-2978,1995, which are all hereby incorporated by reference. Specifically, thismay be done with multiple layers of the diamond like carbon to increasethe overall strength of the deposited material.

Furthermore, it may also be desired to deposit metal on the object. Inthis case, the fluid would be argon and the material of the cathode 487would be a metal.

As mentioned earlier, the SPM probe 122-12 includes multiple vacuum arctools 470. Thus, each vacuum arc tool could be used to deposit adifferent material on the object than the other vacuum arc tools. Thismeans that each vacuum arc tool could include a cathode 487 with adifferent material and may be used with different other components 123of the SPM system than any of the other vacuum arc tools of the probe.

Furthermore, in the case where material is being removed from the object102, the controller controls the vacuum arc control circuit 496 at eachscan point to apply a voltage across the anode 490 and the object. Here,a vacuum arc is created due to the presence of the fluid pumped into thespace between the anode and the object and the microvacuum chamber inthe gap 198. This vacuum arc causes material from the object to beejected from the object toward the SPM probe 122-12. The type of fluidused would be argon.

As an additional note, the SPM probe 122-12 could be constructed withoutthe pump 424. In this case, the gases used would be directly provided tothe outlet ducts 492 and 494 formed in the support platform 472 underthe control of the controller 114.

Calibration of SPM Probe 122-12

The position of each vacuum arc tool 470 of the SPM probe 122-12 may becalibrated and its profile examined using the AFM probe 131 and SEMprobe 133 of the calibration structure 128-1 in the manner discussedearlier for the first SPM probe 122-1. Furthermore, the position of eachvacuum arc tool may be calibrated using the calibration structure 128-2shown in FIG. 11 in the manner discussed next.

Heating and Cooling With SPM probe 122-12

Referring to FIGS. 53 and 55, as mentioned earlier, the twelfth SPMprobe 122-12 includes a particle removal structure 342 to removeparticles during operation and/or calibration in the manner describedearlier for the fifth SPM probe 122-5. However, the particle removalstructure could also be used to heat the object 102 to a targettemperature during deposition of material on the object or removal ofmaterial from the object. In this case, the gas source of the fluidsystem 344 that provides the low viscosity high pressure gas to theinlet 332 of the particle removal structure would heat this gas to thetarget temperature. As a result, the heated gas travels through the duct340 and exits the outlet 336 so that the object is heated to the targettemperature. Similarly, the aperture 132 or the other outlets or inlets337 and 336 could also be used to heat or cool the object 102 in thesame way by introducing gas provided from the fluid system 344.

Similarly, the other components 123 of the SPM system 100 may include alocal heating source to locally heat the object 102 under the control ofthe controller 114. This heating source may do so with inductiveheating, flame heating, resistive heating, etc. Or, the SPM probe mayitself have an integrated heater 467 that comprises resistive orinductive heating elements 471 located in the probe which are controllerby the heater control circuit 466. Or, the heater source may comprise anexternal laser or flame source. Then, the gas source could cool the gasprovided through the aperture 132 or one of the outlets or inlets 335 to337 so that the cooled gas would be used to regulate the targettemperature of the object for deposition or removal of material.

Deposition of Diamond

In the case where DLC is deposited on the object 102 using the SPM probe122-12, the probe could also be used to grow diamond crystals at the DLCseed sites in the manner described earlier. In this case, the othercomponents 123 of the system would include a magnetic field source.

Thus, referring again to FIG. 72, the controller causes a valve 345 thatis connected to a tube 346 which is connected to the internal chamber135 of the scanning head 120 to be opened. As a result, the aperture 132is in fluid communication with a gas source of the fluid system 344 thatprovides methane and hydrogen or methane and argon. These gases areintroduced into the internal chamber and then flow through the apertureand into the differential pressure chamber caused in the gap 198. Thesegases may flow out of one of the outlets or inlets 335 to 337 to a gassink of the fluid system via a corresponding tube 346.

The controller 114 then causes the heater 467 to heat the gases. Asmentioned earlier, the heater may comprise resistive or inductiveheating elements 471 located at the surfaces 142 of the probe or anexternal laser or flame source that is one of the other components 123of the inspection and/or modification system. As a result, CVDdeposition of diamond occurs on the object such that polycrystallinediamond is grown at the seed sites provided by the DLC.

Structure of Aperture Plate 122-13

Referring to FIG. 56, there is shown a microstructured aperture plate(or probe) 122-9 with an aperture 132 and a gas bearing structure 402like the eighth SPM probe 122-8. In fact, the aperture plate isconstructed like the eighth probe, except that it does not include ane-beam tool 382.

Modifications Using Aperture Plate

Still referring to FIG. 57, the aperture plate 122-13 may be loaded ontoand unloaded from one of the scanning heads 120 in the same ways as weredescribed earlier for the first SPM probe 122-1. Furthermore, the SPMsystem 100 may include a scanning head 120 that contains a conventionalradiation source 410 within the housing 154 of the scanning head. Theradiation source may comprise an ion beam source, e-beam source, otherparticle beam source, xray source, or light source.

Referring to FIG. 1, the controller 114 controls the positioning system103 to position the probe 122-8 for a scan of the object 102. Turning toFIG. 57, at each scan point, the controller causes the radiation source410 to produce a selected kind of radiation. Similar to the e-beam andion beam produced by the SPM probes 122-8 and 122-11, the radiation inthis case travels through the aperture 132 of the aperture plate 122-13and strikes the object 102. In the case of an e-beam or an ion beam, theobject may be modified in the manner discussed earlier for the eighthand eleventh probes. The radiation may be steered in the mannerdescribed earlier for the eighth SPM probe 122-8 with steering magnets385 on the base 130 of the aperture plate and a steering coil 387 on theprobe holder 156 of the scanning head.

Inspections With Aperture Plate 122-13

Referring to FIG. 57, a conventional radiation detector 413 may beintegrated with the radiation source 410 to detect radiation reflectedand/or emitted by the object in response to the radiation produced bythe radiation source. For example, this radiation may be secondaryelectrons, ions, xrays, gamma rays, alpha particles, visible, infraredlight, and/or ultraviolet light.

Referring again to FIG. 1, in order to inspect the object 102 withradiation supplied by the radiation source 410, the controller 114controls the positioning system 103 to position the probe 122-8 for ascan of the object 102. At each scan point, the controller causes theradiation source 410 to produce radiation that strikes the object in themanner described earlier. The resulting radiation that is reflected oremitted in response passes through the aperture 132 of the apertureplate 122-13 and is detected by the radiation detector 413. Theradiation detector makes a measurement of the detected radiation at thisscan point and provides this measurement to the controller. Thecontroller collects all of the measurements over the scan and generatesan image and/or analyses of the object.

As those skilled in the art will recognize, the radiation source 410 andthe radiation detector 413 may be integrated to form a completeconventional SEM assembly that is housed by the housing 154 of thescanning head 120 and operated by the controller 114. In this case, theradiation source provides an e-beam and the radiation detector collectsthe resulting scattered electrons. Moreover, as will be discussed next,the SEM assembly can be operated with a microvacuum chamber created inthe gap 198 between the object 102 being inspected and the apertureplate 122-13 of the housing.

Vacuum Operation, Calibration, and Particle Removal Operation WithAperture Plate 122-13

Referring to FIGS. 1 and 57, during operation and/or calibration, amicrovacuum chamber in the gap 198 between the aperture plate and theobject 102 or calibration structure 128 may be established in any of theways described earlier for the eighth SPM probe 122-8 with the aperture132 and the gas bearing structure 342. As mentioned earlier for theeighth and eleventh SPM probes 122-8 and 122-11, when a large vacuumchamber 194 and high capacity vacuum pump 193 are used the object 102may be effectively irradiated with the radiation produced by theradiation source 410 without colliding with other particles in the gap.

Furthermore, as also discussed earlier, the object 102 may comprise asmall free moving or partially constrained specimen, such as amicromachine or biological cell or material, and a flat specimen supportstructure, such as microscope slide, on which the specimen is located.Thus, the diameter of the aperture 132 and the annular outlet 404 of thegas bearing structure 402 can be selected for a particular specimen. Asa result, the SPM system 100 may include multiple aperture plates withdifferent diameter annular outlets and apertures for different types ofobjects that are to be inspected or modified. In this way, each apertureplate is a detachable portion of the housing 154 so that the housing canbe fitted with different size annular outlets and apertures.

In addition, the particle removal structure 342 removes particles duringoperation and/or calibration in the manner described earlier for thefifth SPM probe 122-5. And, in an alternative embodiment, the apertureplate 122-13 may include gap sensors 164 like that described earlier forthe eighth SPM probe 122-8 rather than the gas bearing structure 402.

Referring to FIGS. 11 and 52, in the case where the radiation sourceprovides electromagnetic energy or charged particles, the position ofthe radiation source 410 can be calibrated using one or more of theradiation detection devices 460 in the same manner as that discussed forthe first, eighth, eleventh, and seventeenth SPM probes 122-1, 122-8,122-11, and 122-17. In the specific case where the radiation sourceprovides xrays, each of these radiation detection devices could includea thin metal window 469 on the aperture structure 466 and over theaperture. The metal window is used to block (or absorb) extraneouscharged particles and to block very low energy electrons, x-rays and allother electromagnetic energy of lower wavelength far UV through radiowaves.

Furthermore, In the case where the radiation source provides chargedparticles, its position can also be calibrated using one or more of theradiation detection devices 461 in the manner discussed earlier for theeighth and eleventh SPM probes. And, the reference materials 188, 189,and 458 could be used in the respective specific cases where theradiation source provides electrons, light, and ions.

Structure of SPM Probes 122-14 and 122-15

Turning now to FIG. 58, there is shown an embodiment for a fourteenthmicrostructured SPM probe 122-14 and a fifteenth microstructured SPMprobe 122-15. These probes are used to make SPM measurements of theobject 102 that are radiation measurements made with the radiationdetection tools 500 and 501 of respectively the fourteenth and fifteenthprobes. The fourteenth and fifteenth probes each include an aperture 132and gap sensors 164 that are formed in the base 130 of the probe in themanner described earlier for the first SPM probe 122-1. The base 130 hasthe same basic shape and construction as was described earlier for thefirst probe.

Referring to FIG. 59, each radiation detection tool 500 and 501 includesa support platform 502, such as a cantilever, that is suspended in thecorresponding aperture 132 of the tool. The support platform isconnected to the corresponding inner perimeter surface 134 of the base130 of the SPM probe 122-14 or 122-15 so that the tool is between theupper and lower surfaces 140 and 142 of the probe. The support platformmay be separately formed or may be an integral portion of the base. Eachradiation detection tool further includes an insulating plate 504 on thesupport platform that comprises an insulating material, such as silicondioxide. The radiation detection tools 500 and 501 are constructed likethe radiation detection devices 460 and 461 of the calibration structure128-2, except that their respective radiation detectors 463 and 464 areformed on the insulating plate and their aperture structure is formed onthe support platform.

Probe Loading and Unloading, Calibration, Vacuum Operation, and ParticleRemoval Operation of SPM Probes 122-14 and 122-15

Referring to FIG. 60, the fourteenth and fifteenth SPM probes 122-14 and122-15 may each be loaded onto and unloaded from one of the scanningheads 120 in the same ways as were described earlier for the first SPMprobe 122-1. And, each radiation detection tool 500 and 501 may have itsprofile examined in the manner discussed earlier for the first probe.Furthermore, optical images would be produced by the imaging optics 226during operation and/or calibration of each of the fourteenth,fifteenth, and sixteenth probes in the manner discussed earlier for thefirst probe. During operation and/or calibration of each of thefourteenth, fifteenth, and sixteenth probes, a microvacuum chamber inthe gap 198 between the probe and the object 102 or calibrationstructure 128 may be established in any of the ways described earlierfor the first probe with the aperture 132 and the gap sensors 164 of theprobe. Or, the fourteenth, fifteenth, and sixteenth probes may eachinclude instead a gas bearing structure 342 like that described earlierfor the eighth SPM probe 122-8. Finally, the fourteenth, fifteenth, andsixteenth probes could each also include a particle removal structure342 to remove particles during operation and/or calibration in themanner described earlier for the fifth SPM probe 122-5.

Inspections With SPM Probes 122-14 and 122-15

Referring to FIG. 60, the other components 123 of the SPM system 100 mayinclude a radiation source 512 and a radiation measurement circuit 514.The radiation source provides radiation. This radiation may beelectromagnetic energy, like visible light, ultraviolet light, infraredlight, xrays, gamma rays, and/or radio frequency waves, and/or chargedparticles, like ions, electrons, protons, and/or alpha particles.Alternatively, the radiation source may be in the form of light emittedby the SPM probe 122-17 in the manner discussed later.

Referring again to FIG. 1, in order to inspect the object 102 using oneof the radiation detection tools 500 or 501 of one of the SPM probes122-14 or 122-15, the controller 114 controls the positioning system 103to position the probe for a scan of the object 102. Turning to FIGS. 58to 60, at each scan point, the controller causes the radiation source512 or the SPM probe 122-17 to produce radiation that is directed at theobject. The resulting radiation that passes through the aperture 132 ofthe radiation detection tool is detected by the radiation detector 463or 464 of the tool. The radiation measurement circuit makes ameasurement of the detected radiation and provides it to the controller.This is done in the same manner as was described earlier for theradiation detection devices 460 or 461 depending on the kind ofradiation that is detected. Furthermore, the radiation measurementcircuit also grounds the aperture structure 466 to block extraneousradiation.

The selected radiation detection tool 500 or 501 of one of the SPMprobes 122-14 or 122-15 may be used to detect radiation reflected and/oremitted by the object 102. In this case, the probe and the radiationsource 512 or the SPM probe 122-17 would be positioned above the object.The controller 114 may then make an image and/or analysis of the objector a patterned image or analysis of the radiation reflected by theobject with the measurements received from the radiation measurementcircuit 514. This may be particularly useful for inspecting alithographic structure, such as a semiconductor fabrication mask. Inthis case, the controller may generate a patterned image of theradiation reflected by it and to which a replicable structure beingfabricated with the lithographic structure would not be exposed (i.e.,would be masked from).

Alternatively, the selected radiation detection tool 500 or 501 may beused to detect radiation that passes through the object 102. In thiscase, the SPM probe 122-14 or 122-15 would be positioned above theobject and the radiation source 512 or the SPM probe 122-17 would bepositioned below it. The controller 114 would then make a patternedimage or analysis of the radiation that the object projects (i.e.,allows to pass through it) from the measurements received from theradiation measurement circuit 514. This also may be useful forinspecting a lithographic structure by generating a patterned image ofthe radiation which a replicable structure would be exposed to by thelithographic structure.

Calibration of SPM Probes 122-14 and 122-15

The position of the radiation detection tools 500 and 501 of the SPMprobes 122-14 and 122-15 may be calibrated and their profiles examinedusing the AFM probe 131 and SEM probe 133 of the calibration structure128-1. This would be done in the manner discussed earlier for the firstSPM probe 122-1.

Referring to FIG. 60, the other components 123 of the SPM system 100 mayfurther include a radiation beam source 516 that is located at preciselyknown location with respect to the reference location of the SPM system.This radiation beam source may also be used in calibrating the positionof a selected radiation detection tool 500 or 501 of one of the SPMprobes 122-14 or 122-15.

Specifically, referring again to FIG. 1, the controller 114 calibratesthe position of the selected particle detection tool 500 or 501 bycontrolling the positioning system 103 to attempt to position the toolover the radiation beam source 516. Then, turning again to FIG. 60, thecontroller causes the radiation beam source to produce a radiation beam.The radiation beam may comprise a charged particle beam, such as ane-beam, ion beam, proton beam or alpha particle beam, or anelectromagnetic energy beam, such as a visible light beam, ultravioletlight beam, infrared light beam, gamma ray beam, xray beam, or radiofrequency beam. The controller analyses the measurement received fromthe radiation measurement circuit 514 to determine if the radiation beamis being detected by the radiation detection tool so that the radiationdetection tool is positioned over the radiation beam source. Thus, in aclosed feedback loop, the radiation detection tool is positioned, theradiation beam is produced, and the measurement from the energymeasurement circuit is analyzed until it is determined by the controllerthat the radiation detection tool is in fact positioned over theradiation beam source. Once this occurs, a positional offset is computedand the precise positioning of the radiation detection tool with respectto the reference location is then calibrated based on the positionaloffset in the manner described earlier.

Structure of SPM Probe 122-16

Turning now to FIG. 61, there is shown an embodiment for a sixteenthmicrostructured SPM probe 122-16 for use in making SPM measurements ofthe object 102 which are radiation measurements. The sixteenth probe isconstructed like the fourteenth SPM probe 122-14, except that theradiation detection tools 500 are replaced by the radiation detectiontools 520.

Referring to FIGS. 62 and 63, each radiation detection tool 520 includesa support platform 502 that is suspended in the corresponding aperture132 of the tool, as was described for each radiation detection tool 500.However, here, each radiation detection tool includes a tip 518 on thesupport platform. Formed in the tip, is a semiconductor radiationdetector 524.

In the embodiment of FIG. 62, the radiation detector comprises aradiation sensitive semiconductor junction diode that is formed in thetip 518. The core material 144 of the tip comprises a semiconductormaterial, such as silicon. The junction diode comprises an uppersemiconductor region 528 in the core material that is doped to be N or Ptype. It also includes a lower semiconductor region 530 in the sharp endof the core material that is oppositely doped P or N type to that of theupper semiconductor region. The lower and upper semiconductor regionsare doped using conventional techniques known to those skilled in theart and in the manner described in “Semiconductor Detectors” referencedearlier so that electromagnetic energy and/or charged particles can bedetected by the radiation detector.

An insulating coating is formed over the core material and etched toprovide the junction diode with insulating regions 532 and contact areasfor conductive contact regions 534 of each radiation detector 524. Theentire tip is coated with a conductive coating, such as tungsten, gold,aluminum, or indium tin oxide or silicon carbide, carbon nitride, ordiamond that is doped to be conductive in the manner described earlier.This conductive coating is then etched to form the conductive contactregions which each contact a corresponding one of the upper and lowersemiconductor regions. In doing so, the conductive coating may beremoved or rubbed off from the sharp end of the tip. Or, if theconductive coating is a sufficiently light, it may pass an adequateamount of radiation without being removed. Moreover, if the conductivecoating is transparent to radiation, such as silicon carbide, carbonnitride, or diamond, then it need not be removed at all and can alsoserve as an obdurate coating for the tip. And, in the case where theconductive coating is not an obdurate material, such as gold, aluminum,indium tin oxide, or tungsten, each radiation detector 524 may includean additional obdurate coating 538, like silicon carbide, carbonnitride, diamond like carbon, or diamond, that would be deposited overthe entire tip. This is done in the manner described earlier for thefirst to third SPM probes 122-1 to 122-3. But, this obdurate coating isthin enough to be transparent to the radiation directed at the tip. As aresult, a radiation sensitive PN or NP junction diode is formed. Thistype of radiation detector is further described in U.S. patentapplication Ser. Nos. 08/906,602 and 08/776,361 referenced earlier.

Referring to FIG. 63, in alternative embodiment, the semiconductorradiation detector 524 comprises a radiation sensitive junctiontransistor that is formed in the tip 518. In this case, the junctiontransistor includes a semiconductor base region 527, a semiconductorcollector region 529, and a semiconductor emitter region 529 in the corematerial 144. The base, collector, and emitter regions respectively formthe base, collector, and emitter of the junction transistor. The baseregion is oppositely doped N or P type from the P or N type doping ofthe collector and emitter regions. And, the base, collector, and emitterregions are each contacted by a corresponding one of the contact regions534 that are formed between the insulating regions 532. This results inthe tip having a radiation sensitive PNP or NPN junction transistor fordetecting radiation directed at the tip. Otherwise, the radiationdetector is constructed in the same manner as that described for theembodiment of FIG. 62.

Probe Loading and Unloading, Calibration, Inspection Operation, VacuumOperation, and Particle Removal Operation of SPM Probe 122-16

The sixteenth SPM probe 122-16 may be loaded onto and unloaded from oneof the scanning heads 120 in the same ways as were described earlier forthe first SPM probe 122-1. And, the tip 518 of each of the radiationdetection tool 520 may be activated, deactivated, and have its positioncalibrated and profile examined in the ways described earlier for thefirst probe, except that its position would not be calibrated using STMand radiation measurements. Moreover, these tools (and their tips) mayhave their positions calibrated and may be used to detect radiation inthe same manner as was described earlier for the radiation detectiontools 500 for the fourteenth SPM probe 122-14. And, optical images wouldbe produced by the imaging optics 226 during operation and/orcalibration of the sixteenth probe in the manner discussed earlier forthe first probe. During operation and/or calibration of the sixteenthprobe, a microvacuum chamber in the gap 198 between the probe and theobject 102 or calibration structure 128 may be established in any of theways described earlier for the first probe with the aperture 132 and thegap sensors 164 of the probe. Or, the sixteenth probe may includeinstead a gas bearing structure 342 like that described earlier for theeighth SPM probe 122-8. Finally, the sixteenth probe could also includea particle removal structure 342 to remove particles during operationand/or calibration in the manner described earlier for the fifth SPMprobe 122-5.

SPM Modifications With SPM Probe 122-16

As mentioned earlier, the radiation detector 524 of each radiationdetector tool 520 of the SPM Probe 122-16 may comprise an obduratecoating 534 or 538 on the tip 518 of the tool. Thus, such a radiationdetector may be formed in the tips 138, 238, and 320 of the first,second, and fifth to seventh SPM probes 122-1, 122-2, and 122-5 to122-7. In this case, these tips could be used not only to modify theobject in the manner described earlier, but could also be used toinspect the object 102 and have their positions calibrated in the samemanner as was just described. In addition, since this radiation detectoris photosensitive (i.e., sensitive to visible light), they could be usedto detect the buildup of opaque debri particles on the tips. These debriparticles comprise particulate material removed from the object duringthe modifications performed with the tips.

Specifically, this would be done by monitoring the visible lightdetected by the radiation detector 524 in the tip 138, 238, or 320 withthe energy measurement circuit 514. When, the radiation detector noloner detects a certain predefined threshold of visible light, thismeans too many debri particles have been accumulated on the surface ofthe tip. Then, another tip of the corresponding SPM probe 122-1, 122-2,122-5, 122-6, or 122-7 is used, the tip is cleaned, or the probe isdiscarded in the manner discussed earlier.

Structure of SPM Probe 122-17

Turning now to FIG. 64, there is shown a seventeenth microstructured SPMprobe 122-17 for use in making SPM measurements of the object 102. Here,the SPM measurements are radiation measurements made in response toradiation directed at the object which is in the form of light. To doso, the seventeenth probe includes light emission tools 540 to directthe light at the object. Each light emission tool is suspended in acorresponding aperture 132. The seventeenth probe also has gap sensors164 like the first SPM probe 122-1 and a base 130 that is constructedand has the same shape like that of the first probe.

As shown in FIG. 65, each light emission tool 540 comprises a supportplatform 502 like each radiation detection tool 520. However, each lightemission tool comprises a tip 542 that emits light. The core material144 of the tip comprises a semiconductor material, such as silicon. Thecore material is coated with an emissive coating 544 at a thickness ofapproximately 10 to 200 nanometers. This emissive coating may comprisegallium nitride, gallium arsenide, or silicon carbide which is suitablydoped to be emissive. A conductive coating 534 is deposited over theemissive coating and has a thickness of approximately 20 to 200nanometers. This conductive coating may be tungsten, gold, aluminum, orindium tin oxide or silicon carbide, carbon nitride, or diamond that isdoped to be conductive in the manner described earlier. About 5 to 10nanometers of the conductive coating at the sharp end of the tip may bemade sufficiently thin so that it is transparent to blue and/or UV lightor can be removed or rubbed off from the sharp end of the write tip.This forms an aperture at the sharp end of the tip with a diameter inthe range of approximately 5 to 100 nanometers.

The other components 123 of the SPM system 100 may include a lightemission control circuit 548. When a voltage of about 4 volts is appliedacross the conductive coating and core material by the light emissioncontrol circuit, blue (e.g., 423 nanometer wavelength) and/orultraviolet (UV) light (e.g., 372 nanometer wavelength) is emitted bythe emissive coating as described in “Deposition, Characterization, andDevice Development in Diamond, Silicon Carbide, and Gallium Nitride ThinFilms” referenced earlier. The light propagates through the corematerial until it is emitted at the aperture. The aperture has adiameter substantially smaller than the wavelength of the light.

Additionally, in the case where the conductive coating is not anobdurate material, such as conductive diamond, silicon carbide, orcarbon nitride, the tip may also include an obdurate coating 538 of thekind described earlier for the tip 518 of the radiation detection tool520 of FIG. 62. Furthermore, the light emission tool 540 of theembodiment of FIG. 65 is further described in the U.S. patentapplication Ser. Nos. 08/906,602, 08/776,361, and 08/506,516 and PCTPatent Application No. PCT/US96/12255 referenced earlier.

In an alternative embodiment shown in FIG. 66, the core material of eachtip 542 of each light emission tool 540 is comprised of silicon. Thelower region 547 of the core material at the sharp end of the tip isporous. This is accomplished by immersing the core material of the tipin a dilute solution of Hydrofluoric acid or a dilute solutionHydrofluoric and Nitric acid and operating the tip as an anode. Inaddition, a gold or platinum cathode is also immersed in the solution. Acurrent is then produced between the anode and cathode which issufficient to porously etch the lower region of the core material at thesharp end of the tip but leave the upper region 549 of the core materialunetched. The insulating regions 532 and the contact regions 534 of thetip are then formed. This is done in the same manner as discussedearlier for the tip 518 of the embodiment of the radiation detectiontool 520 of FIG. 62. To form an aperture at the sharp end of the tip,about 5 to 10 nanometers of the contact region at the sharp end may bemade sufficiently thin so that it is transparent to light or can beremoved or rubbed off from the sharp end of the tip. Thus, when avoltage is applied across the conductive coating and core material ofeach tip by the light emission light control circuit 548, a current isproduced in the porous lower region which causes it to emit lightthrough the aperture of the tip.

In the case where the conductive coating is not an obdurate material,such as conductive diamond, silicon carbide, or carbon nitride, the tip542 may also include an obdurate coating 538 of the kind describedearlier for the tip 518 of the radiation detection tool 520 of FIG. 62.The light emission tool 540 of the embodiment of FIG. 66 is furtherdescribed in U.S. patent application Ser. No. 08/506,516 and PCT PatentApplication No. PCT/US96/12255 referenced earlier. Furthermore, lightemission by porous silicon is further described in An ImprovedFabrication Technique for Porous Silicon, Review of ScientificInstruments, v64, m2 507-509 (1993), Photoluminescence Properties ofPorous Silicon Prepared by Electrochemical Etching of Si EpitaxialLayer, Act. Physics Polonica A, v89, n4, 713-716 (1993), Effects ofElectrochemical Treatments on the Photoluminescence from Porous Silicon,Journal of the Electrochemical Society, v139, n9, L86-L88 (1992),Influence of the Formation Conditions on the Microstructure of PorousSilicon Layers studied by Spectroscoric Ellipsometry, Thin Solid Films,v255, n1-2; 5-8 (1995), and Formation Mechanism of Porous Si LayersObtained by Anodization of Mono-Crystalline N-type Si in HF Solution andPhotovoltaic Response in Electrochemically Prepared Porous Si, SolarEnergy Materials and Solar Cells, v26, n4, 277-283, which are herebyexplicitly incorporated by reference.

Additionally, referring to FIG. 67, the seventeenth probe includes acorresponding vacuum pump 424 formed in the base 130 of the probe foreach light emission tool 540. This vacuum pump is formed like thatdescribed earlier for the fluid delivery tools 414 of the ninth SPMprobe 122-9, except that it includes an outlet valve 560 instead of thecheck valve 430. As will be described in greater detail later, thevacuum pump is used to create a microvacuum chamber in the gap 198between the upper surface 166 of the object 102 and the lower surface142 of the base of the seventeenth probe. In an alternative embodiment,one vacuum pump could be used for all of the light emission tools.

The outlet valve 560 is disposed between the pumping chamber 428 and theoutlet 426. The outlet valve includes a sealing plate 562 that extendsacross the outlet and floats between the stops 564 and the sealing seats566 of the outlet valve that are formed in the base 130. The outletvalve further includes sealing arms 568 that extend out from the sealingplate. The sealing plate and the sealing arms may be integrally formedtogether. The outlet valve also includes an insulating plate 570 on theinner surface of the outlet and plate electrodes 572 on the insulatingplate. The plate electrode may comprise a conductive material, such aspolysilicon or tungsten, and the insulating plate may comprise aninsulating material, such as silicon dioxide. The sealing plate may beintegrally formed with the base and comprises a conductive semiconductormaterial. Thus, in order to close the outlet valve, the pumping controlcircuit 444 applies an appropriate voltage across the sealing seats andthe plate electrodes. This causes the sealing plate to move toward thesealing seats so that the sealing arms are seated against the sealingseats. This seals the pumping chamber from the outlet. As those skilledin the art will recognize, the valve just described may be used in theSPM probes 122-9 to 122-12 in place of the check valve 430.

Each light emission tool 540 further includes an inlet duct 422 thatconnects the aperture 132 and the inlet 425 of the pump 424. In thisway, the pump and the aperture are in fluid communication so that thepump can create a microvacuum chamber in the gap between the object andthe base 130 of the seventeenth SPM probe 122-17.

In addition, the support platform 502 of each light emission tool 540 isconnected to the base 130 of the SPM probe 122-12 and suspended in theaperture 132 of the base within the corresponding inner perimetersurface 134 of the base. This is done so that the tip 542 of the lightemission tool is kept between the lower and upper surfaces 142 and 140of the base while not in operation to prevent it from being damaged. Thesupport platform may be separately formed or may be an integral portionof the base. Each light described earlier for the gap sensors 164 of thefirst SPM probe 122-1 to actuate the tip of the light emission tool foroperation.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, and Particle Removal Operation of SPM Probe 122-17

Referring to FIG. 67, the seventeenth SPM probe 122-17 may be loadedonto and unloaded from one of the scanning heads 120 in the same ways aswere described earlier for the first SPM probe 122-1. And, the tip 542of each of the light emission tools 540 may have its position calibratedand profile examined in the ways described earlier for the first probe,except that STM and radiation measurements would not be used tocalibrate its position. The activation and deactivation of the tip maybe done using the tip actuator 162 and deflection sensor 161 and the tipactivation control circuit 176. The tip activation control circuitoperates under the control of the controller 114 and like the gapcontrol circuit 176 described earlier in activating the tip and sensingdeflection of the cantilever 502. Moreover, the position of the tip maybe calibrated using the radiation detectors 460 and the referencematerials 189 of the calibration structure 128-2 in the same manner aswas described earlier for the SPM tools 137 of the first SPM probe122-8. Furthermore, optical images would be produced by the imagingoptics 226 during operation and/or calibration of the sixteenth probe inthe manner discussed earlier for the first probe. Finally, theseventeenth probe could also include a particle removal structure 342 toremove particles during operation and/or calibration in the mannerdescribed earlier for the fifth SPM probe 122-5.

Vacuum Operation of SPM Probe 122-17

Still referring to FIG. 67, during operation and/or calibration of theseventeenth SPM probe 122-7, a microvacuum chamber in the gap 198between the lower surface 142 of the base 130 of the probe and the uppersurface 166 of the object 102 or calibration structure 128 may beestablished using the vacuum pump 424 in the base. In order to do so, ateach scan point, the controller 114 first controls the pumping controlcircuit 444 to close the outlet valve 560 in the manner describedearlier. Then, the controller controls the pumping control circuit tocause the pump to pump the ambient gas that is in the gap into thepumping chamber 428. In doing so, the pumping chamber is expanded sothat the ambient gas is drawn into the aperture 132, through the duct422, and into the pumping chamber 428 via the inlet 425. This is done inthe same way as was described earlier for pumping fluid material intothe pumping chamber of a pipette tool 446 of the SPM probe 122-10.

Then, at each scan point after the pumping chamber 428 is filled withambient gas, the controller 114 causes the ambient fluid in the pumpingchamber to be pumped out of the outlet 426. This is done by firstcontrolling the pumping control circuit 444 to open the outlet valve 560in the manner discussed earlier. Then, the controller controls thepumping control circuit to cause the pumping chamber to contract back toits normal volume. In other words, a suitable voltage is applied acrossthe membrane 440 and the plate electrode 442 so that the membrane isreturned to its normal position. This increases the pressure of theambient gas in the pumping chamber so that it travels through the outletvalve and out of the outlet 426.

Additionally, this is done under the same conditions and assumptions aswas described earlier for the SPM probe 122-1 for creating such amicrovacuum chamber. Moreover, referring to FIG. 64, the gap sensors 164are used in the same manner as was described earlier in order to set theappropriate width of the gap.

Alternatively, the microvacuum chamber in the gap 198 may be establishedin any of the ways described earlier for the first SPM probe 122-1. Or,the seventeenth probe may include instead a gas bearing structure 342like that described earlier for the eighth SPM probe 122-8. Conversely,the vacuum pump 424 could be used in any of the other SPM probes 122-1to 122-16 and 122-18 described herein to create such a microvacuumchamber.

Inspections With SPM Probe 122-17

Referring again to FIG. 1, in order to inspect the object 102 using aselected light emission tool 540 of the SPM probe 122-17, the controller114 controls the positioning system 103 to position the probe for a scanof the object 102. Turning to FIGS. 64 to 67, at each scan point, thecontroller controls the light emission control circuit 548 to cause thelight emission tool to produce light that is directed at the object inthe manner just discussed. The energy measurement system 389 or one ofthe SPM probes 122-14, 122-15 and 122-16 then makes a measurement of theradiation that is reflected and/or emitted by the object or the lightthat is projected by the object in response to this produced light. Thisradiation measurement may be an NSOM measurement of the kind describedearlier for the SPM probe 122-1. Moreover, the radiation measurementsthat are collected may be used to generate an analysis or a patternedimage of the radiation reflected by the object or the light projected bythe object in the manner discussed earlier for the radiation detectiontools 500, 501, and 520 for the SPM probes 122-14, 122-15 and 122-16.

SPM Inspections and Modifications With SPM Probe 122-17

As mentioned earlier, each light emission tool 540 of the SPM Probe122-17 may comprise an obdurate coating 534 or 538 on the tip 542 of thetool. Thus, this tip could be used like one of the tips 138, 238, and320 of the SPM probes 122-1, 122-2, and 122-5 to 122-7 for modifying theobject in the manner described earlier for the SPM probes 122-1, 122-2,and 122-5 to 122-7. But, it could also be used to inspect the object 102in the manner described for the SPM probes 122-1 and 122-2. In thiscase, the deflection sensor 161 and the tip activation control circuit176 would be used in the manner discussed earlier to sense deflection ofthe cantilever 502 or 136 of the tools of these probes. Moreover, thecantilever deflection measurement system 205 described earlier could beused if the light used is transparent to the base 130 of the probe andthe cantilever includes a reflective material, such as gold, tungsten,or aluminum, to reflect the light.

Structure of SPM Probe 122-18

Turning now to FIG. 68, there is shown an eighteenth microstructured SPMprobe 122-18 for use in making SPM modifications to the object 102.Here, the eighteenth probe includes heater tools 550 to heat the object.Each heater tool is suspended in a corresponding aperture 132.Otherwise, the eighteenth probe is constructed like the first SPM probe122-1.

Referring to FIG. 69, each heater tool 550 includes a support platform502, such as a cantilever, like the radiation detection tools 520 of theSPM probe 122-16. On the support platform is a tip 552. The corematerial 144 of the tip is coated with a resistive coating 554, such asNichrome, Tungsten, or doped Silicon. Thus, when a voltage is appliedacross the resistive coating by the heater control circuit 556, theresistive coating generates heat which can be used to heat the object102. The heater control circuit is one of the other components 123 ofthe SPM system 100.

Probe Loading and Unloading, Tip Activation and Deactivation,Calibration, Vacuum Operation, and Particle Removal Operation of SPMProbe 122-18

Referring to FIG. 70, the eighteenth SPM probe 122-18 may be loaded ontoand unloaded from one of the scanning heads 120 in the same ways as weredescribed earlier for the first SPM probe 122-1. And, the tip 552 ofeach of the heater tools 550 may be activated, deactivated, and have itsposition calibrated and profile examined in the ways described earlierfor the first probe, except that radiation measurements would not beused to calibrate its position. Furthermore, optical images would beproduced by the imaging optics 226 during operation and/or calibrationof the eighteenth probe in the manner discussed earlier for the firstprobe. During operation and/or calibration, a microvacuum chamber in thegap 198 between the eighteenth probe and the object 102 or calibrationstructure 128 may be established in any of the ways described earlierfor the first probe with the apertures 132 and the gap sensors 164 ofthe eighteenth probe or with the vacuum pump 424 of the seventeenth SPMprobe 122-17. Finally, the eighteenth probe could also include aparticle removal structure 342 to remove particles during operationand/or calibration in the manner described earlier for the fifth SPMprobe 122-5.

SPM Modifications With SPM Probe 122-18

Referring again to FIG. 1, as mentioned earlier, the SPM probe 122-18may be used to modify the object 102. This is done by heating thematerial of the object to plastically deform it, chemically change it,change its crystalline state, or weld it and another material together.In doing so, the controller 114 controls the positioning system 103 toperform a scan of the object. At each scan point, the controllercontrols the positioning system to lower the activated tip 552 of aselected heating tool 550 of the probe to a target area of the object.Then, referring to FIG. 70, the controller controls the heating controlcircuit 556 to cause the tip 552 to heat the object in the mannerdiscussed earlier.

Other SPM Probes 122

Referring back to FIG. 1, the SPM system 100 may also include otherconventional SPM probes 122 to make SPM modifications and/or SPMmeasurements. For example, these probes may include a conventional MAFM(magnetic AFM) probe, a conventional LAFM (lateral AFM) probe, anelectrical field strength probe used to respectively detect the magneticfield strength, the lateral force, and the electric field strength ofthe object at each scan point of a scan of the object controlled by thecontroller 114. In this case, the other components 123 of the SPM systemwould include an MAFM measurement circuit, an LAFM measurement circuit,and an electric field measurement circuit that respectively provideMAFM, LAFM, and electric field strength measurements of the magneticfield strength, the lateral force, and the electric field strength tothe controller at each scan point.

Such an SPM probe 122 would be constructed similar to that described forthe first SPM probe 122-1 and may be loaded onto and unloaded from oneof the scanning heads 120 in the same ways as were described earlier forthe first probe. And, this probe may have its position calibrated andprofile examined in the ways described earlier for the first probe.Furthermore, optical images would be produced by the imaging optics 226during operation and/or calibration of this probe in the mannerdiscussed earlier for the first probe. During operation and/orcalibration, a microvacuum chamber in the gap 198 between this probe andthe object 102 or calibration structure 128 may be established in any ofthe ways described earlier for the first probe with apertures 132 andgap sensors 164 or with the vacuum pump 424 of the seventeenth SPM probe122-17. Finally, this probe could also include a particle removalstructure 342 to remove particles during operation and/or calibration inthe manner described earlier for the fifth SPM probe 122-5.

In addition, in the case of an MAFM probe, the probe would be particularuseful in performing precision repairs and/or fabrication steps of athin film magnetic read/write head or other magnetic structure. Inparticular, the magnetic properties of a gap (or groove) between thewrite and/or read poles of the thin film magnetic material can beprecisely characterized (i.e., measured) using this probe. Thus, thisgap may be formed and/or repaired in an iterative process using this SPMprobe to measure the magnetic field strength of the gap at differentscan points during each iteration and using the SPM probes 122-5 to122-7 described earlier to physically form and/or modify the gap duringeach iteration. This is repeated until the desired magnetic propertiesof the gap are achieved.

Alternative Embodiments for SPM System 100

Referring to FIG. 71, there is shown another embodiment of the SPMinspection and/or modification system 100. As with the earlierembodiment of FIG. 1, the system includes a controller 114, one or morescanning heads 120, and a positioning or movement system 103 for movingthe scanning heads and the object 102 with respect to each other.

As shown in FIG. 72, the movement system 103 includes a supportstructure 600. Each scanning head 120 is fixed to the support structurewith a corresponding support arm 602 of the movement system. The object102 is mounted to a motor 604 of the movement system which is itselfmounted to the support structure. The motor rotates the object 102 underthe control of the controller 114 so that the object rotates through thescanning heads.

In this embodiment, each scanning head 120 includes one or more matchingsurfaces 142 that are correspondingly shaped to match the outer surfaces166 of the object 102. Furthermore, each scanning head may include oneof the SPM probes 122-1 to 122-18 described earlier. This probe isembedded, mounted, or loaded in the scanning head and provides at leastone of the matching surfaces of the scanning head.

Each scanning head 120 also includes an internal chamber 135. As in theearlier embodiment of FIG. 1, the internal chamber is connected to thefluid system 344 of the inspection and/or modification system 100 viathe corresponding tubes 345. Each tube is connected to a gas or vacuumsource of the fluid system via a corresponding valve 345 of the fluidsystem.

As indicated previously, each of the SPM probes 122-1 to 122-18 includesan aperture 132. This aperture is connected to and in fluidcommunication with the internal chamber 135 of the scanning head 120. Inaddition, the aperture forms an aperture in one of the matching surfaces142. Thus, a microdifferential pressure zone can be formed in the gap198 between the outer surfaces 166 of the object 602 and the matchingsurfaces 142 of the scanning head in a similar manner to that describedearlier for SPM probe 122-1.

Specifically, in order to do so, the controller 114 causes the valve 345that is connected to a corresponding tube 346 which is connected to theinternal pressure chamber 135 to be opened. As a result, the aperture132 is in fluid communication with the gas or vacuum source of the fluidsystem 344 via the corresponding tube and the internal pressure chamber.This causes a microdifferential pressure chamber to be formed in the gap198 in the manner discussed earlier for the SPM probe 122-1 under theconditions specified.

The inspection and/or modification system 100 may be used in a varietyof applications. As mentioned earlier, this may be done in order tomodify and/or inspect the object in any of the ways discussed earlierwith the SPM probes 122-1 to 122-18. In order to do so, the system mayinclude other components 123 like the embodiment of FIG. 1.

For example, material may be deposited on the object 102. In this case,one scanning head 120 may include the SPM probe 122-12. The controller114 first causes a microvacuum chamber to be created in the gap 198between the surfaces 166 and 142 of the object and the scanning head.This is done in the manner just described. Then, the controller 114 thecauses the object to be rotated through the scanning head and causes theprobe to deposit material on the object in a desired location in themanner discussed earlier using a vacuum arc tool 470 of the probe.

Referring back to FIG. 71, in the case where DLC is deposited on theobject 102, an additional scanning head 120 could be used for CVD (i.e.,chemical vapor deposition) deposition of diamond on the object. In thiscase, the scanning head simply includes the aperture plate 122-13described earlier. The aperture plate would be used to grow diamondcrsytals at the DLC seed sites in the manner described earlier for theSPM probe 122-12. In this case, the other components 123 of the systemwould include a magnetic macroparticle filter.

Thus, referring again to FIG. 72, the controller causes a valve 345 thatis connected to a tube 346 which is connected to the internal chamber135 of the scanning head 120 to be opened. As a result, the aperture 132is in fluid communication with a gas source of the fluid system 344 thatprovides methane and hydrogen or methane and argon. These gases areintroduced into the internal chamber and then flow through the apertureand into the differential pressure chamber caused in the gap 198. Thesegases flow out of the annular outlet 404 of the aperture plate to a gassink of the fluid system via a corresponding tube 346. The controller114 then causes the object to be rotated through the scanning head andcontrols the heater circuit 466 to cause the heater 467 to heat thegases. As mentioned earlier, the heater may comprise resistive orinductive heating elements 471 located at the surfaces 142 of thescanning head or an external laser or flame source that is one of theother components 123 of the inspection and/or modification system. As aresult, CVD deposition of diamond occurs on the object such thatpolycrystalline diamond is grown at the seed sites provided by the DLC.

Furthermore, referring again to FIG. 71, an additional scanning head 120could be used for inspecting the object before or after the depositionof the material on the object 102. Referring to FIG. 72, for example,the scanning head 120 may include the SPM probe 122-8 discussed earlier.The controller 114 would then cause SEM measurements of the object to bemade using the e-beam tool 382 of this probe in the manner discussedearlier. These SEM measurements would then be used by the controller togenerate the kinds of inspection results mentioned earlier.

Then, referring again to FIG. 71, another scanning head 120 could beused to make modifications to the object 102 based on the inspectionresults. Turning to FIG. 72, this scanning head could include the SPMprobe 122-5 mentioned earlier. The controller 114 would then cause cutsto be made in the object with a cutting tool 350 of the probe in orderto remove portions of the unwanted material that was deposited.

Thus, in the embodiment shown in FIG. 72, a rotatable object 102, suchas a circular saw blade or rock or concrete cutting blade, could becoated with material in the manner just discussed by rotating it throughone or more scanning heads 120. Thus, the inspection and/or modificationsystem 100 could be integrated into an entire saw or cutting systemwhere the movement system 103 is also used to rotate the blade fornormal operation in sawing or cutting another object. However, thoseskilled in the art will recognize that other embodiments also exist.

For example, the inspection and/or modification system 100 could beintegrated into a band saw system. In this case, the movement system 103would normally rotate the band saw blade for sawing an object and wouldalso be used to move the band saw blade with respect to the scanningheads.

Alternatively, the movement system 103 may comprise a tape or disk onwhich knife or razor blades could be mounted. The movement system wouldthen rotate the tape or disk so that the knife or razor blades passthrough the scanning heads.

Referring to FIG. 73, each scanning head 120 could comprise separatestationary and moveable pieces 120-A and 120-B in order to provide adifferential pressure chamber for a complex shaped object 102, such as awood saw blade. In this case, the stationary piece 120-A is fixed to thesupport structure 600 with the support arm 602. The movement systemfurther comprises an adjustable support arm 606. The controller 114causes the movement system 103 to move the object 102 in place next tothe stationary piece. It then causes the adjustable support arm to movethe moveable piece 120-B so that it is locked in place with thestationary piece around the object.

Finally, in the embodiment of FIG. 71, the scanning heads 120 were shownas being separate. However, those skilled in the art will recognize thatsuch scanning heads may be integrated into one large scanning head withseparate sections for performing desired inspections and/ormodifications.

Software and Hardware of Controller 114 of SPM System 100

Turning now to FIG. 74, the controller 114 of the SPM system 100includes a CPU (central processing unit) 650, a memory 652, and the userinterface 116 discussed earlier. The user interface includes a display653, and user input devices 654, such as a mouse 656 and a keyboard 658.The memory stores an operating system 660, a scanning controller 662,and a GUI (graphical user interface) 664 that are all executed on theCPU. The operating system controls and coordinates execution of thescanning controller and the GUI in response to commands issued by a userwith the user input devices 654.

The scanning controller 662 controls the operation of the SPM system 100in the manner discussed earlier. Specifically, it controls the making ofthe earlier described SPM measurements and SPM modifications with theSPM probes 122 and the other components 123 of the SPM system. In doingso, the scanning controller collects the SPM measurements made andprovides them as measurement data to the GUI 664 for display on thedisplay 653.

Controlling Positioning System to Create Drive Vectors in X, Y, and ZDimensions

The scanning controller 662 controls the operation of the positioningsystem 103 shown in FIG. 1. In doing so, the scanning controller canindividually drive the X, Y, and Z piezoelectric drives of the roughpositioning system 104 and can individually drive the X, Y, and Zpiezoelectric drives of each fine positioning system 106.

In order to perform the SPM measurements of the kind described earlier,the scanning controller 662 controls positioning of the SPM probes 122-1to 122-4 and 122-8 to 122-18 that are used to make SPM measurements inthe conventional way. This involves moving such a probe from scan pointto scan point with respect to the object 102 by only driving thepositioning system 103 in one of the X, Y, and Z dimensions at a timeduring the scan. Specifically, in order to position the tip of such aprobe, the positioning system is driven in only the X dimension or onlyin the Y dimension in order to move from one scan point to another scanpoint. Moreover, the positioning system is not driven in the Z dimensionsimultaneously while it is driven in the X or Y dimension. Instead, thepositioning system is under the servo (i.e., feedback) control of thescanning controller in the Z dimension. As a result, positioning of sucha probe in the Z dimension is done separately at each scan point. Thisis typically done in order to prevent the tip of the probe from crashinginto the object 102.

However, in order to perform the SPM modifications of the kind describedearlier where cutting or milling of the object is performed, thescanning controller 662 controls positioning of the SPM probes 122-1,122-2, and 122-5 to 122-7 that are used to make SPM measurements in theconventional way. This involves moving such a probe with respect to theobject 102 by driving the positioning system 103 in all three of the X,Y, and Z dimensions simultaneously to perform the cutting or millingoperation. Thus, the motion of the tip of such a probe can be driven ina series of 3-D (three dimensional) vectors to pass through the loci ofselected motion. This means that the entire cutting or positioningmotion of the tip of the probe can be a series of 3-D vectors defining alarger 3-D vector, arc, curve, or surface.

This process is also applicable to performing the sweeping motionsdescribed earlier for SPM probe 122-5. In this way, 2-D or 3-D sweepingmotions can be performed for sweeping away debris particles that arecaused by modifications made with the SPM probes 122-1, 122-2, and 122-5to 122-7.

Rendering Multiple Sets of Measurement Data as an Overlay Image

The GUI 664 may be used to render multiple sets of measurement datatogether as a 3-D (three dimensional) overlay image on the display 653.Each set of measurement data comprises SPM measurements of an object 102made with the SPM system 100. Each measurement comprises a measurementdata point that is three or more dimensional and includes acorresponding value for each dimension.

Specifically, each data point in the sets of measurement data includes Xand Y coordinate values that represent respective locations inperpendicular X and Y dimensions. These coordinate values togetherrepresent a corresponding location in an XY plane. Thus, the sets ofmeasurement data are related by the fact that they have data points withcommon coordinate values that represent common locations in the XYplane. Each data point in the sets of measurement data also includes ameasurement value that represents a measurement for a predefinedmeasurement parameter at the corresponding location in the XY plane. Themeasurement parameter is also considered as one of the dimensions ofeach data point.

The measurement parameter for the data points of one set of measurementdata may be different from the measurement parameter for the data pointsof the other set of measurement data. For example, the measurementparameter for one set of measurement data may be the height of aselected object 102 while the measurement parameter for the other set ofmeasurement data may be the magnetic field strength, the electricalfield strength, or the material composition of the same object.Alternatively, the measurement parameter for the another set ofmeasurement data could be the height of a comparable object, such as amodified version of the selected object.

More specifically, one set of measurement data may comprise AFMmeasurement data for a selected object 102. In this case, each datapoint in the AFM measurement data includes X and Y coordinate valuesthat together represent a corresponding location in the XY plane of theobject. Each data point of the AFM measurement data also includes ameasurement value representing an AFM measurement of the height of theobject at the corresponding location in the XY plane. This height is inthe Z dimension that is perpendicular to the XY plane. Furthermore,these AFM measurements are made with one of the SPM probes 122-1 to122-4 in the manner discussed earlier. As is evident here, thepredefined measurement parameter for the data points of the AFMmeasurement data is the height of the object in the Z dimension.

Similarly, the another set of measurement data may comprise MAFMmeasurement data for the same object 102. Like the AFM measurement data,each data point in the MAFM measurement data includes X and Y coordinatevalues that together represent a corresponding location in the XY planeof the object. And, the measurement value of each data point of the AFMmeasurement data represents an MAFM measurement of the magnetic fieldstrength of the object at the corresponding location in the XY plane.This MAFM measurement is made with one of the conventional SPM probes122 in the manner discussed earlier. In this case, the predefinedmeasurement parameter for the data points of the MAFM measurement datais the magnetic field strength of the object.

In order to render the two sets of measurement data as an overlay imageon the display 653, the user first issues commands with one or more ofthe user input devices 654 in order to select the surface imagegenerator 666 and the image overlay generator 668 of the GUI 664. Thesecommands are received by the CPU 650 and the operating system 660 inresponse causes the surface image generator, the image overlaygenerator, and a GUI controller 669 to be executed.

The GUI controller 669 of the GUI 664 generates control image datarepresenting an interactive image of a control dialog box 689, as shownin FIG. 75. This interactive image is displayed by the display 653 inresponse to the control image data. The overlay image may be rendered inseveral ways by the image overlay generator. Each of these ways may beselected by the user with one or more of the user input devices 654using the interactive image of the control dialog box.

For example, the user may desire to have a first set of measurement dataand a second set of measurement data rendered as an overlay image 690 asshown in FIGS. 75 and 76. Here, the overlay image is of a first surface692 representing the first set of measurement data separately overlaidon a second surface 692 representing the second set of measurement dataor vice versa. Referring also to FIG. 74, the user of the SPM system 100may use one of the input devices 654 to select the separate surfacesimage generator 670 of the image overlay generator 668 in order todisplay the two sets of measurement data together in this way.

The user does so by issuing corresponding commands with one or more ofthe user input devices 654 using the image of the control dialog box689. For the each of the first and second surfaces 692 and 694, thesecommands include a command to select the surface in the active layerselection box 696 of the control dialog box, a command to selectseparate surfaces in the separate surfaces box 695 of the control dialogbox, a command to select translucency or opacity (by not selectingtranslucency) for the surface in the translucency selection box 697 ofthe control dialog box, a command to select (or assigning) the surface'scolor mapping in the color map box 698 of the control dialog box, and acommand to select the amount of offset between this surface and theother surface in the offset box 700 of the control dialog box. Thesecommands are received by the CPU 650 and are in response provided to theGUI controller 669 which then passes them to the separate surfaces imagegenerator. The two sets of measurement data are then rendered by thesurface image generator 666 and the separate surfaces image generatorfor display on the display 963 in the manner shown in FIGS. 75 and 76.

In doing so, the surface image generator 666 generates a first set ofimage data from the first set of measurement data and a second set ofimage data from the second set of measurement data. The first and secondsets of image data represent corresponding 3-D first and second surfaceimages of the corresponding first and second surfaces 692 and 694. Eachsurface extends along the XY plane and is contoured based on and toreflect the measurement values for the data points of the correspondingmeasurement data that are perpindicular to the XY plane. Thus, eachpoint of the corresponding surface is rendered from a corresponding datapoint of the measurement data.

For example, in the case where the first set of measurement datacomprises AFM measurement data, the first surface comprises the physicalouter surface of the object 102. This physical outer surface extendsalong the XY plane and is contoured based on and to reflect the heightsof the object perpindicular to the XY plane. Similarly, in the casewhere the second set of measurement data comprises MAFM data, the secondsurface comprises a surface of the magnetic field of the object. Themagnetic field surface also extends along the XY plane but is contouredbased on and to reflect the magnetic field strengths perpendicular tothe XY plane.

In doing this, the surface image generator 666 identifies the datapoints of the first set of measurement data and the data points of thesecond set of measurement data that have common X and Y coordinatevalues (i.e., have common locations in the XY plane). This is done sothat each data point in the first set of measurement data has acorresponding data point in the second set of measurement data and viceversa. Any data point in one set of measurement data that does not havesuch a corresponding data point in the other set of measurement data isremoved by the surface image generator. Then the surface image generatorgenerates the first and second sets of image data from the remaining(i.e., identified) measurement data points. For each set of image data,each data point in the corresponding set of image data is generated froma corresponding measurement data point in the corresponding measurementdata.

In doing so, the surface image generator 666 first scales the first andsecond sets of measurement data to produce the first and second sets ofimage data so that they can be display together in a meaningful mannerand with a meaningful relationship. This may be done in several wayswhich can be selected by the user by issuing appropriate commands withone of the user input devices 654. The commands are received by the GUIcontroller 669 which passes them onto the surface image generator.

For example, this may be done for each set of measurement data accordingto the following relationship m×Z/K=c. Here, m is a multiplier and c isa constant. Furthermore, Z is the largest range (i.e., difference)between any of the measurement values of the data points of themeasurement data. And, K is the largest of (1) the largest range (i.e.,difference) between any of the X coordinate values of the data points ofthe measurement data, and (2) the largest range between any of the Ycoordinate values of the data points of the measurement data.

In order to render a qualitative relationship between the first andsecond surfaces of the overlay image 690, the scaling may be done sothat the same constant c is used for both sets of measurement data. As aresult, two different multipliers m₁ and m₂ will be used for the twosets of measurement data. Then, for each set of measurement data, themeasurement value for each measurement data point of the measurementdata is scaled by the corresponding multiplier m₁ or m₂ to form a Zcoordinate value in the Z dimension.

As indicated previously, each image data point in one of the sets ofimage data is generated from the corresponding measurement data point inthe corresponding set of measurement data. This is done so that eachimage data point includes the X and Y coordinate values of themeasurement data point and the corresponding Z coordinate value computedby the surface image generator 666. Thus, in the case where the Zcoordinate values of the first and second sets of image data arecomputed in the manner just described, they are qualitatively comparableso that the first and second surfaces that are formed from the Zcoordinate values are also qualitatively comparable.

Altematively, the scaling may be done so as to render a quantitativerelationship between the first and second surfaces 692 and 694. This isdone in the same manner as just described, except that the multiplier mobtained for one set of measurement data is also used for the other setof measurement data. Then, for each set of measurement data, themeasurement value in the measurement data is scaled by this multiplier mto create a Z coordinate value for the corresponding image data point ofthe corresponding image data. As a result, the Z coordinate values ofthe first and second image data are quantitatively comparable. Thismakes the first and second surfaces that are formed from the Zcoordinate values also quantitatively comparable.

Each image data point in each set of image data also includes a colorcoordinate value. This color coordinate value is assigned by the surfaceimage generator 666 in response to the coloring mapping selected by theuser in the color map box 698. For example, the color coordinate valueof each image data point may be based on and correspond to the Zcoordinate value of the data point. The coloring of the surfaces 692 and694 may also be selected so as to distinguish them from each other.

The separate surfaces image generator 670 then generates overlay imagedata by overlaying the first and second sets of image data it receivesfrom the surface image generator 666. This is done based on theselections made by the user using the control dialog box 689. Thedisplay 653 then displays the overlay image 690 in response to theoverlay image data, as shown in FIG. 75 or 76.

The separate surfaces image generator 670 generates the overlay imagedata by overlaying the data points of the first and second sets of imagedata based upon the users selection of translucency or opacity in thetranslucency selection box 697 for the first and second surfaces. Iftranslucency was selected for the first surface 692 and opacity for thesecond surface 694, the separate surfaces image generator generates theoverlay image data so that the first surface is translucently overlaidon the opaque second surface in the overlay image 690, as shown in FIG.75. In contrast, if opacity was selected for both the first and secondsurfaces, the separate surfaces image generator generates the overlayimage data so that the second surface is opaquely overlaid on the opaquefirst surface in the overlay image, as shown in FIG. 76. As thoseskilled in the art will recognize, both surfaces could be translucent orthe second surface could be opaquely overlaid on the translucent firstsurface. Moreover, standard 3-D rendering techniques are used inoverlaying the data points of the first and second sets of image data tomake the first and second surfaces appear translucent and opaque.

As also indicated earlier, for each of the first and second surfaces 692and 694, the user may issue a command to select the amount of offsetbetween this surface and the other surface using the offset box 700 ofthe control dialog box 689. The GUI controller 669 receives the commandand provides an offset value specifying the selected amount of offset tothe separate surfaces image generator 666. The separate surfaces imagegenerator then adds the offset value to each Z coordinate value of theimage data for this surface. The separate surfaces image generator 670then generates the overlay image data so that this surface appearsoffset from the other surface in the overlay image by the amount ofoffset specified by the offset value, as shown in FIGS. 75 and 76.

Alternatively, the user may desire to have the two sets of measurementdata rendered as an overlay image 710 of a single contiguous surface712, as shown in FIG. 77. Referring also to FIG. 74, the user of the SPMsystem 100 may use one of the input devices 654 to select the contiguoussurface image generator 672 of the image overlay generator 668 in orderto display the two sets of measurement data together in this way. In asimilar manner to that discussed earlier for the rendering the overlayimage 690 of FIGS. 75 and 76, the user does so by issuing correspondingcommands with one or more of the user input devices using the controldialog box 689. However, for each of the first and second surfaces 692and 694 in this case, these commands include a command to select thesurface in the active layer selection box 696 of the control dialog box,a command to select a contiguous surface in the contiguous surface box714 of the control dialog box, a command to select (or assign) thesurface's coloring mapping in the color map box 698 of the controldialog box, and a command to select the amount of offset between thissurface and the other surface in the offset box 700 of the controldialog box. These commands are received by the CPU 650 and are inresponse provided to the GUI controller 669 which then passes them tothe contiguous surface image generator. The two sets of measurement dataare then rendered by the surface image generator 666 and the contiguoussurface image generator for display on the display 653 in the mannershown in FIG. 77.

In doing so, the surface image generator 666 generates the first andsecond sets of image data from the first and second sets of measurementdata in the manner discussed earlier. The contiguous surface imagegenerator 672 then generates overlay image data by overlaying the firstand second sets of image data based on the selections made by the userusing the control dialog box 689. The display 653 then displays theoverlay image 710 in response to the overlay image data in the mannershown in FIG. 77.

In this case, the contiguous surface image generator 672 generates theoverlay image data by overlaying the data points of the first and secondsets of image data so that a single contiguous surface 712 is renderedwhen the overlay image data is displayed by the display 635. In doingso, the contiguous surface image generator identifies the data points ofthe first image data that have larger Z coordinate values than thecorresponding data points of the second image data (i.e., those with thesame X and Y coordinate values) and identifies the data points of thesecond image data that have larger Z coordinate values than thecorresponding data points of the first image data. The data points ofthe first image data that have larger Z coordinate values than thecorresponding data points of the second image data represent theportions 716 of the first surface 692 that overlap (i.e., extend over)the second surface 694. Similarly, the data points of the second imagedata that have larger Z coordinate values than the corresponding datapoints of the first image data represent the portions 718 of the secondsurface that overlap (i.e., extend over) the first surface.

These identified data points are then used by the contiguous surfaceimage generator 672 as the overlay image data. As a result, thecontiguous surface 712 comprises only the portions 716 of the firstsurface 692 that overlap the second surface 694 and only the portions718 of the second surface that overlap the first surface. These portionsof the first and second surfaces are connected so as to form thecontiguous surface.

As with the overlay image 690 of FIG. 75 or 76, the user may issue acommand to select the coloring mapping of each of the surfaces 692 and694 using the color map box 698 of the control dialog box 689. Thiscoloring mapping is done in the same manner as was described earlier andmay be selected so as to distinguish the portions 716 and 718 of thesesurfaces in the contiguous surface 712 from each other.

As also with the overlay image 690, for each of the first and secondsurfaces 692 and 694, the user may issue a command to select the amountof offset between this surface and the other surface using the offsetbox 700 of the control dialog box 689. The GUI controller 669 receivesthe command and provides an offset value specifying the selected amountof offset to the contiguous surface image generator 672. The contiguoussurface generator then adds the offset value to each Z coordinate valueof the image data for the surface. The contiguous surface imagegenerator generates the overlay image data in the same way as justdescribed. But, the portions 716 of the first surface that overlap thesecond surface and the portions 718 of the second surface that overlapthe first surface have changed in the contiguous surface 712.

The GUI 664 is not limited to use in the SPM system 100 describedherein. For example, the GUI may be used for rendering an overlay imagein any of the ways just described in a geographical mapping system. Inthis case, the GUI could be used to generate the overlay image where oneof the surfaces represents the annual rainfall in an area and the othersurface is the topographical surface of the same area.

Rendering and Augmenting a Surface With Multiple Sets of MeasurementData

Referring to FIG. 78, the GUI 664 may also be used to render themultiple sets of measurement data together as a 3-D (three dimensional)surface image 720 of an augmented surface 722 on the display 653. Inthis case, a primary set of measurement data for a predefined primarymeasurement parameter is used to render the basic contour of the surfaceand one or more secondary sets of measurement data for one or morecorresponding secondary measurement parameters are used to provideaugmentation of various aspects of this surface. For example, thesecondary sets of measurement data may be used to texture and/or colorthe surface.

Referring also to FIG. 74, the user of the SPM system 100 may use one ofthe input devices 654 to select the augmented surface image generator674 of the GUI 664 in order to display the sets of measurement datatogether in this way. Here, the user also issues commands with one ormore of the user input devices using the control dialog box 689. Thesecommands include a command to select the first surface in the activelayer selection box 696 of the control dialog box, a command to selectaugmentation in the augmentation box 715 of the control dialog box, anda command to select (or assign) the coloring mapping of augmentedsurface 722 in the color map box 698 of the control dialog box. Thesecommands are received by the CPU 650 and are in response provided to theGUI controller 669 which then passes them to the surface image generatar666, the augmentation data generator 675, and the augmented imagegenerator 674. The sets of measurement data are then rendered by thesurface image generator, the augmentation data generator, and theaugmented image generator for display on the display 653 in the mannershown in FIG. 78.

In doing so, the surface image generator 666 generates base image datafrom a primary set of measurement data for a predefined primarymeasurement parameter in the manner discussed earlier. Specifically,this base image data represents a base surface, such as surface 692 asshown in FIGS. 75 and 76. Each image data point of the base image dataincludes the X, Y, and Z coordinate values. The Z coordinate value isderived from the measurement value of the corresponding measurement datapoint. This measurement value is for the predefined primary measurementparameter.

The one or more secondary sets of measurement are then used to augmentthe base image data. As discussed earlier, each measurement data pointof such a set of measurement data includes X and Y coordinate values anda measurement value. The measurement value represents a measurement of apredefined secondary measurement parameter made at the location in theXY plane corresponding to the XY coordinate values.

The augmentation data generator 675 uses each of the one or moresecondary sets of measurement data to generate augmentation data. Foreach secondary set of measurement data, the augmentation data includesaugmentation data points. Each augmentation data point includes X and Ycoordinate values and a corresponding augmentation value for eachsecondary set of measurement data. Each augmentation value is generatedbased on the measurement value of the measurement data point in thecorresponding secondary set of measurement data that has the same X andY coordinate values.

The augmented image generator 674 then generates the augmented imagedata by augmenting the base image data received from the surface imagegenerator 666 with the augmentation data received from the augmentationdata generator 675. This may be done by including the augmentation valuein each augmentation data point of the augmentation data as anothercoordinate value of the corresponding image data point of the base imagedata. Or, this may be done by substituting the augmentation data valuefor or adding the augmentation value to the corresponding Z coordinatevalue in the corresponding image data point of the base image data.

The augmentation image data is then displayed by the display 653 as a3-D augmented image of an augmented surface 722. Thus, the basic contourof this surface is like that of the surface 692 of FIGS. 75 and 76 andis based on the primary measurement data set. However, this surface isaugmented based on the one or more secondary sets of measurement data.

In one example, the basic contour of the augmented surface 722 may begenerated from AFM measurement data of the object 102. Then, thecoloring of the augmented AFM surface 722 could be based on MAFMmeasurement data for the object.

In this case, the base image data is generated by the surface imagegenerator 666 from the AFM measurement data in the manner discussedearlier for the overlay image generator 668. Then, the augmentation datagenerator 675 may cause the surface image generator to generated asecond set of image data from the MAFM measurement data also in themanner discussed earlier for the overlay image generator.

Then, the augmentation data generator 675 uses the color mappingselected by the user in the color map box 689 to generate augmentationdata for coloring the surface 722 based on the Z coordinate values forthe image data points of the second set of image data. Thus, theaugmentation value for each augmentation data point is a colorcoordinate value that is based on the Z coordinate value for the imagedata point in the second set of image data that has the same X and Ycoordinate values.

The augmented image generator 674 then uses the color coordinate valuein each augmentation data point of the augmentation data as anothercoordinate value of the corresponding image data point of the base imagedata. Referring again to FIG. 78, the basic contour of the augmented AFMsurface is like that of the surface 692 of FIGS. 75 and 76 and is basedon the AFM measurement data. Moreover, the augmented AFM surface iscolored based on the MAFM measurement data.

Additionally, as shown in FIG. 78, the augmented image data for theaugmented AFM surface 722 can be overlaid with the second image data forthe magnetic field surface 694. This is done in the manner discussedearlier for the overlay image generator 668.

In another example, the basic contour of the augmented surface 722 mayalso be generated from AFM measurement data of the object 102. Then, thetexturing (i.e., stippling) of the augmented AFM surface 722 could bebased on LAFM measurement data for the object.

In this case, the base image data for the augmented AFM surface 722 isagain generated by the surface image generator 666 from the AFMmeasurement data in the manner discussed earlier for the overlay imagegenerator 668. Moreover, the augmentation data generator 675 generatesaugmentation data from the LAFM measurement data.

The LAFM measurement data may be generated using one of the conventionalSPM probes 122 described earlier. Each measurement data point of theLAFM measurement data includes X and Y coordinate values and an LAFMmeasurement value for the lateral force at the location in the XY planecorresponding to the XY coordinate values.

The augmentation value for each augmentation data point of theaugmentation data is a texture coordinate value. The texture coordinatevalue is based on the LAFM measurement value for the measurement datapoint in the LAFM measurement data that has the same X and Y coordinatevalues. Here, the texture coordinate value represents a texture density(stipples per unit area) that corresponds to the LAFM measurement value.

The augmented image generator 674 then uses the texture coordinate valuein each augmentation data point of the augmentation data as anothercoordinate value of the corresponding image data point of the base imagedata. Referring again to FIG. 78, the basic contour of the augmented AFMsurface is like that of the surface 692 of FIGS. 75 and 76 and is basedon the AFM measurement data. Moreover, the augmented AFM surface istextured based on the MAFM measurement data.

Furthermore, as described earlier, the GUI 664 is not limited to use inthe SPM system 100 described herein. Similar to the example givenearlier, the GUI may be used in a geographical mapping system formodulating a surface in any of the ways just described. In this case,the GUI could be used to generate the modulated image where a surfacerepresenting the topography of an area would be modulated by a colorcorresponding to the rainfall and by texture (i.e., stippling) whosedensity (stipples per unit area) corresponds to the amount of annualbiomass produced in the area.

Rendering a 3-D Embedded Display Tool Image

The GUI 664 may also be used to render a 3-D composite image 730 on thedisplay 653, as shown in FIGS. 79, 80, and 81. The composite image is ofan object 102 and a display tool 734 embedded in the object. The usercan adjustably locate the display tool in the object with one or more ofthe user input devices 654.

In order to render the composite image 730 on the display 653, the userfirst issues commands with one or more of the user input devices 654 inorder to select an object image generator 676, a display tool imagegenerator 678, and a composite image generator 780 of the GUI 664. Thesecommands are received by the CPU 650 and the operating system 660 inresponse causes the object image generator, the display tool imagegenerator, and the composite image generator to be executed on the CPUor in or with specialized display resources.

The object image generator 676 generates object image data thatrepresents a 3-D object image of the object 102. The object imagegenerator generates the object image data from one or more sets ofmeasurement data. For example, the object image generator may comprisethe surface image generator 666 to generate surface image data of theobject from a set of measurement data in the manner discussed earlier.Or, the object image generator may comprise both the surface imagegenerator and the overlay image generator 668 to generate togetheroverlay image data from two sets of measurement data in the mannerdiscussed earlier.

As mentioned earlier, the display tool 734 is embedded in the object 102of the composite image 730 and can be adjustably located in the objectusing one or more of the user input devices 654 in the manner describedshortly. The display tool image generator 678 determines the location ofthe display tool in response to a command issued by the user with one ormore of the input devices. The display tool image generator alsoreceives the object image data from the object image generator 676. Inresponse, the display tool image generator determines the location andsizing in 3-D that the display tool would have in the object of theobject image. Based on this determination, the display tool imagegenerator generates display tool image data representing a 3-D displaytool image of the display tool as it would otherwise appear in theobject of the object image.

Referring to FIG. 79, the display tool 734 may comprise an embeddedcursor defined by cross hairs or arrows. In the case where the compositeimage 730 is of the outer surface 732 of the object, the embedded cursoris embedded in and adjustably locatable in this surface, as shown inFIG. 79. As is evident in FIG. 79, the cross hairs of the cursor extendperpendicular to each other across the surface. The user locates theembedded cursor in the surface with one or more of the user inputdevices 654 by issuing corresponding commands. For example, the user mayuse a mouse to first position a mouse cursor at the intersection of thecross hairs. Then, the user may activate the movement of the embeddedcursor by clicking and holding one of the control buttons of the mouseat this intersection. Then, while still holding down this controlbutton, the user may move the mouse so as to drag the embedded cursorand its cross hairs across the surface of the object to a desiredlocation on the object specified by the intersection of the cross hairs.

In this case, the display tool image generator 678 determines thesurface of the object 102 from the object image data. Then, ittranslates the position of the mouse cursor into a location on thesurface of the object in the object image. In response, the display toolimage generator then determines the location and sizing in 3-D that thedisplay tool would have on this surface and generates the display toolimage data based on this.

Alternatively, the composite image 730 may be of the volume of theobject 102 including the surfaces 737 and 739 of volume elements of theobject. In this case, the display tool 734 may also comprise an embeddedcursor that is embedded and positionable in this volume, as shown inFIG. 80. In this case, the cross hairs of the cursor extendperpendicular to each other across the surface 737 of a first volumeelement of the object. Here, the user may position the embedded cursoron this surface with one or more of the user input devices 654 byissuing corresponding commands. This is done in the same manner asdescribed earlier for the case where the composite image is of the outersurface 732 of the object.

But, in this case, the user may also position the embedded cursor so asto move it from the surface 737 of a first volume element to the surface739 of a second volume element of the object. This also done by issuingcorresponding commands with one or more of the user input devices 654.For example, the user may use a mouse to first position a mouse cursorat the intersection of the cross hairs. Then, the user may activate themovement of the embedded cursor by clicking and holding a differentcontrol button on the mouse than the one used to position across asurface. Then, while still holding down this control button, the usermay move the mouse so as to drag the embedded cursor and its cross hairsfrom the surface of the first volume element to the surface of thesecond volume element. In order to indicate to the user when theembedded cursor is on the new surface, the shading of the cross hairschanges when this occurs. Then, the embedded cursor can be positionedacross the surface of this new volume element in the same manner as thatdescribed earlier for the first volume element.

Moreover, the volume of the object 102 may either be homogeneous orcontain distinct interior surfaces, such as surface 739, of volumeelements that may also contain volume information or be mainly surfacelike (i.e., very thin homogeneous in cross section). Thus, the usercould cause the embedded cursor to move between the surfaces and causeit to adopt the surface tracking behavior just described when itencounters these interior surfaces. Thus, the user can cause theembedded cursor to move throughout a volume of distinct surfacesalternatingly sticking to the surfaces and being pushed in or pulled outof the surfaces.

In this case, the display tool image generator 678 determines thesurfaces 737 and 739 of the volume elements of the object 102 from theobject image data. Then, it translates the position of the mouse cursorinto a position in the volume of the object in the object image. Inresponse, the display tool image generator then determines thepositioning and sizing in 3-D that the display tool would have in thisvolume and generates the display tool image data based on this.

As those skilled in the art will recognize, the display tool 734 in theexamples just described may comprise a measurement tool of the kinddescribed in PCT Application No. PCT/US96/12255 referenced earlier. Thiskind of measurement tool includes one or more embedded cursors of thetype just described for making various types of measurements in an imageof an object. Additionally, those skilled in the art will recognize thatthe user input devices 654 could include a three axis pointing device.This would be particularly useful in positioning the display tool 734 in3-D in the composite image 730 of the volume of the object 102 shown inFIG. 80 in a similar manner to that described earlier.

In another example shown in FIG. 81, the display tool 734 may comprise ameasurement grid embedded in the outer surface 732 of the object 102.Here as well, the embedded measurement grid is adjustably locatable inthis surface. For example, the user may adjust the spacing and/orcoloring of the X grid lines and/or the Y grid lines by issuingcorresponding commands with one or more of the user input devices 654.

In all of the cases just described, the composite image generator 680then generates composite image data by combining the object image dataand display tool image data it receives from the object image generator676 and the display tool image generator 678. The display 653 thendisplays the composite image 690 in response to the composite imagedata, as shown in FIGS. 79 to 81.

The composite image generator 676 generates the composite image data byoverlaying the data points of the display tool image data on the datapoints of the object image data. This is done so that the display toolis embedded in the object and appears in 3-D as an element of theobject, as shown in FIGS. 79 to 81. In doing so, the composite imagegenerator 676 assigns sizing, texture, coloring, shading, opacity, andtranslucency to the various elements, including the display tool 734, ofthe object 102 so that they can be distinguished from each other andtheir positions with respect to each other can be discerned. This is alldone using standard 3-D rendering techniques.

While the present invention has been described with reference to a fewspecific embodiments, the description is illustrative of the inventionand is not to be construed as limiting the invention. Variousmodifications may occur to those skilled in the art without departingfrom the true spirit and scope of the invention as defined by theappended claims.

What is claimed is:
 1. An SPM system for making a modification to anobject, the SPM system comprising: an SPM probe configured to make themodification to the object; a positioning system configured to positionthe SPM probe with respect to the object; and a controller configured tocontrol the positioning system to (1) position the SPM probe such thatthe modification of the object is made with the SPM probe and themodification results in debris particles on the object, and (2) positionthe SPM probe such that the SPM probe makes sweeping motions over theobject to sweep the debris particles away from the modification.
 2. AnSPM system as recited in claim 1 further comprising inspectioncomponents configured to make an inspection of the modification afterthe debris particles are swept away from the modification.
 3. An SPMsystem as recited in claim 2 wherein: the inspection components includea second SPM probe configured to inspect the object; the positioningsystem is further configured to position the second SPM probe withrespect to the object; and the controller is further configured tocontrol the positioning system to (3) position the second SPM probe suchthat the inspection is made with the second SPM probe.
 4. An SPM systemas recited in claim 2 wherein: the inspection components include the SPMprobe and the SPM probe is further configured to inspect the object; andthe controller is further configured to control the positioning systemto (3) position the SPM probe such that the inspection is made with theSPM probe.
 5. An SPM system as recited in claim 1 further comprisingfixing components to fix the swept debris particles to an area of theobject where the fixed debris particles will not affect the object'sperformance when used in its normal environment.
 6. An SPM system asrecited in claim 5 wherein the fixing components comprise an adhesivemist source configured to spray an adhesive mist to adhesively fix theswept debris particles to the object.
 7. An SPM system as recited inclaim 5 wherein the fixing components comprise a laser source configuredto produce a laser beam that heats the swept debris particles to fusethe heated debris particles together on the object.
 8. An SPM system asrecited in claim 5 wherein: the fixing components include a second SPMprobe configured to produce heat and a heater control circuit to causethe second SPM probe to produce heat; the positioning system is furtherconfigured to position the second SPM probe with respect to the object;and the controller is further configured to (3) control the positioningsystem to position the second SPM probe over the swept debris particles,and (4) control the heater control circuit to cause the second SPM probeto heat the swept debris particles to fuse the heated debris particlestogether on the object.
 9. An SPM system as recited in claim 5 wherein:the fixing components include the SPM probe and a heater controlcircuit, the SPM probe is further configured to produce heat and theheater control circuit is configured to cause the SPM probe to produceheat; and the controller further is further configured to (3) controlthe positioning system to position the SPM probe over the swept debrisparticles, and (4) control the heater control circuit to cause the SPMprobe to heat the swept debris particles to fuse the heated debrisparticles together on the object.
 10. A method of making a modificationto an object utilizing SPM technology, the method comprising the stepsof: making the modification of the object using an SPM probe so that themodification results in debris particles on the object; and sweeping thedebris particles away from the modification by making sweeping motionsover the object with the SPM probe.
 11. A method as recited in claim 10further comprising the step of inspecting the modification after thesweeping step.
 12. A method as recited in claim 11 wherein theinspecting step further comprises the step of inspecting themodification with a second SPM probe.
 13. A method as recited in claim11 wherein the inspecting step further comprises the step of inspectingthe modification with the SPM probe.
 14. A method as recited in claim 10further comprising the step of fixing the swept debris particles to anarea of the object where the fixed debris particles will not affect theobject's performance when used in its normal environment.
 15. A methodas recited in claim 14 wherein the fixing step comprises the step ofspraying an adhesive mist to adhesively fix the swept debris particlesto the object.
 16. A method as recited in claim 14 wherein the fixingstep comprises the step of producing a laser beam that heats the sweptdebris particles to fuse the heated debris particles together on theobject.
 17. A method as recited in claim 14 wherein the fixing stepcomprises the step heating the swept debris particles with a second SPMprobe to fuse the heated debris particles together on the object.
 18. Amethod as recited in claim 14 wherein the fixing step comprises the stepheating the swept debris particles with the SPM probe to fuse the heateddebris particles together on the object.